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Results: 1-10 |
Results: 10
SULFUR-MODIFIED SURFACE OF INP(001) - EVIDENCE FOR SULFUR INCORPORATION AND SURFACE OXIDATION
Authors: CHASSE T CHASSE A PEISERT H STREUBEL P
Citation: T. Chasse et al., SULFUR-MODIFIED SURFACE OF INP(001) - EVIDENCE FOR SULFUR INCORPORATION AND SURFACE OXIDATION, Applied physics A: Materials science & processing, 65(6), 1997, pp. 543-549
CHEMICAL-STABILITY OF (NH4)(2)S-PASSIVATED INP(001) SURFACES - INVESTIGATIONS BY XPS AND XPD
Authors: PEISERT H STREUBEL P CHASSE T SZARGAN R
Citation: H. Peisert et al., CHEMICAL-STABILITY OF (NH4)(2)S-PASSIVATED INP(001) SURFACES - INVESTIGATIONS BY XPS AND XPD, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 201-203
EXTENDED FENSKE-HALL LCAO MO CALCULATIONS OF CORE-LEVEL SHIFTS IN SOLID P COMPOUNDS
Authors: FRANKE R CHASSE T REINHOLD J STREUBEL P SZARGAN R
Citation: R. Franke et al., EXTENDED FENSKE-HALL LCAO MO CALCULATIONS OF CORE-LEVEL SHIFTS IN SOLID P COMPOUNDS, Chemical physics, 220(3), 1997, pp. 299-310
THE INFLUENCE OF THE AMORPHOUS OVERLAYER ON THE PHOTOELECTRON DIFFRACTION INTENSITIES OF THE SINGLE-CRYSTAL
Authors: NEFEDOV VI FEDOROVA IS PEISERT H STREUBEL P CHASSE T SZARGAN R
Citation: Vi. Nefedov et al., THE INFLUENCE OF THE AMORPHOUS OVERLAYER ON THE PHOTOELECTRON DIFFRACTION INTENSITIES OF THE SINGLE-CRYSTAL, Doklady Akademii nauk. Rossijskaa akademia nauk, 348(3), 1996, pp. 339-342
LINESHAPE ASYMMETRY PARAMETERS IN X-RAY PHOTOELECTRON-SPECTRA
Authors: YARZHEMSKY VG REICH T CHERNYSHEVA LV STREUBEL P SZARGAN R
Citation: Vg. Yarzhemsky et al., LINESHAPE ASYMMETRY PARAMETERS IN X-RAY PHOTOELECTRON-SPECTRA, Journal of electron spectroscopy and related phenomena, 77(1), 1996, pp. 15-24
CHEMICAL BONDING STUDIES ON UV OZONE-TREATED AND (NH4)(2)S-TREATED INP(001) SURFACES BY X-RAY PHOTOELECTRON-SPECTROSCOPY AND X-RAY-INDUCED AUGER-ELECTRON SPECTROSCOPY/
Authors: STREUBEL P PEISERT H HESSE R CHASSE T SZARGAN R
Citation: P. Streubel et al., CHEMICAL BONDING STUDIES ON UV OZONE-TREATED AND (NH4)(2)S-TREATED INP(001) SURFACES BY X-RAY PHOTOELECTRON-SPECTROSCOPY AND X-RAY-INDUCED AUGER-ELECTRON SPECTROSCOPY/, Surface and interface analysis, 23(9), 1995, pp. 581-588
SULFURIZATION OF INP(001) SURFACES STUDIED BY X-RAY PHOTOELECTRON ANDX-RAY-INDUCED AUGER-ELECTRON SPECTROSCOPIES (XPS XAES)/
Authors: CHASSE T PEISERT H STREUBEL P SZARGAN R
Citation: T. Chasse et al., SULFURIZATION OF INP(001) SURFACES STUDIED BY X-RAY PHOTOELECTRON ANDX-RAY-INDUCED AUGER-ELECTRON SPECTROSCOPIES (XPS XAES)/, Surface science, 333, 1995, pp. 434-440
RELAXATION ENERGIES IN XPS AND XAES OF SOLID SULFUR-COMPOUNDS
Authors: PEISERT H CHASSE T STREUBEL P MEISEL A SZARGAN R
Citation: H. Peisert et al., RELAXATION ENERGIES IN XPS AND XAES OF SOLID SULFUR-COMPOUNDS, Journal of electron spectroscopy and related phenomena, 68, 1994, pp. 321-328
XPS BINDING-ENERGIES OF DEEP CORE LEVELS AND THE AUGER PARAMETER - ANAPPLICATION TO SOLID SULFUR-COMPOUNDS
Authors: CHASSE T PEISERT H STREUBEL P SZARGAN R MEISEL A
Citation: T. Chasse et al., XPS BINDING-ENERGIES OF DEEP CORE LEVELS AND THE AUGER PARAMETER - ANAPPLICATION TO SOLID SULFUR-COMPOUNDS, Acta Physica Polonica. A, 83(6), 1993, pp. 793-802
X-RAY PHOTOELECTRON SPECTROSCOPIC CORE-LEVEL SHIFTS OF PHOSPHORUS IN PHOSPHATES AND NATIVE OXIDE LAYERS ON INP(100) - APPLICATIONS OF THE AUGER PARAMETER CONCEPT
Authors: CHASSE T FRANKE R URBAN C FRANZHELD R STREUBEL P MEISEL A
Citation: T. Chasse et al., X-RAY PHOTOELECTRON SPECTROSCOPIC CORE-LEVEL SHIFTS OF PHOSPHORUS IN PHOSPHATES AND NATIVE OXIDE LAYERS ON INP(100) - APPLICATIONS OF THE AUGER PARAMETER CONCEPT, Journal of electron spectroscopy and related phenomena, 62(3), 1993, pp. 287-308
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