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Citation: A. Gohl et al., INFLUENCE OF STRUCTURAL AND MORPHOLOGICAL PROPERTIES ON THE INTRINSICFIELD-EMISSION OF CVD DIAMOND FILMS, DIAMOND AND RELATED MATERIALS, 7(2-5), 1998, pp. 666-670
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Citation: J. Muller et al., ELECTRON-MICROSCOPY OF SIC LAYERS PRODUCE D BY FULLERENE CARBONIZATION OF SILICON, European journal of cell biology, 74, 1997, pp. 126-126
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Citation: A. Koniger et al., IN-SITU STUDIES OF PHASE-FORMATION AND TRANSFORMATION IN CARBON ION-IMPLANTED IRON - INVESTIGATION OF ELECTRICAL-RESISTIVITY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 127, 1997, pp. 137-140
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