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Results:
1-15
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Results: 15
Authors:
DIEBOLD AC
KUMP MR
KOPANSKI JJ
SEILER DG
Citation: Ac. Diebold et al., CHARACTERIZATION OF 2-DIMENSIONAL DOPANT PROFILES - STATUS AND REVIEW, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 196-201
Authors:
KIM JS
SEILER DG
LANCASTER RA
REINE MB
Citation: Js. Kim et al., ELECTRICAL CHARACTERIZATION OF VERY-NARROW-GAP BULK HGCDTE SINGLE-CRYSTALS BY VARIABLE MAGNETIC-FIELD HALL MEASUREMENTS, Journal of electronic materials, 25(8), 1996, pp. 1215-1220
Authors:
RICHTER CA
SEILER DG
PELLEGRINO JG
Citation: Ca. Richter et al., QUANTUM CONDUCTANCE FLUCTUATIONS IN THE LARGE-SIZE-SCALE REGIME, Physical review. B, Condensed matter, 53(19), 1996, pp. 13086-13090
Authors:
SEILER DG
Citation: Dg. Seiler, FEAR OF PHYSICS, The Sciences, 36(2), 1996, pp. 48-48
Authors:
KIM JS
SEILER DG
EHRSTEIN JR
Citation: Js. Kim et al., DETERMINATION OF DENSITIES AND MOBILITIES OF HEAVY AND LIGHT HOLES INP-TYPE SI USING REDUCED-CONDUCTIVITY-TENSOR ANALYSES OF MAGNETIC-FIELD-DEPENDENT HALL AND RESISTIVITY MEASUREMENTS, Journal of applied physics, 80(8), 1996, pp. 4425-4428
Authors:
SEILER DG
SHAFFNER TJ
Citation: Dg. Seiler et Tj. Shaffner, INTERNATIONAL WORKSHOP ON SEMICONDUCTOR CHARACTERIZATION - PRESENT STATUS AND FUTURE-NEEDS - GAITHERSBURG, MD, JANUARY 30 FEBRUARY 2, 1995, Journal of research of the National Institute of Standards and Technology, 100(6), 1995, pp. 711-715
Authors:
KIM JS
SEILER DG
COLOMBO L
CHEN MC
Citation: Js. Kim et al., CHARACTERIZATION OF LIQUID-PHASE EPITAXIALLY GROWN HGCDTE FILMS BY MAGNETORESISTANCE MEASUREMENTS, Journal of electronic materials, 24(9), 1995, pp. 1305-1310
Authors:
PERKOWITZ S
SEILER DG
DUNCAN WM
Citation: S. Perkowitz et al., OPTICAL CHARACTERIZATION IN MICROELECTRONICS MANUFACTURING, Journal of research of the National Institute of Standards and Technology, 99(5), 1994, pp. 605-639
Authors:
KIM JS
SEILER DG
COLOMBO L
CHEN MC
Citation: Js. Kim et al., ELECTRICAL CHARACTERIZATION OF LIQUID-PHASE EPITAXIALLY GROWN SINGLE-CRYSTAL FILMS OF MERCURY CADMIUM TELLURIDE BY VARIABLE-MAGNETIC-FIELD HALL MEASUREMENTS, Semiconductor science and technology, 9(9), 1994, pp. 1696-1705
Authors:
LOWNEY JR
THURBER WR
SEILER DG
Citation: Jr. Lowney et al., TRANSVERSE MAGNETORESISTANCE - A NOVEL 2-TERMINAL METHOD FOR MEASURING THE CARRIER DENSITY AND MOBILITY OF A SEMICONDUCTOR LAYER, Applied physics letters, 64(22), 1994, pp. 3015-3017
Authors:
LOWNEY JR
SEILER DG
THURBER WR
YU Z
SONG XN
LITTLER CL
Citation: Jr. Lowney et al., HEAVILY ACCUMULATED SURFACES OF MERCURY CADMIUM TELLURIDE DETECTORS -THEORY AND EXPERIMENT, Journal of electronic materials, 22(8), 1993, pp. 985-991
Authors:
SEILER DG
MAYO S
LOWNEY JR
Citation: Dg. Seiler et al., HG1-XCDXTE CHARACTERIZATION MEASUREMENTS - CURRENT PRACTICE AND FUTURE-NEEDS, Semiconductor science and technology, 8(6), 1993, pp. 753-776
Authors:
SEILER DG
Citation: Dg. Seiler, MERCURY CADMIUM TELLURIDE CHARACTERIZATION - PROCEEDINGS OF THE INTERNATIONAL WORKSHOP, 15-16 OCTOBER 1992, DANVERS, MA, USA - FOREWORD, Semiconductor science and technology, 8(6), 1993, pp. 753-753
Authors:
KIM JS
SEILER DG
TSENG WF
Citation: Js. Kim et al., MULTICARRIER CHARACTERIZATION METHOD FOR EXTRACTING MOBILITIES AND CARRIER DENSITIES OF SEMICONDUCTORS FROM VARIABLE MAGNETIC-FIELD MEASUREMENTS, Journal of applied physics, 73(12), 1993, pp. 8324-8335
Authors:
NGUYEN NV
PELLEGRINO JG
AMIRTHARAJ PM
SEILER DG
QADRI SB
Citation: Nv. Nguyen et al., INTERFACE ROUGHNESS OF SHORT-PERIOD ALAS GAAS SUPERLATTICES STUDIED BY SPECTROSCOPIC ELLIPSOMETRY, Journal of applied physics, 73(11), 1993, pp. 7739-7746
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