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Results: 1-25 |
Results: 25
STRAIN RELAXATION AND SURFACE-MORPHOLOGY OF COMPOSITIONALLY GRADED SISI1-XGEX BUFFERS/
Authors: LI JH SPRINGHOLZ G STANGL J SEYRINGER H HOLY V SCHAFFLER F BAUER G
Citation: Jh. Li et al., STRAIN RELAXATION AND SURFACE-MORPHOLOGY OF COMPOSITIONALLY GRADED SISI1-XGEX BUFFERS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1610-1615
PHOTOLUMINESCENCE FROM PSEUDOMORPHIC SI1-YCY LAYERS ON SI SUBSTRATES
Authors: PENN C ZERLAUTH S STANGL J BAUER G BRUNTHALER G SCHAFFLER F
Citation: C. Penn et al., PHOTOLUMINESCENCE FROM PSEUDOMORPHIC SI1-YCY LAYERS ON SI SUBSTRATES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1713-1716
GROWTH OF PARTIALLY STRAIN-RELAXED SI-1-C-Y(Y) EPILAYERS ON (100)SI
Authors: SENZ S PLOSSL A GOSELE U ZERLAUTH S STANGL J BAUER G
Citation: S. Senz et al., GROWTH OF PARTIALLY STRAIN-RELAXED SI-1-C-Y(Y) EPILAYERS ON (100)SI, Applied physics A: Materials science & processing, 67(2), 1998, pp. 147-150
X-RAY REFLECTIVITY INVESTIGATIONS OF THE INTERFACE MORPHOLOGY IN STRAINED SIGE SI MULTILAYERS/
Authors: HOLY V DARHUBER AA STANGL J BAUER G NUTZEL J ABSTREITER G
Citation: V. Holy et al., X-RAY REFLECTIVITY INVESTIGATIONS OF THE INTERFACE MORPHOLOGY IN STRAINED SIGE SI MULTILAYERS/, Semiconductor science and technology, 13(6), 1998, pp. 590-598
C-12(ALPHA,ALPHA)C-12 RESONANT ELASTIC-SCATTERING AT 5.7 MEV AS A TOOL FOR CARBON QUANTIFICATION IN SILICON-BASED HETEROSTRUCTURES
Authors: BERTI M DESALVADOR D DRIGO AV ROMANATO F SAMBO A ZERLAUTH S STANGL J SCHAFFLER F BAUER G
Citation: M. Berti et al., C-12(ALPHA,ALPHA)C-12 RESONANT ELASTIC-SCATTERING AT 5.7 MEV AS A TOOL FOR CARBON QUANTIFICATION IN SILICON-BASED HETEROSTRUCTURES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 143(3), 1998, pp. 357-370
ELASTIC RELAXATION OF DRY-ETCHED SI SIGE QUANTUM DOTS/
Authors: DARHUBER AA GRILL T STANGL J BAUER G LOCKWOOD DJ NOEL JP WANG PD TORRES CMS
Citation: Aa. Darhuber et al., ELASTIC RELAXATION OF DRY-ETCHED SI SIGE QUANTUM DOTS/, Physical review. B, Condensed matter, 58(8), 1998, pp. 4825-4831
COPLANAR AND GRAZING-INCIDENCE X-RAY-DIFFRACTION INVESTIGATION OF SELF-ORGANIZED SIGE QUANTUM-DOT MULTILAYERS
Authors: HOLY V DARHUBER AA STANGL J ZERLAUTH S SCHAFFLER F BAUER G DAROWSKI N LUBBERT D PIETSCH U VAVRA I
Citation: V. Holy et al., COPLANAR AND GRAZING-INCIDENCE X-RAY-DIFFRACTION INVESTIGATION OF SELF-ORGANIZED SIGE QUANTUM-DOT MULTILAYERS, Physical review. B, Condensed matter, 58(12), 1998, pp. 7934-7943
OBLIQUE ROUGHNESS REPLICATION IN STRAINED SIGE SI MULTILAYERS/
Authors: HOLY V DARHUBER AA STANGL J BAUER G NUTZEL J ABSTREITER G
Citation: V. Holy et al., OBLIQUE ROUGHNESS REPLICATION IN STRAINED SIGE SI MULTILAYERS/, Physical review. B, Condensed matter, 57(19), 1998, pp. 12435-12442
MOLECULAR-BEAM EPITAXIAL-GROWTH AND PHOTOLUMINESCENCE INVESTIGATION OF SI1-YCY LAYERS
Authors: ZERLAUTH S PENN C SEYRINGER H STANGL J BRUNTHALER G BAUER G SCHAFFLER F
Citation: S. Zerlauth et al., MOLECULAR-BEAM EPITAXIAL-GROWTH AND PHOTOLUMINESCENCE INVESTIGATION OF SI1-YCY LAYERS, Thin solid films, 321, 1998, pp. 33-40
HIGH-RESOLUTION X-RAY-DIFFRACTION AND X-RAY REFLECTIVITY STUDIES OF SHORT-PERIOD CDTE MNTE-SUPERLATTICES/
Authors: STANGL J DARHUBER AA HOLY V DENAUROIS M FERREIRA S FASCHINGER W BAUER G
Citation: J. Stangl et al., HIGH-RESOLUTION X-RAY-DIFFRACTION AND X-RAY REFLECTIVITY STUDIES OF SHORT-PERIOD CDTE MNTE-SUPERLATTICES/, Journal of crystal growth, 185, 1998, pp. 105-108
HIGHLY REGULAR SELF-ORGANIZATION OF STEP BUNCHES DURING GROWTH OF SIGE ON SI(113)
Authors: DARHUBER AA ZHU J HOLY V STANGL J MIKULIK P BRUNNER K ABSTREITER G BAUER G
Citation: Aa. Darhuber et al., HIGHLY REGULAR SELF-ORGANIZATION OF STEP BUNCHES DURING GROWTH OF SIGE ON SI(113), Applied physics letters, 73(11), 1998, pp. 1535-1537
LATTICE-PARAMETER IN SI1-YCY EPILAYERS - DEVIATION FROM VEGARDS RULE
Authors: BERTI M DESALVADOR D DRIGO AV ROMANATO F STANGL J ZERLAUTH S SCHAFFER F BAUER G
Citation: M. Berti et al., LATTICE-PARAMETER IN SI1-YCY EPILAYERS - DEVIATION FROM VEGARDS RULE, Applied physics letters, 72(13), 1998, pp. 1602-1604
HIGH-RESOLUTION X-RAY-DIFFRACTION AND REFLECTIVITY STUDIES OF VERTICAL AND LATERAL ORDERING IN MULTIPLE SELF-ORGANIZED INGAAS QUANTUM DOTS
Authors: DARHUBER AA HOLY V STANGL J BAUER G KROST A GRUNDMANN M BIMBERG D USTINOV VM KOPEV PS KOSOGOV AO WERNER P
Citation: Aa. Darhuber et al., HIGH-RESOLUTION X-RAY-DIFFRACTION AND REFLECTIVITY STUDIES OF VERTICAL AND LATERAL ORDERING IN MULTIPLE SELF-ORGANIZED INGAAS QUANTUM DOTS, JPN J A P 1, 36(6B), 1997, pp. 4084-4087
RECIPROCAL SPACE MAPPING ON SI1-XCX EPILAYERS AND SI-N C/SI-N SUPERLATTICES/
Authors: STANGL J ZERLAUTH S HOLY V FASCHINGER W BAUER G
Citation: J. Stangl et al., RECIPROCAL SPACE MAPPING ON SI1-XCX EPILAYERS AND SI-N C/SI-N SUPERLATTICES/, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 355-360
X-RAY REFLECTIVITY RECIPROCAL SPACE MAPPING OF STRAINED SIGE SI SUPERLATTICES/
Authors: HOLY V DARHUBER AA STANGL J BAUER G NUTZEL JF ABSTREITER G
Citation: V. Holy et al., X-RAY REFLECTIVITY RECIPROCAL SPACE MAPPING OF STRAINED SIGE SI SUPERLATTICES/, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 419-428
HIGH-RESOLUTION X-RAY-DIFFRACTION FROM MULTILAYERED SELF-ASSEMBLED GEDOTS
Authors: DARHUBER AA SCHITTENHELM P HOLY V STANGL J BAUER G ABSTREITER G
Citation: Aa. Darhuber et al., HIGH-RESOLUTION X-RAY-DIFFRACTION FROM MULTILAYERED SELF-ASSEMBLED GEDOTS, Physical review. B, Condensed matter, 55(23), 1997, pp. 15652-15663
STRUCTURAL CHARACTERIZATION OF SELF-ASSEMBLED QUANTUM-DOT STRUCTURES BY X-RAY-DIFFRACTION TECHNIQUES
Authors: DARHUBER AA STANGL J HOLY V BAUER G KROST A GRUNDMANN M BIMBERG D USTINOV VM KOPEV PS KOSOGOV AO WERNER P
Citation: Aa. Darhuber et al., STRUCTURAL CHARACTERIZATION OF SELF-ASSEMBLED QUANTUM-DOT STRUCTURES BY X-RAY-DIFFRACTION TECHNIQUES, Thin solid films, 306(2), 1997, pp. 198-204
X-RAY-DIFFRACTION AND REFLECTION FROM SELF-ASSEMBLED GE DOTS
Authors: DARHUBER AA STANGL J BAUER G SCHITTENHELM P ABSTREITER G
Citation: Aa. Darhuber et al., X-RAY-DIFFRACTION AND REFLECTION FROM SELF-ASSEMBLED GE DOTS, Thin solid films, 294(1-2), 1997, pp. 296-299
MBE GROWTH AND STRUCTURAL CHARACTERIZATION OF SI1-YCY SI1-XGEX SUPERLATTICES/
Authors: ZERLAUTH S STANGL J DARHUBER AA HOLY V BAUER G SCHAFFLER F
Citation: S. Zerlauth et al., MBE GROWTH AND STRUCTURAL CHARACTERIZATION OF SI1-YCY SI1-XGEX SUPERLATTICES/, Journal of crystal growth, 175, 1997, pp. 459-464
HIGH-RESOLUTION X-RAY-DIFFRACTION STUDIES OF SHORT-PERIOD CDTE MNTE SUPERLATTICES/
Authors: DENAUROIS M STANGL J FASCHINGER W BAUER G FERRIERA S
Citation: M. Denaurois et al., HIGH-RESOLUTION X-RAY-DIFFRACTION STUDIES OF SHORT-PERIOD CDTE MNTE SUPERLATTICES/, Journal of applied physics, 81(9), 1997, pp. 6120-6125
INFLUENCE OF THERMAL ANNEALING ON THE PHOTOLUMINESCENCE FROM PSEUDOMORPHIC SI1-YCY EPILAYERS ON SI
Authors: PENN C ZERLAUTH S STANGL J BAUER G BRUNTHALER G SCHAFFLER F
Citation: C. Penn et al., INFLUENCE OF THERMAL ANNEALING ON THE PHOTOLUMINESCENCE FROM PSEUDOMORPHIC SI1-YCY EPILAYERS ON SI, Applied physics letters, 71(15), 1997, pp. 2172-2174
LATERAL AND VERTICAL ORDERING IN MULTILAYERED SELF-ORGANIZED INGAAS QUANTUM DOTS STUDIED BY HIGH-RESOLUTION X-RAY-DIFFRACTION
Authors: DARHUBER AA HOLY V STANGL J BAUER G KROST A HEINRICHSDORFF F GRUNDMANN M BIMBERG D USTINOV VM KOPEV PS KOSOGOV AO WERNER P
Citation: Aa. Darhuber et al., LATERAL AND VERTICAL ORDERING IN MULTILAYERED SELF-ORGANIZED INGAAS QUANTUM DOTS STUDIED BY HIGH-RESOLUTION X-RAY-DIFFRACTION, Applied physics letters, 70(8), 1997, pp. 955-957
STRAIN AND STRUCTURAL CHARACTERIZATION OF ZN1-XCDXSE LASER STRUCTURESGROWN ON GAAS AND INGAAS(001) SUBSTRATES
Authors: LI JH BAUER G STANGL J VANZETTI L SORBA L FRANCIOSI A
Citation: Jh. Li et al., STRAIN AND STRUCTURAL CHARACTERIZATION OF ZN1-XCDXSE LASER STRUCTURESGROWN ON GAAS AND INGAAS(001) SUBSTRATES, Journal of applied physics, 80(1), 1996, pp. 81-88
LOAD TO VOLTAGE DEPENDENCY TESTS AT BC HYDRO
Authors: DWYER A NIELSEN RE STANGL J MARKUSHEVICH NS
Citation: A. Dwyer et al., LOAD TO VOLTAGE DEPENDENCY TESTS AT BC HYDRO, IEEE transactions on power systems, 10(2), 1995, pp. 709-715
MOLECULAR-BEAM EPITAXY OF PSEUDOMORPHIC SILICON CARBON SUPERLATTICES ON SILICON SUBSTRATES/
Authors: FASCHINGER W ZERLAUTH S STANGL J BAUER G
Citation: W. Faschinger et al., MOLECULAR-BEAM EPITAXY OF PSEUDOMORPHIC SILICON CARBON SUPERLATTICES ON SILICON SUBSTRATES/, Applied physics letters, 67(18), 1995, pp. 2630-2632
Risultati: 1-25 |