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Results:
1-22
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Results: 22
Authors:
SIEBER I
WANDERKA N
URBAN I
DORFEL I
SCHIERHORN E
FENSKE F
FUHS W
Citation: I. Sieber et al., ELECTRON-MICROSCOPIC CHARACTERIZATION OF REACTIVELY SPUTTERED ZNO FILMS WITH DIFFERENT AL-DOPING LEVELS, Thin solid films, 330(2), 1998, pp. 108-113
Authors:
RUFF D
MELL H
TOTH L
SIEBER I
FUHS W
Citation: D. Ruff et al., CHARGE-TRANSPORT IN MICROCRYSTALLINE SILICON FILMS, Journal of non-crystalline solids, 230, 1998, pp. 1011-1015
Authors:
MARTINEZ FL
MARTIL I
GONZALEZDIAZ G
SELLE B
SIEBER I
Citation: Fl. Martinez et al., INFLUENCE OF RAPID THERMAL ANNEALING PROCESSES ON THE PROPERTIES OF SINX-H FILMS DEPOSITED BY THE ELECTRON-CYCLOTRON-RESONANCE METHOD, Journal of non-crystalline solids, 230, 1998, pp. 523-527
Authors:
NICKEL NH
SIEBER I
Citation: Nh. Nickel et I. Sieber, INFLUENCE OF OXYGEN PLASMA TREATMENTS ON THE STRUCTURAL-PROPERTIES OFC-SI, Applied physics letters, 72(21), 1998, pp. 2683-2685
Authors:
SCHOPKE A
SELLE B
SIEBER I
REINSPERGER GU
STAUSS P
HERZ K
POWALLA M
Citation: A. Schopke et al., CHARACTERIZATION OF THE STOICHIOMETRY OF COEVAPORATED FESIX FILMS BY AES, EDX, RES, AND ELECTRON-MICROSCOPY, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 322-325
Authors:
SIEBER I
WANDERKA N
DIESNER K
URBAN I
DORFEL I
Citation: I. Sieber et al., ELECTRON-MICROSCOPIC CHARACTERIZATION OF REACTIVELY SPUTTERED ZNO FILMS WITH DIFFERENT AL-DOPING, European journal of cell biology, 74, 1997, pp. 120-120
Authors:
DITTRICH M
DITTRICH T
SIEBER I
KOSCHEL R
Citation: M. Dittrich et al., A BALANCE ANALYSIS OF PHOSPHORUS ELIMINATION BY ARTIFICIAL CALCITE PRECIPITATION IN A STRATIFIED HARDWATER LAKE, Water research, 31(2), 1997, pp. 237-248
Authors:
DOSCHER M
OERTEL G
REINSPERGER GU
SELLE B
SIEBER I
TROPPENZ U
Citation: M. Doscher et al., COMBINATION OF RBS ANALYSIS AND INFRARED VIBRATIONAL SPECTROSCOPY FORTHE CHARACTERIZATION OF SEMICONDUCTING BETA-FESI2 FILMS, Mikrochimica acta, 125(1-4), 1997, pp. 257-261
Authors:
ELLMER K
STOCK C
DIESNER K
SIEBER I
Citation: K. Ellmer et al., DEPOSITION OF C(PERPENDICULAR-TO)-ORIENTED TUNGSTEN DISULFIDE (WS2) FILMS BY REACTIVE DC MAGNETRON SPUTTERING FROM A W-TARGET IN AR H72S/, Journal of crystal growth, 182(3-4), 1997, pp. 389-393
Authors:
MATTHAUS A
ENNAOUI A
FIECHTER S
TIEFENBACHER S
KIESEWETTER T
DIESNER K
SIEBER I
JAEGERMANN W
TSIRLINA T
TENNE R
Citation: A. Matthaus et al., HIGHLY TEXTURED FILMS OF LAYERED METAL DISULFIDE 2H-WS2 - PREPARATIONAND OPTOELECTRONIC PROPERTIES, Journal of the Electrochemical Society, 144(3), 1997, pp. 1013-1019
Authors:
DITTRICH T
SIEBER I
HENRION W
RAUSCHER S
WANDERKA N
RAPPICH J
Citation: T. Dittrich et al., SELECTIVE LASER-INDUCED MELTING OF ULTRATHIN NANOPOROUS SILICON LAYERS, Applied physics A: Materials science & processing, 63(5), 1996, pp. 467-470
Authors:
TOMM Y
IVANEKO L
IRMSCHER K
BREHME S
HENRION W
SIEBER I
LANGE H
Citation: Y. Tomm et al., EFFECTS OF DOPING ON THE ELECTRONIC-PROPERTIES OF SEMICONDUCTING IRONDISILICIDE, Materials science & engineering. B, Solid-state materials for advanced technology, 37(1-3), 1996, pp. 215-218
Authors:
STEIMETZ E
ZETTLER JT
SCHIENLE F
TREPK T
WETHKAMP T
RICHTER W
SIEBER I
Citation: E. Steimetz et al., TN SITU MONITORING OF INAS-ON-GAAS QUANTUM-DOT FORMATION IN MOVPE BY REFLECTANCE-ANISOTROPY-SPECTROSCOPY AND ELLIPSOMETRY, Applied surface science, 107, 1996, pp. 203-211
Authors:
DITTRICH T
KLIEFOTH K
SIEBER I
RAPPICH J
RAUSCHER S
TIMOSHENKO VY
Citation: T. Dittrich et al., ELECTRONIC-PROPERTIES OF THIN AU NANOPOROUS-SI/N-SI STRUCTURES/, Thin solid films, 276(1-2), 1996, pp. 183-186
Authors:
DITTRICH T
SIEBER I
RAUSCHER S
RAPPICH J
Citation: T. Dittrich et al., PREPARATION OF THIN NANOPOROUS SILICON LAYERS ON N-SI AND P-SI, Thin solid films, 276(1-2), 1996, pp. 200-203
Authors:
TIMOSHENKO VY
GAREEVA AR
KASHKAROV PK
PETROV VI
SIEBER I
DITTRICH T
Citation: Vy. Timoshenko et al., STABLE AND EFFICIENT CATHODOLUMINESCENCE AND PHOTOLUMINESCENCE FROM ULTRATHIN POROUS SILICON LAYERS, Thin solid films, 276(1-2), 1996, pp. 287-289
Authors:
SIEBER I
URBAN I
DORFEL I
KOYNOV S
SCHWARZ R
SCHMIDT M
Citation: I. Sieber et al., MICROSCOPIC CHARACTERIZATION OF MICROCRYSTALLINE SILICON THIN-FILMS, Thin solid films, 276(1-2), 1996, pp. 314-317
Authors:
KRANKENHAGEN R
SCHMIDT M
GREBNER S
POSCHENRIEDER M
HENRION W
SIEBER I
KOYNOV S
SCHWARZ R
Citation: R. Krankenhagen et al., CORRELATION BETWEEN STRUCTURAL, OPTICAL AND ELECTRICAL-PROPERTIES OF MU-C-SI FILMS, Journal of non-crystalline solids, 200, 1996, pp. 923-926
Authors:
KOYNOV S
GREBNER S
RADOJKOVIC P
HARTMANN E
SCHWARZ R
VASILEV L
KRANKENHAGEN R
SIEBER I
HENRION W
SCHMIDT M
Citation: S. Koynov et al., INITIAL-STAGES OF MICROCRYSTALLINE SILICON FILM GROWTH, Journal of non-crystalline solids, 200, 1996, pp. 1012-1016
Authors:
SIEBER I
SCHOPKE A
SELLE B
Citation: I. Sieber et al., COMPARATIVE COMPOSITION ANALYSIS OF SIOX AND SINX THIN-FILMS BY AES, EDX AND RBS, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 639-641
Authors:
DITTRICH T
RAUSCHER S
TIMOSHENKO VY
RAPPICH J
SIEBER I
FLIETNER H
LEWERENZ HJ
Citation: T. Dittrich et al., ULTRATHIN LUMINESCENT NANOPOROUS SILICON ON N-SI - PH DEPENDENT PREPARATION IN AQUEOUS NH4F SOLUTIONS, Applied physics letters, 67(8), 1995, pp. 1134-1136
Authors:
KRANKENHAGEN R
SCHMIDT M
HENRION W
SIEBER I
SELLE B
FLIETNER H
Citation: R. Krankenhagen et al., OPTICAL AND PHOTOELECTRICAL PROPERTIES OF MU-C-SI LAYERS AND THE INFLUENCE OF SUBSEQUENT HYDROGENATION, Physica status solidi. a, Applied research, 145(2), 1994, pp. 401-406
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