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Results: 1-25/27
Authors:
BOON B
STROEBE W
SCHUT H
JANSEN A
Citation: B. Boon et al., FOOD FOR THOUGHT - COGNITIVE REGULATION OF FOOD-INTAKE, British journal of health psychology, 3, 1998, pp. 27-40
Authors:
JORGENSEN LV
LABOHM F
SCHUT H
VANVEEN A
Citation: Lv. Jorgensen et al., EVIDENCE OF VERY LOW-ENERGY POSITRON REFLECTION OFF TUNGSTEN SURFACES, Journal of physics. Condensed matter (Print), 10(39), 1998, pp. 8743-8752
Authors:
VANVEEN A
LABOHM F
SCHUT H
DEROODE J
HEIJENGA T
MIJNARENDS PE
Citation: A. Vanveen et al., TESTING OF A NUCLEAR-REACTOR-BASED POSITRON BEAM, Applied surface science, 116, 1997, pp. 39-44
Authors:
KRUSEMAN AC
SCHUT H
VANVEEN A
MIJNARENDS PE
CLEMENT M
DENIJS JMM
Citation: Ac. Kruseman et al., POSITRON BEAM ANALYSIS OF SEMICONDUCTOR-MATERIALS USING A 2-DETECTOR DOPPLER BROADENING COINCIDENCE SYSTEM, Applied surface science, 116, 1997, pp. 192-197
Authors:
DENIJS JMM
CLEMENT M
SCHUT H
VANVEEN A
Citation: Jmm. Denijs et al., POSITRON-ANNIHILATION AS A TOOL FOR THE STUDY OF DEFECTS IN THE MOS SYSTEM, Microelectronic engineering, 36(1-4), 1997, pp. 35-42
Authors:
SCHUT H
VANVEEN A
JORGENSEN LV
DANKERT O
WESTERDUIN KT
READER AH
OBERLIN JC
Citation: H. Schut et al., MONITORING OF THE THERMAL ANNEALING OF HDP-SI OXIDES BY POSITRON-ANNIHILATION AND THERMAL-DESORPTION SPECTROMETRY, Microelectronic engineering, 33(1-4), 1997, pp. 357-362
Authors:
JORGENSEN LV
VANVEEN A
SCHUT H
CHEVALLIER J
Citation: Lv. Jorgensen et al., A RECTIFYING TUNGSTEN-MOLYBDENUM FOIL FOR POSITRON REMODERATION, Journal of applied physics, 81(6), 1997, pp. 2725-2729
Authors:
CLEMENT M
DENIJS JMM
BALK P
SCHUT H
VANVEEN A
Citation: M. Clement et al., TRANSPORT OF POSITRONS IN THE ELECTRICALLY BIASED METAL-OXIDE-SILICONSYSTEM, Journal of applied physics, 81(4), 1997, pp. 1943-1955
Authors:
SEGERS D
DAUWE C
SCHUT H
VANVEEN A
PALFFY L
VANHOECKE T
VANWAEYENBERGE B
Citation: D. Segers et al., SLOW POSITRON STUDIES OF ANODIZED ALUMINUM, Journal of radioanalytical and nuclear chemistry, 211(1), 1996, pp. 39-45
Authors:
GOMAA EAH
SCHUT H
VANVEEN A
MOHSEN M
FROMM U
MORSHUIS P
Citation: Eah. Gomaa et al., EFFECT OF ELECTRIC-FIELD STRENGTH AND EXPOSURE TIME ON EPOXY AND HIGH-DENSITY POLYETHYLENE MEASURED BY POSITRON-ANNIHILATION LIFETIME, Journal of radioanalytical and nuclear chemistry, 211(1), 1996, pp. 77-83
Authors:
JORGENSON LV
VANVEEN A
SCHUT H
Citation: Lv. Jorgenson et al., POSITRON REEMISSION FROM EPITAXIALLY GROWN BETA-SIC, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 119(4), 1996, pp. 487-490
Authors:
CLEMENT M
DENIJS JMM
BALK P
SCHUT H
VANVEEN A
Citation: M. Clement et al., ANALYSIS OF POSITRON BEAM DATA BY THE COMBINED USE OF THE SHAPE-PARAMETER AND WING-PARAMETER, Journal of applied physics, 79(12), 1996, pp. 9029-9036
Authors:
READER AH
SCHUT H
HAKVOORT RA
VANVEEN A
Citation: Ah. Reader et al., APPLICATION OF POSITRON-ANNIHILATION IN THE SI INTEGRATED-CIRCUIT (IC) INDUSTRY, Journal de physique. IV, 5(C1), 1995, pp. 27-36
Authors:
VANVEEN A
HAKVOORT RA
SCHUT H
MIJNARENDS PE
Citation: A. Vanveen et al., MICROCAVITIES IN SEMICONDUCTOR-MATERIALS, Journal de physique. IV, 5(C1), 1995, pp. 37-47
Authors:
SCHUT H
VANVEEN A
Citation: H. Schut et A. Vanveen, SOFTWARE FOR MODELING POSITRON-BEAM DEPTH-PROFILING DATA, Journal de physique. IV, 5(C1), 1995, pp. 57-61
Authors:
ROSSI F
ANDRE B
VANVEEN A
MIJNARENDS PE
SCHUT H
DELPLANCKE MP
LUCAZEAU G
ABELLO L
Citation: F. Rossi et al., DIAMOND-LIKE COATINGS - MICROSTRUCTURAL EVOLUTION UNDER ION-BEAM ASSISTANCE, Journal de physique. IV, 5(C1), 1995, pp. 179-191
Authors:
BRAUER G
ANWAND W
NICHT EM
COLEMAN PG
KNIGHTS AP
SCHUT H
KOGEL G
WAGNER N
Citation: G. Brauer et al., POSITRON STUDIES OF POLYCRYSTALLINE TIC, Journal of physics. Condensed matter, 7(47), 1995, pp. 9091-9099
Authors:
SEIJBEL LJ
NEELISSEN RFJ
KRUIT P
VANVEEN A
SCHUT H
Citation: Lj. Seijbel et al., COUPLING OPTICS FOR A COMBINED ELECTRON-POSITRON SCANNING MICROSCOPE, Applied surface science, 85(1-4), 1995, pp. 92-97
Authors:
VANVEEN A
SCHUT H
CLEMENT M
DENIJS JMM
KRUSEMAN A
IJPMA MR
Citation: A. Vanveen et al., VEPFIT APPLIED TO DEPTH PROFILING PROBLEMS, Applied surface science, 85(1-4), 1995, pp. 216-224
Authors:
SCHUT H
VANVEEN A
Citation: H. Schut et A. Vanveen, EXTENSION OF THE PC VERSION OF VEPFIT WITH INPUT AND OUTPUT ROUTINES RUNNING UNDER WINDOWS, Applied surface science, 85(1-4), 1995, pp. 225-228
Authors:
HAKVOORT RA
VANVEEN A
MIJNARENDS PE
SCHUT H
Citation: Ra. Hakvoort et al., HELIUM AND HYDROGEN DECORATED CAVITIES IN SILICON, Applied surface science, 85(1-4), 1995, pp. 271-275
Authors:
CLEMENT M
DENIJS JMM
VANVEEN A
SCHUT H
BALK P
Citation: M. Clement et al., EFFECT OF POST OXIDATION ANNEAL ON VUV RADIATION-HARDNESS OF THE SI SIO2 SYSTEM STUDIED BY POSITRON-ANNIHILATION SPECTROSCOPY/, IEEE transactions on nuclear science, 42(6), 1995, pp. 1717-1724
Authors:
ROSSI F
ANDRE B
VANVEEN A
MIJNARENDS PE
SCHUT H
LABOHM F
DUNLOP H
DELPLANCKE MP
HUBBARD K
Citation: F. Rossi et al., PHYSICAL-PROPERTIES OF A-C N FILMS PRODUCED BY ION-BEAM-ASSISTED DEPOSITION/, Journal of materials research, 9(9), 1994, pp. 2440-2449
Authors:
ROSSI F
ANDRE B
VANVEEN A
MIJNARENDS PE
SCHUT H
LABOHM F
DELPLANCKE MP
DUNLOP H
ANGER E
Citation: F. Rossi et al., PHYSICAL-PROPERTIES OF NITROGENATED AMORPHOUS-CARBON FILMS PRODUCED BY ION-BEAM-ASSISTED DEPOSITION, Thin solid films, 253(1-2), 1994, pp. 85-89
Authors:
ANDRE B
ROSSI F
VANVEEN A
MIJNARENDS PE
SCHUT H
DELPLANCKE MP
Citation: B. Andre et al., MICROSTRUCTURAL EVOLUTION OF NON-HYDROGENATED AMORPHOUS-CARBON UNDER ION-BEAM ASSISTANCE, Thin solid films, 241(1-2), 1994, pp. 171-174