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Results: 1-25 | 26-50 | 51-63
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Authors: Sherman, V Astafiev, K Setter, N Tagantsev, A Vendik, O Vendik, I Hoffmann-Eifert, S Bottger, U Waser, R
Citation: V. Sherman et al., Digital reflection-type phase shifter based on a ferroelectric planar capacitor, IEEE MICR W, 11(10), 2001, pp. 407-409

Authors: Woo, J Hong, S Setter, N Shin, H Jeon, JU Pak, YE No, K
Citation: J. Woo et al., Quantitative analysis of the bit size dependence on the pulse width and pulse voltage in ferroelectric memory devices using atomic force microscopy, J VAC SCI B, 19(3), 2001, pp. 818-824

Authors: Seifert, A Ledermann, N Hiboux, S Baborowski, J Muralt, P Setter, N
Citation: A. Seifert et al., Processing optimization of solution derived PbZr1-xTixO3 thin films for piezoelectric applications, INTEGR FERR, 35(1-4), 2001, pp. 1889-1896

Authors: Ledermann, N Baborowski, J Seifert, A Willing, B Hiboux, S Muralt, P Setter, N Forster, M
Citation: N. Ledermann et al., Piezoelectric cantilever microphone for photoacoustic GAS detector, INTEGR FERR, 35(1-4), 2001, pp. 1907-1914

Authors: Stolichnov, I Tagantsev, A Setter, N Okhonin, S Fazan, P Cross, JS Tsukada, M Bartic, A Wouters, D
Citation: I. Stolichnov et al., Constant-current study of dielectric breakdown of Pb(Zr,Ti)O-3 ferroelectric film capacitors, INTEGR FERR, 32(1-4), 2001, pp. 737-746

Authors: Torii, K Colla, EL Song, HW Tagantsev, AK No, K Setter, N
Citation: K. Torii et al., Size and top electrode-edge effects on fatigue in Pb(Zr,Ti)O-3 capacitors with Pt-electrodes, INTEGR FERR, 32(1-4), 2001, pp. 907-916

Authors: Setter, N
Citation: N. Setter, Electroceramics: looking ahead, J EUR CERAM, 21(10-11), 2001, pp. 1279-1293

Authors: Kim, HS Kim, JH Choo, WK Setter, N
Citation: Hs. Kim et al., Phase transition behaviors of (1-x)Pb(Yb1/2Nb1/2) O-3-xBa(Yb1/2Nb1/2)O-3 ceramics, J EUR CERAM, 21(10-11), 2001, pp. 1665-1668

Authors: Gentil, S Robert, G Setter, N Rivera, JP
Citation: S. Gentil et al., Flux growth and characterization of quasi cubic PZN-PT single crystals, ANN CHIM-SC, 26(1), 2001, pp. 107-112

Authors: Robert, G Damjanovic, D Setter, N
Citation: G. Robert et al., Piezoelectric hysteresis analysis and loss separation, J APPL PHYS, 90(9), 2001, pp. 4668-4675

Authors: Kighelman, Z Damjanovic, D Setter, N
Citation: Z. Kighelman et al., Dielectric and electromechanical properties of ferroelectric-relaxor 0.9 Pb(Mg1/3Nb2/3)O-3-0.1PbTiO(3) thin films, J APPL PHYS, 90(9), 2001, pp. 4682-4689

Authors: Robert, G Damjanovic, D Setter, N
Citation: G. Robert et al., Preisach distribution function approach to piezoelectric nonlinearity and hysteresis, J APPL PHYS, 90(5), 2001, pp. 2459-2464

Authors: Tagantsev, AK Stolichnov, I Colla, EL Setter, N
Citation: Ak. Tagantsev et al., Polarization fatigue in ferroelectric films: Basic experimental findings, phenomenological scenarios, and microscopic features, J APPL PHYS, 90(3), 2001, pp. 1387-1402

Authors: Damjanovic, D Maeder, MD Martin, PD Voisard, C Setter, N
Citation: D. Damjanovic et al., Maxwell-Wagner piezoelectric relaxation in ferroelectric heterostructures, J APPL PHYS, 90(11), 2001, pp. 5708-5712

Authors: Robert, G Damjanovic, D Setter, N Turik, AV
Citation: G. Robert et al., Preisach modeling of piezoelectric nonlinearity in ferroelectric ceramics, J APPL PHYS, 89(9), 2001, pp. 5067-5074

Authors: Kighelman, Z Damjanovic, D Setter, N
Citation: Z. Kighelman et al., Electromechanical properties and self polarization in relaxor Pb(Mg1/3Nb2/3)O-3 thin films (vol 89, pg 1393, 2001), J APPL PHYS, 89(9), 2001, pp. 5231-5231

Authors: Hong, S Woo, J Shin, H Jeon, JU Pak, YE Colla, EL Setter, N Kim, E No, K
Citation: S. Hong et al., Principle of ferroelectric domain imaging using atomic force microscope, J APPL PHYS, 89(2), 2001, pp. 1377-1386

Authors: Kighelman, Z Damjanovic, D Setter, N
Citation: Z. Kighelman et al., Electromechanical properties and self-polarization in relaxor Pb(Mg1/3Nb2/3)O-3 thin films, J APPL PHYS, 89(2), 2001, pp. 1393-1401

Authors: Kholkin, AL Akdogan, EK Safari, A Chauvy, PF Setter, N
Citation: Al. Kholkin et al., Characterization of the effective electrostriction coefficients in ferroelectric thin films, J APPL PHYS, 89(12), 2001, pp. 8066-8073

Authors: Costantini, DM Limberger, HG Salathe, RP Muller, CAP Muralt, P Setter, N
Citation: Dm. Costantini et al., All-fiber phase modulator based on lead zirconate titanate thin-film coating, APPL PHYS L, 78(15), 2001, pp. 2193-2195

Authors: Gentil, S Robert, G Setter, N Tissot, P Rivera, JP
Citation: S. Gentil et al., Growth and properties of transparent Pb(Zn-1/3, Nb-2/3)O-3-PbTiO3 single crystals with a cubic habitus, JPN J A P 1, 39(5A), 2000, pp. 2732-2735

Authors: Setter, N Waser, R
Citation: N. Setter et R. Waser, Electroceramic materials, ACT MATER, 48(1), 2000, pp. 151-178

Authors: Pertsev, NA Tagantsev, AK Setter, N
Citation: Na. Pertsev et al., Phase transitions and strain-induced ferroelectricity in SrTiO3 epitaxial thin films, PHYS REV B, 61(2), 2000, pp. R825-R829

Authors: Baborowski, J Muralt, P Ledermann, N Colla, E Seifert, A Gentil, S Setter, N
Citation: J. Baborowski et al., Mechanisms of Pb(Zr0.53Ti0.47)O-3 thin film etching with ECR/RF reactor, INTEGR FERR, 31(1-4), 2000, pp. 261-271

Authors: Stolichnov, I Tagantsev, A Colla, E Gentil, S Hiboux, S Baborowski, J Muralt, P Setter, N
Citation: I. Stolichnov et al., Downscaling of Pb(Zr,Ti)O-3 film thickness for low-voltage ferroelectric capacitors: Effect of charge relaxation at the interfaces, J APPL PHYS, 88(4), 2000, pp. 2154-2156
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