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Results: 1-9 |
Results: 9
STRUCTURAL AND MAGNETIC-PROPERTIES OF ION-BEAM SPUTTERED NIMNSB FILMS
Authors: SCHLOMKA JP PRESS W FITZSIMMONS MR LUTT M GRIGOROV I
Citation: Jp. Schlomka et al., STRUCTURAL AND MAGNETIC-PROPERTIES OF ION-BEAM SPUTTERED NIMNSB FILMS, Physica. B, Condensed matter, 248, 1998, pp. 140-145
EVIDENCE FOR CAPILLARY WAVES ON DEWETTED POLYMER FILM SURFACES - A COMBINED X-RAY AND ATOMIC-FORCE MICROSCOPY STUDY
Authors: TOLAN M SEECK OH SCHLOMKA JP PRESS W WANG J SINHA SK LI Z RAFAILOVICH MH SOKOLOV J
Citation: M. Tolan et al., EVIDENCE FOR CAPILLARY WAVES ON DEWETTED POLYMER FILM SURFACES - A COMBINED X-RAY AND ATOMIC-FORCE MICROSCOPY STUDY, Physical review letters, 81(13), 1998, pp. 2731-2734
X-RAY CHARACTERIZATION OF BURIED ALLOTAXIALLY GROWN COSI2 LAYERS IN SI(100)
Authors: ZIMMERMANN U SCHLOMKA JP TOLAN M STETTNER J PRESS W HACKE M MANTL S
Citation: U. Zimmermann et al., X-RAY CHARACTERIZATION OF BURIED ALLOTAXIALLY GROWN COSI2 LAYERS IN SI(100), Journal of applied physics, 83(11), 1998, pp. 5823-5830
KARDAR-PARISI-ZHANG GROWTH OF AMORPHOUS-SILICON ON SI SIO2/
Authors: LUTT M SCHLOMKA JP TOLAN M STETTNER J SEECK OH PRESS W
Citation: M. Lutt et al., KARDAR-PARISI-ZHANG GROWTH OF AMORPHOUS-SILICON ON SI SIO2/, Physical review. B, Condensed matter, 56(7), 1997, pp. 4085-4091
NON-GAUSSIAN ROUGHNESS OF INTERFACES - CUMULANT EXPANSION IN X-RAY AND NEUTRON REFLECTIVITY
Authors: PRESS W SCHLOMKA JP TOLAN M ASMUSSEN B
Citation: W. Press et al., NON-GAUSSIAN ROUGHNESS OF INTERFACES - CUMULANT EXPANSION IN X-RAY AND NEUTRON REFLECTIVITY, Journal of applied crystallography, 30, 1997, pp. 963-967
ROUGHNESS OF SURFACES AND INTERFACES
Authors: PRESS W TOLAN M STETTNER J SEECK OH SCHLOMKA JP NITZ V SCHWALOWSKY L MULLERBUSCHBAUM P BAHR D
Citation: W. Press et al., ROUGHNESS OF SURFACES AND INTERFACES, Physica. B, Condensed matter, 221(1-4), 1996, pp. 1-9
CHARACTERIZATION OF SI GE INTERFACES BY DIFFUSE-X-RAY SCATTERING IN THE REGION OF TOTAL EXTERNAL REFLECTION/
Authors: SCHLOMKA JP FITZSIMMONS MR PYNN R STETTNER J SEECK OH TOLAN M PRESS W
Citation: Jp. Schlomka et al., CHARACTERIZATION OF SI GE INTERFACES BY DIFFUSE-X-RAY SCATTERING IN THE REGION OF TOTAL EXTERNAL REFLECTION/, Physica. B, Condensed matter, 221(1-4), 1996, pp. 44-52
CORRELATIONS IN THE INTERFACE STRUCTURE OF LANGMUIR-BLODGETT-FILMS OBSERVED BY X-RAY-SCATTERING
Authors: NITZ V TOLAN M SCHLOMKA JP SEECK OH STETTNER J PRESS W STELZLE M SACKMANN E
Citation: V. Nitz et al., CORRELATIONS IN THE INTERFACE STRUCTURE OF LANGMUIR-BLODGETT-FILMS OBSERVED BY X-RAY-SCATTERING, Physical review. B, Condensed matter, 54(7), 1996, pp. 5038-5050
X-RAY-DIFFRACTION FROM SI GE LAYERS - DIFFUSE-SCATTERING IN THE REGION OF TOTAL EXTERNAL REFLECTION/
Authors: SCHLOMKA JP TOLAN M SCHWALOWSKY L SEECK OH STETTNER J PRESS W
Citation: Jp. Schlomka et al., X-RAY-DIFFRACTION FROM SI GE LAYERS - DIFFUSE-SCATTERING IN THE REGION OF TOTAL EXTERNAL REFLECTION/, Physical review. B, Condensed matter, 51(4), 1995, pp. 2311-2321
Risultati: 1-9 |