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Results:
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Results: 25
Authors:
Foster, AS
Hofer, WA
Shluger, AL
Citation: As. Foster et al., Quantitative modelling in scanning probe microscopy, CURR OP SOL, 5(5), 2001, pp. 427-434
Authors:
Barth, C
Foster, AS
Reichling, M
Shluger, AL
Citation: C. Barth et al., Contrast formation in atomic resolution scanning force microscopy on CaF2(111): experiment and theory, J PHYS-COND, 13(10), 2001, pp. 2061-2079
Authors:
Stoneham, AM
Szymanski, MA
Shluger, AL
Citation: Am. Stoneham et al., Atomic and ionic processes of silicon oxidation - art. no. 241304, PHYS REV B, 6324(24), 2001, pp. 1304
Authors:
Szymanski, MA
Shluger, AL
Stoneham, AM
Citation: Ma. Szymanski et al., Role of disorder in incorporation energies of oxygen atoms in amorphous silica - art. no. 224207, PHYS REV B, 6322(22), 2001, pp. 4207
Authors:
Kantorovich, LN
Shluger, AL
Stoneham, AM
Citation: Ln. Kantorovich et al., Recognition of surface species in atomic force microscopy: Optical properties of a Cr3+ defect at the MgO (001) surface - art. no. 184111, PHYS REV B, 6318(18), 2001, pp. 4111
Authors:
Foster, AS
Shluger, AL
Citation: As. Foster et Al. Shluger, Spin-contrast in non-contact SFM on oxide surfaces: theoretical modelling of NiO(001) surface, SURF SCI, 490(1-2), 2001, pp. 211-219
Authors:
Foster, AS
Barth, C
Shluger, AL
Reichling, M
Citation: As. Foster et al., Unambiguous interpretation of atomically resolved force microscopy images of an insulator, PHYS REV L, 86(11), 2001, pp. 2373-2376
Authors:
Hess, WP
Joly, AG
Gerrity, DP
Beck, KM
Sushko, PV
Shluger, AL
Citation: Wp. Hess et al., Selective laser desorption of ionic surfaces: Resonant surface excitation of KBr, J CHEM PHYS, 115(20), 2001, pp. 9463-9472
Authors:
Shluger, AL
Tanimura, K
Citation: Al. Shluger et K. Tanimura, Laser-induced reactions in crystals: Femtosecond pump-probe spectroscopy and ab initio calculations of self-trapped excitons and holes in KBr, PHYS REV B, 61(8), 2000, pp. 5392-5402
Authors:
Sushko, PV
Shluger, AL
Baetzold, RC
Catlow, CRA
Citation: Pv. Sushko et al., Embedded cluster calculations of metal complex impurity defects: properties of the iron cyanide in NaCl, J PHYS-COND, 12(38), 2000, pp. 8257-8266
Authors:
Shluger, AL
Gavartin, JL
Szymanski, MA
Stoneham, AM
Citation: Al. Shluger et al., Atomistic modelling of radiation effects: Towards dynamics of exciton relaxation, NUCL INST B, 166, 2000, pp. 1-12
Authors:
Bennewitz, R
Foster, AS
Kantorovich, LN
Bammerlin, M
Loppacher, C
Schar, S
Guggisberg, M
Meyer, E
Shluger, AL
Citation: R. Bennewitz et al., Atomically resolved edges and kinks of NaCl islands on Cu(111): Experimentand theory, PHYS REV B, 62(3), 2000, pp. 2074-2084
Authors:
Sushko, PV
Shluger, AL
Catlow, CRA
Citation: Pv. Sushko et al., Relative energies of surface and defect states: ab initio calculations forthe MgO(001) surface, SURF SCI, 450(3), 2000, pp. 153-170
Authors:
Kantorovich, LN
Foster, AS
Shluger, AL
Stoneham, AM
Citation: Ln. Kantorovich et al., Role of image forces in non-contact scanning force microscope images of ionic surfaces, SURF SCI, 445(2-3), 2000, pp. 283-299
Authors:
Kantorovich, LN
Shluger, AL
Sushko, PV
Stoneham, AM
Citation: Ln. Kantorovich et al., The prediction of metastable impact electronic spectra (MIES): perfect anddefective MgO(001) surfaces by state-of-the-art methods, SURF SCI, 444(1-3), 2000, pp. 31-51
Authors:
Kantorovich, LN
Shluger, AL
Stoneham, AM
Citation: Ln. Kantorovich et al., Structure and spectroscopy of surface defects from scanning force microscopy: Theoretical predictions, PHYS REV L, 85(18), 2000, pp. 3846-3849
Authors:
Kantorovich, LN
Shluger, AL
Sushko, PV
Gunster, J
Stracke, P
Goodman, DW
Kempter, V
Citation: Ln. Kantorovich et al., Mg clusters on MgO surfaces: study of the nucleation mechanism with MIES and ab initio calculations, FARADAY DIS, (114), 1999, pp. 173-194
Authors:
Sushko, PV
Shluger, AL
Catlow, CRA
Baetzold, RC
Citation: Pv. Sushko et al., Embedded cluster approach: Application to complex defects, RADIAT EFF, 151(1-4), 1999, pp. 215-221
Authors:
Shluger, AL
Livshits, AI
Foster, AS
Catlow, CRA
Citation: Al. Shluger et al., Models of image contrast in scanning force microscopy on insulators, J PHYS-COND, 11(26), 1999, pp. R295-R322
Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM)
Authors:
Sushko, PV
Foster, AS
Kantorovich, LN
Shluger, AL
Citation: Pv. Sushko et al., Investigating the effects of silicon tip contamination in noncontact scanning force microscopy (SFM), APPL SURF S, 145, 1999, pp. 608-612
Authors:
Livshits, AI
Shluger, AL
Citation: Ai. Livshits et Al. Shluger, Atomic and chemical resolution in scanning force microscopy on ionic surfaces, APPL SURF S, 141(3-4), 1999, pp. 274-286
Authors:
Livshits, AI
Shluger, AL
Rohl, AL
Citation: Ai. Livshits et al., Contrast mechanism in non-contact SFM imaging of ionic surfaces, APPL SURF S, 140(3-4), 1999, pp. 327-332
Authors:
Shluger, AL
Sushko, PV
Kantorovich, LN
Citation: Al. Shluger et al., Spectroscopy of low-coordinated surface sites: Theoretical study of MgO, PHYS REV B, 59(3), 1999, pp. 2417-2430
Authors:
Livshits, AI
Shluger, AL
Rohl, AL
Foster, AS
Citation: Ai. Livshits et al., Model of noncontact scanning force microscopy on ionic surfaces, PHYS REV B, 59(3), 1999, pp. 2436-2448
Authors:
Sushko, PV
Shluger, AL
Citation: Pv. Sushko et Al. Shluger, Electronic structure of excited states at low-coordinated surface sites ofMgO, SURF SCI, 421(3), 1999, pp. L157-L165
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