Authors:
Tille, T
Sauerbrey, J
Schmitt-Landsiedel, D
Citation: T. Tille et al., A 1.8-V MOSFET-only Sigma Delta modulator using substrate biased depletion-mode MOS capacitors in series compensation, IEEE J SOLI, 36(7), 2001, pp. 1041-1047
Citation: B. Wicht et al., Analysis and compensation of the bitline multiplexer in SRAM current senseamplifiers, IEEE J SOLI, 36(11), 2001, pp. 1745-1755
Authors:
Hauder, M
Gstottner, J
Hansch, W
Schmitt-Landsiedel, D
Citation: M. Hauder et al., Scaling properties and electromigration resistance of sputtered Ag metallization lines, APPL PHYS L, 78(6), 2001, pp. 838-840
Authors:
Schienle, M
Zanon, T
Schmitt-Landsiedel, D
Citation: M. Schienle et al., Improved SRAM failure diagnosis for process monitoring via current signature analysis, MICROEL REL, 39(6-7), 1999, pp. 1009-1014