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Authors: ZHENG WT HELLGREN N SUNDGREN JE
Citation: Wt. Zheng et al., REACTIVE MAGNETRON SPUTTERING OF CNX THIN-FILMS ON BETA-SI3N4 SUBSTRATES, JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 14(3), 1998, pp. 269-272

Authors: ZHENG WT XING KZ HELLGREN N IVANOV I SALANECK WS SUNDGREN JE
Citation: Wt. Zheng et al., N1S ELECTRON-BINDING ENERGIES OF CNX THIN-FILMS GROWN BY MAGNETRON SPUTTERING AT DIFFERENT TEMPERATURE, JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 14(1), 1998, pp. 25-28

Authors: BJORKETUN LO HULTMAN L KORDINA O SUNDGREN JE
Citation: Lo. Bjorketun et al., TEXTURE EVOLUTION IN SI SIC LAYERED STRUCTURES DEPOSITED ON SI(001) BY CHEMICAL-VAPOR-DEPOSITION/, Journal of materials research, 13(9), 1998, pp. 2632-2642

Authors: GALL D PETROV I MADSEN LD SUNDGREN JE GREENE JE
Citation: D. Gall et al., MICROSTRUCTURE AND ELECTRONIC-PROPERTIES OF THE REFRACTORY SEMICONDUCTOR SCN GROWN ON MG0(001) BY ULTRA-HIGH-VACUUM REACTIVE MAGNETRON SPUTTER-DEPOSITION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(4), 1998, pp. 2411-2417

Authors: SVEDBERG EB BIRCH J IVANOV I MUNGER EP SUNDGREN JE
Citation: Eb. Svedberg et al., ASYMMETRIC INTERFACE BROADENING IN EPITAXIAL MO W(001) SUPERLATTICES GROWN BY MAGNETRON SPUTTERING/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(2), 1998, pp. 633-638

Authors: ZHENG WT HELLGREN N SJOSTROM H SUNDGREN JE
Citation: Wt. Zheng et al., CHARACTERIZATION OF CARBON NITRIDE THIN-FILMS DEPOSITED BY REACTIVE DC MAGNETRON SPUTTERING ON VARIOUS SUBSTRATE MATERIALS, Surface & coatings technology, 101(1-3), 1998, pp. 287-290

Authors: ZHENG WT SUNDGREN JE
Citation: Wt. Zheng et Je. Sundgren, CHARACTERIZATION OF MAGNETRON SPUTTER CNX THIN-FILMS, Chinese Physics Letters, 15(2), 1998, pp. 120-122

Authors: MUNGER EP CHIRITA V SUNDGREN JE GREENE JE
Citation: Ep. Munger et al., DESTABILIZATION AND DIFFUSION OF 2-DIMENSIONAL CLOSE-PACKED PT CLUSTERS ON PT(111) DURING FILM GROWTH FROM THE VAPOR-PHASE, Thin solid films, 318(1-2), 1998, pp. 57-60

Authors: FORNANDER H HULTMAN L BIRCH J SUNDGREN JE
Citation: H. Fornander et al., INITIAL GROWTH OF PD ON MGO(001), Journal of crystal growth, 186(1-2), 1998, pp. 189-202

Authors: GALL D PETROV I HELLGREN N HULTMAN L SUNDGREN JE GREENE JE
Citation: D. Gall et al., GROWTH OF POLY-CRYSTAL AND SINGLE-CRYSTAL SCN ON MGO(001) - ROLE OF LOW-ENERGY N-2(-PROPERTIES() IRRADIATION IN DETERMINING TEXTURE, MICROSTRUCTURE EVOLUTION, AND MECHANICAL), Journal of applied physics, 84(11), 1998, pp. 6034-6041

Authors: GURDAL O DESJARDINS P CARLSSON JRA TAYLOR N RADAMSON HH SUNDGREN JE GREENE JE
Citation: O. Gurdal et al., LOW-TEMPERATURE GROWTH AND CRITICAL EPITAXIAL THICKNESSES OF FULLY STRAINED METASTABLE GE1-XSNX (X-LESS-THAN-OR-SIMILAR-TO-0.26) ALLOYS ON GE(001)2X1, Journal of applied physics, 83(1), 1998, pp. 162-170

Authors: BROITMAN E ZHENG WT SJOSTROM H IVANOV I GREENE JE SUNDGREN JE
Citation: E. Broitman et al., STRESS DEVELOPMENT DURING DEPOSITION OF CNX THIN-FILMS, Applied physics letters, 72(20), 1998, pp. 2532-2534

Authors: CHIRITA V MUNGER EP SUNDGREN JE GREENE JE
Citation: V. Chirita et al., ENHANCED CLUSTER MOBILITIES ON PT(111) DURING FILM GROWTH FROM THE VAPOR-PHASE, Applied physics letters, 72(1), 1998, pp. 127-129

Authors: ZHENG WT DING T IVANOV I SUNDGREN JE
Citation: Wt. Zheng et al., INFLUENCE OF EXPERIMENTAL PARAMETERS ON REACTIVE MAGNETRON SPUTTERINGCNX THIN-FILMS, JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 13(2), 1997, pp. 154-156

Authors: HJORVARSSON B BIRCH J STILLESJO F OLAFSSON S SUNDGREN JE KARLSSON EB
Citation: B. Hjorvarsson et al., THE ORIENTATION DEPENDENCE OF THE HYDROGEN DISTRIBUTION WITHIN MO V(110) AND MO/V(001) MULTILAYERED ARTIFICIAL SUPERLATTICES/, Journal of physics. Condensed matter, 9(1), 1997, pp. 73-85

Authors: CZIGANY Z RADNOCZI G JARRENDAHL K SUNDGREN JE
Citation: Z. Czigany et al., ANNEALING-INDUCED INTERDIFFUSION AND CRYSTALLIZATION IN SPUTTERED AMORPHOUS SI GE MULTILAYERS/, Journal of materials research, 12(9), 1997, pp. 2255-2261

Authors: JARRENDAHL K IVANOV I SUNDGREN JE RADNOCZI G CZIGANY Z GREENE JE
Citation: K. Jarrendahl et al., MICROSTRUCTURE EVOLUTION IN AMORPHOUS GE SI MULTILAYERS GROWN BY MAGNETRON SPUTTER-DEPOSITION/, Journal of materials research, 12(7), 1997, pp. 1806-1815

Authors: ZHENG WT XING KZ HELLGREN N LOGDLUND M JOHANSSON A GELIVS U SALANECK WR SUNDGREN JE
Citation: Wt. Zheng et al., NITROGEN 1S ELECTRON-BINDING ENERGY ASSIGNMENT IN CARBON NITRIDE THIN-FILMS WITH DIFFERENT STRUCTURES, Journal of electron spectroscopy and related phenomena, 87(1), 1997, pp. 45-49

Authors: IVANOV I LJUNGCRANTZ H HAKANSSON G PETROV I SUNDGREN JE
Citation: I. Ivanov et al., ION ENERGY-DISTRIBUTIONS IN REACTIVE ARC EVAPORATION DISCHARGES USED FOR DEPOSITION OF TIN FILMS, Surface & coatings technology, 92(1-2), 1997, pp. 150-156

Authors: BAUER AD HERRANEN M LJUNGCRANTZ H CARLSSON JO SUNDGREN JE
Citation: Ad. Bauer et al., CORROSION BEHAVIOR OF MONOCRYSTALLINE TITANIUM NITRIDE, Surface & coatings technology, 91(3), 1997, pp. 208-214

Authors: ZHENG WT BROITMAN E HELLGREN N XING KZ IVANOV I SJOSTROM H HULTMAN L SUNDGREN JE
Citation: Wt. Zheng et al., REACTIVE MAGNETRON SPUTTERING OF CNX THIN-FILMS AT DIFFERENT SUBSTRATE BIAS, Thin solid films, 308, 1997, pp. 223-227

Authors: CARLSSON JRA SUNDGREN JE MADSEN LD LI XH HENTZELL HTG
Citation: Jra. Carlsson et al., THERMAL-STABILITY AND CRYSTALLIZATION OF AMORPHOUS SI1-XBX, SI1-XPX AND SI1-XSBX ALLOY THIN-FILMS, Thin solid films, 300(1-2), 1997, pp. 51-58

Authors: BJORKETUN LO HULTMAN L IVANOV IP WAHAB Q SUNDGREN JE
Citation: Lo. Bjorketun et al., INTERFACIAL VOID FORMATION DURING VAPOR-PHASE GROWTH OF 3C-SIC ON SI(001) AND SI(111) SUBSTRATES - CHARACTERIZATION BY TRANSMISSION ELECTRON-MICROSCOPY, Journal of crystal growth, 182(3-4), 1997, pp. 379-388

Authors: CSILLAG S RATY R ZOU WY SJOSTROM H SUNDGREN JE COLLIEX C
Citation: S. Csillag et al., EXTENDED ENERGY-LOSS FINE-STRUCTURE ANALYSIS OF HARD AND ELASTIC CARBON NITRIDE THIN-FILMS, Journal of applied physics, 82(2), 1997, pp. 666-669

Authors: CARLSSON JRA SUNDGREN JE LI XH MADSEN LD HENTZELL HTG
Citation: Jra. Carlsson et al., PREDICTING THE CRYSTALLIZATION TEMPERATURE-VARIATION WITH COMPOSITIONFOR AMORPHOUS SILICON-BASED BINARY ALLOY THIN-FILMS, Journal of applied physics, 81(3), 1997, pp. 1150-1156
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