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Results:
1-7
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Results: 7
Authors:
Fleetwood, DM
Riewe, LC
Winokur, PS
Sexton, FW
Citation: Dm. Fleetwood et al., Dielectric breakdown of thin oxides during ramped current-temperature stress, IEEE NUCL S, 47(6), 2000, pp. 2305-2310
Authors:
Schone, N
Walsh, DS
Sexton, FW
Doyle, BL
Dodd, PE
Aurand, JF
Wing, N
Citation: N. Schone et al., Time-resolved ion beam induced charge collection (TRIBICC) in micro-electronics, NUCL INST B, 158(1-4), 1999, pp. 424-431
Authors:
Winokur, PS
Lum, GK
Shaneyfelt, MR
Sexton, FW
Hash, GL
Scott, L
Citation: Ps. Winokur et al., Use of COTS microelectronics in radiation environments, IEEE NUCL S, 46(6), 1999, pp. 1494-1503
Authors:
Sexton, FW
Citation: Fw. Sexton, 1998 Special NSREC issue of the IEEE Transactions on Nuclear Science - Guest editor's comments, IEEE NUCL S, 45(6), 1998, pp. 2334-2334
Authors:
Dodd, PE
Musseau, O
Shaneyfelt, MR
Sexton, FW
D'hose, C
Hash, GL
Martinez, M
Loemker, RA
Leray, JL
Winokur, PS
Citation: Pe. Dodd et al., Impact of ion energy on single-event upset, IEEE NUCL S, 45(6), 1998, pp. 2483-2491
Authors:
Sexton, FW
Fleetwood, DM
Shaneyfelt, MR
Dodd, PE
Hash, GL
Schanwald, LP
Loemker, RA
Krisch, KS
Green, ML
Weir, BE
Silverman, PJ
Citation: Fw. Sexton et al., Precursor ion damage and angular dependence of single event gate rupture in thin oxides, IEEE NUCL S, 45(6), 1998, pp. 2509-2518
Authors:
Schone, H
Walsh, DS
Sexton, FW
Doyle, BL
Dodd, PE
Aurand, JF
Flores, RS
Wing, N
Citation: H. Schone et al., Time-resolved ion beam induced charge collection (TRIBICC) in micro-electronics, IEEE NUCL S, 45(6), 1998, pp. 2544-2549
Risultati:
1-7
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