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Results:
1-22
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Results: 22
Authors:
Garcia, S
Font, R
Portelles, J
Quinones, RJ
Heiras, J
Siqueiros, JM
Citation: S. Garcia et al., Effect of Nb doping on (Sr,Ba)TiO3 (BST) ceramic samples, J ELECTROCE, 6(2), 2001, pp. 101-108
Authors:
Perez, J
Amorin, H
Portelles, J
Guerrero, F
M'Peko, JC
Siqueiros, JM
Citation: J. Perez et al., Electrical properties of the titanium modified SBN ceramic system, J ELECTROCE, 6(2), 2001, pp. 153-157
Authors:
Fundora, A
Martinez, E
Amorin, H
Contreras, OE
Siqueiros, JM
Citation: A. Fundora et al., Pb(Mg1/3Nb2/3)(0.97)Ti0.03O3 ferroelectric thin films, deposited by laser ablation on TiN bottom electrodes, J ELECTROCE, 6(1), 2001, pp. 21-25
Authors:
Cruz-Jauregui, MP
Siqueiros, JM
Portelles, J
Citation: Mp. Cruz-jauregui et al., Influence of Bi2O3 in the microstructure of SrBi2Ta2O3 films deposited by pulsed laser ablation, J MAT S-M E, 12(8), 2001, pp. 461-465
Authors:
Diaz, JA
Contreras, O
Siqueiros, JM
Citation: Ja. Diaz et al., Formation of two layers in Pr1-xCaxBa2Cu3O7-y (0 <= x <= 0.5) thin films deposited at different temperatures, INT J MOD B, 14(16), 2000, pp. 1651-1657
Authors:
Lopez, LL
Portelles, J
Siqueiros, JM
Hirata, GA
McKittrick, J
Citation: Ll. Lopez et al., Ba0.5Sr0.5TiO3 thin films deposited by PLD on SiO2/Si RuO2/Si and Pt/Si electrodes, THIN SOL FI, 373(1-2), 2000, pp. 49-52
Authors:
Fundora, A
Siqueiros, JM
Citation: A. Fundora et Jm. Siqueiros, Deposition and characterization of PMNT thin films, THIN SOL FI, 373(1-2), 2000, pp. 60-63
Authors:
Diaz, JA
Contreras, O
Siqueiros, JM
Citation: Ja. Diaz et al., Structural and electronic properties of Pr1-xCaxBa2Cu3O7-y (0 <= x <= 0.5)thin films deposited by PLD on (100) SrTiO3 and (100) YSZ substrates at different temperatures, SOL ST COMM, 115(11), 2000, pp. 609-613
Authors:
Amorin, H
Portelles, J
Guerrero, F
Perez, J
Siqueiros, JM
Citation: H. Amorin et al., Dielectric hysteresis and pyroelectricity in the La0.03Sr0.255Ba0.7Nb2-yTiyO(6-y)/2 ferroelectric ceramic system, SOL ST COMM, 113(10), 2000, pp. 581-585
Authors:
Coello, V
Siqueiros, JM
Citation: V. Coello et Jm. Siqueiros, Elastic multiple scattering of surface plasmon polaritons: studies with a near-field optical microscope, REV MEX FIS, 46(5), 2000, pp. 457-461
Authors:
Fundora, A
Portelles, JJ
Rosario, G
Siqueiros, JM
Citation: A. Fundora et al., Study of the relaxor ferroelectric properties of the Pb(Mg1/3Nb2/3)(3(1-x))TixO3 ceramic, REV MEX FIS, 46(4), 2000, pp. 357-360
Authors:
Cruz, AF
Portelles, JJ
Siqueiros, JM
Citation: Af. Cruz et al., Microstructural properties of BaTiO3 ceramics and thin films, REV MEX FIS, 46(2), 2000, pp. 148-151
Authors:
Siqueiros, JM
Fundora, A
Cruz, MD
Amorin, H
Portelles, J
Citation: Jm. Siqueiros et al., A study of the fundamental problems in ferroelectric films, REV MEX FIS, 46, 2000, pp. 113-119
Authors:
Amorin, H
Portelles, J
Guerrero, F
Fundora, A
Martinez, E
Siqueiros, JM
Citation: H. Amorin et al., Formation of the La0.03Sr0.255Ba0.7Nb2-yTiyO6-y/2 ferroelectric ceramic system, J MATER SCI, 35(18), 2000, pp. 4607-4613
Authors:
Wang, S
Siqueiros, JM
Citation: S. Wang et Jm. Siqueiros, Influence of the sample-probe coupling on the resolution of transmitted near-field optical image, OPT LASER E, 31(6), 1999, pp. 517-527
Authors:
Siqueiros, JM
Portelles, J
Garcia, S
Xiao, M
Aguilera, S
Citation: Jm. Siqueiros et al., Study by hysteresis measurements of the influence of grain size on the dielectric properties of ceramics of the Sr0.4Ba0.60TiO3 type prepared under different sintering conditions, SOL ST COMM, 112(4), 1999, pp. 189-194
Authors:
Calderon, F
Siqueiros, JM
Portelles, J
Heiras, JL
Citation: F. Calderon et al., Diffuse phase transition in (Na,Bi)-doped PbSnxTi1-xO3 ferroelectric ceramics, SOL ST COMM, 112(4), 1999, pp. 219-221
Authors:
Siqueiros, JM
Machorro, R
Wang, S
Talavera, LE
Portelles, J
Villa, F
Citation: Jm. Siqueiros et al., Optical characterization of thin and ultrathin chromium films, REV MEX FIS, 45(6), 1999, pp. 593-596
Authors:
Portelles, J
Amorin, H
Guerrero, F
Fundora, A
Siqueiros, JM
Valenzuela, J
Hirata, G
Rosario, G
Citation: J. Portelles et al., Variation of pyroelectric and dielectric properties in Sr0.3-3y/2LayBa0.7Nb2O6 ceramics by impurification with various concentrations of La, REV MEX FIS, 45, 1999, pp. 78-80
Authors:
Cruz, MD
Siqueiros, JM
Valenzuela, J
Machorro, R
Portelles, JJ
Fundora, A
Citation: Md. Cruz et al., Characterization of Pt thin films deposited by DC sputtering at different temperatures on Ti/glass and TiO2/Si substrates, FERROELECTR, 225(1-4), 1999, pp. 1125-1131
Authors:
Portelles, J
Siqueiros, JM
Fundora, A
Rosario, G
Machorro, R
Hirata, G
Calderon, F
Citation: J. Portelles et al., Piezoelectricity and aging effects in the PMN-PT system, FERROELECTR, 224(1-4), 1999, pp. 631-638
Authors:
Amorin, H
Portelles, JJ
Guerrero, F
Siqueiros, JM
Citation: H. Amorin et al., Dielectric properties of the LSBN-SBT ceramic system, REV MEX FIS, 44, 1998, pp. 217-219
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