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Results: 1-15 |
Results: 15
STRONTIUM ISOTOPE RATIO MEASUREMENTS IN PREHISTORIC HUMAN BONE SAMPLES BY MEANS OF HIGH-RESOLUTION INDUCTIVELY-COUPLED PLASMA-MASS SPECTROMETRY (HR-ICP-MS)
Authors: LATKOCZY C PROHASKA T STINGEDER G TESCHLERNICOLA M
Citation: C. Latkoczy et al., STRONTIUM ISOTOPE RATIO MEASUREMENTS IN PREHISTORIC HUMAN BONE SAMPLES BY MEANS OF HIGH-RESOLUTION INDUCTIVELY-COUPLED PLASMA-MASS SPECTROMETRY (HR-ICP-MS), Journal of analytical atomic spectrometry (Print), 13(6), 1998, pp. 561-566
DEPENDENCE OF DETECTOR DEAD-TIME ON ANALYTE MASS-NUMBER IN INDUCTIVELY-COUPLED PLASMA-MASS SPECTROMETRY
Authors: VANHAECKE F DEWANNEMACKER G MOENS L DAMS R LATKOCZY C PROHASKA T STINGEDER G
Citation: F. Vanhaecke et al., DEPENDENCE OF DETECTOR DEAD-TIME ON ANALYTE MASS-NUMBER IN INDUCTIVELY-COUPLED PLASMA-MASS SPECTROMETRY, Journal of analytical atomic spectrometry (Print), 13(6), 1998, pp. 567-571
INVESTIGATION OF ELEMENT VARIABILITY IN TREE-RINGS OF YOUNG NORWAY SPRUCE BY LASER-ABLATION-ICPMS
Authors: PROHASKA T STADLBAUER C WIMMER R STINGEDER G LATKOCZY C HOFFMANN E STEPHANOWITZ H
Citation: T. Prohaska et al., INVESTIGATION OF ELEMENT VARIABILITY IN TREE-RINGS OF YOUNG NORWAY SPRUCE BY LASER-ABLATION-ICPMS, Science of the total environment, 219(1), 1998, pp. 29-39
ADSORPTION OF TRACE-METALS BY TENSION LYSIMETERS - NYLON MEMBRANE VS.POROUS CERAMIC CUP
Authors: WENZEL WW SLETTEN RS BRANDSTETTER A WIESHAMMER G STINGEDER G
Citation: Ww. Wenzel et al., ADSORPTION OF TRACE-METALS BY TENSION LYSIMETERS - NYLON MEMBRANE VS.POROUS CERAMIC CUP, Journal of environmental quality, 26(5), 1997, pp. 1430-1434
VERIFICATION OF MODELS FOR THE SIMULATION OF BORON IMPLANTATION INTO CRYSTALLINE SILICON
Authors: HOBLER G SIMIONESCU A PALMETSHOFER L JAHNEL F VONCRIEGERN R TIAN C STINGEDER G
Citation: G. Hobler et al., VERIFICATION OF MODELS FOR THE SIMULATION OF BORON IMPLANTATION INTO CRYSTALLINE SILICON, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 272-277
SIMS AND RBS ANALYSIS OF LEACHED GLASS - RELIABILITY OF RSF METHOD FOR SIMS QUANTIFICATION
Authors: SALEM AA STINGEDER G GRASSERBAUER M SHREINER M GIESSLER KH RAUCH F
Citation: Aa. Salem et al., SIMS AND RBS ANALYSIS OF LEACHED GLASS - RELIABILITY OF RSF METHOD FOR SIMS QUANTIFICATION, Journal of materials science. Materials in electronics, 7(6), 1996, pp. 373-379
IMAGING SIMS FOR THE INVESTIGATION OF SUBSTRATE SURFACES FOR CVD DIAMOND DEPOSITION
Authors: STEINER R STINGEDER G HUTTER H GRASSERBAUER M HAUBNER R LUX B
Citation: R. Steiner et al., IMAGING SIMS FOR THE INVESTIGATION OF SUBSTRATE SURFACES FOR CVD DIAMOND DEPOSITION, Fresenius' journal of analytical chemistry, 352(3-4), 1995, pp. 313-317
MODELING OF ELECTRONIC STOPPING AND DAMAGE ACCUMULATION DURING ARSENIC IMPLANTATION IN SILICON
Authors: SIMIONESCU A HERZOG S HOBLER G SCHORK R LORENZ J TIAN C STINGEDER G
Citation: A. Simionescu et al., MODELING OF ELECTRONIC STOPPING AND DAMAGE ACCUMULATION DURING ARSENIC IMPLANTATION IN SILICON, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 100(4), 1995, pp. 483-489
BORON CHANNELING IMPLANTATIONS IN SILICON - MODELING OF ELECTRONIC STOPPING AND DAMAGE ACCUMULATION
Authors: HOBLER G SIMIONESCU A PALMETSHOFER L TIAN C STINGEDER G
Citation: G. Hobler et al., BORON CHANNELING IMPLANTATIONS IN SILICON - MODELING OF ELECTRONIC STOPPING AND DAMAGE ACCUMULATION, Journal of applied physics, 77(8), 1995, pp. 3697-3703
CHARACTERIZATION OF TANTALUM IMPURITIES IN HOT-FILAMENT DIAMOND LAYERS
Authors: GRIESSER M STINGEDER G GRASSERBAUER M BAUMANN H LINK F WURZINGER P LUX H HAUBNER R LUX B
Citation: M. Griesser et al., CHARACTERIZATION OF TANTALUM IMPURITIES IN HOT-FILAMENT DIAMOND LAYERS, DIAMOND AND RELATED MATERIALS, 3(4-6), 1994, pp. 638-644
INFLUENCES OF WC-CO HARD METAL-SUBSTRATE PRETREATMENTS WITH BORON ANDSILICON ON LOW-PRESSURE DIAMOND DEPOSITION
Authors: KUBELKA S HAUBNER R LUX B STEINER R STINGEDER G GRASSERBAUER M
Citation: S. Kubelka et al., INFLUENCES OF WC-CO HARD METAL-SUBSTRATE PRETREATMENTS WITH BORON ANDSILICON ON LOW-PRESSURE DIAMOND DEPOSITION, DIAMOND AND RELATED MATERIALS, 3(11-12), 1994, pp. 1360-1369
OPTIMIZATION OF SECONDARY-ION MASS-SPECTROMETRY FOR QUANTITATIVE TRACE ANALYSIS
Authors: STINGEDER G
Citation: G. Stingeder, OPTIMIZATION OF SECONDARY-ION MASS-SPECTROMETRY FOR QUANTITATIVE TRACE ANALYSIS, Analytica chimica acta, 297(1-2), 1994, pp. 231-251
TRENDS IN SURFACE AND INTERFACE ANALYSIS
Authors: GRASSERBAUER M FRIEDBACHER G HUTTER H STINGEDER G
Citation: M. Grasserbauer et al., TRENDS IN SURFACE AND INTERFACE ANALYSIS, Fresenius' journal of analytical chemistry, 346(6-9), 1993, pp. 594-603
DOPING OF FULLERENES BY ION-IMPLANTATION
Authors: KASTNER J KUZMANY H PALMETSHOFER L BAUER P STINGEDER G
Citation: J. Kastner et al., DOPING OF FULLERENES BY ION-IMPLANTATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 1456-1459
SURFACE-ANALYSIS AND CHARACTERIZATION OF CHEMICALLY-MODIFIED CHALCOGENIDE FIBERS
Authors: TAGA K SCHWARZBACH D STINGEDER G GRASSERBAUER M KELLNER R
Citation: K. Taga et al., SURFACE-ANALYSIS AND CHARACTERIZATION OF CHEMICALLY-MODIFIED CHALCOGENIDE FIBERS, Analytical chemistry, 65(17), 1993, pp. 2288-2293
Risultati: 1-15 |