Authors:
Soo, YL
Kioseoglou, G
Huang, S
Kim, S
Kao, YH
Takatani, Y
Haneda, S
Munekata, H
Citation: Yl. Soo et al., Studies of impurities in magnetic semiconductors: an example of important XAFS applications, J SYNCHROTR, 8, 2001, pp. 874-876
Citation: S. Huang et al., Effects of thermal annealing on the interface morphology of CdTe/CdS heterojunctions, J VAC SCI A, 19(5), 2001, pp. 2181-2185
Authors:
Soo, YL
Huang, SW
Kao, YH
Yang, YW
Lai, LJ
Chhabra, V
Kulkami, B
Veliadis, JVD
Bhargava, RN
Citation: Yl. Soo et al., Size variation of Tb-doped Gd2O3 nanoparticles studied by X-ray excited luminescence and diffraction, MOD PHY L B, 15(6-7), 2001, pp. 205-211
Authors:
Soo, YL
Kioseoglou, G
Huang, S
Kim, S
Kao, YH
Takatani, Y
Haneda, S
Munekata, H
Citation: Yl. Soo et al., Local structure around Fe in the diluted magnetic semiconductors Ga1-xFexAs studied by x-ray absorption fine structure - art. no. 195209, PHYS REV B, 6319(19), 2001, pp. 5209
Authors:
Soo, YL
Kioseoglou, G
Kim, S
Huang, S
Kao, YH
Kuwabara, S
Owa, S
Kondo, T
Munekata, H
Citation: Yl. Soo et al., Local structure and chemical valency of Mn impurities in wide-band-gap III-V magnetic alloy semiconductors Ga1-xMnxN, APPL PHYS L, 79(24), 2001, pp. 3926-3928
Authors:
Soo, YL
Kioseoglou, G
Huang, S
Kim, S
Kao, YH
Peng, YH
Cheng, HH
Citation: Yl. Soo et al., "Inverted hut" structure of Si-Ge nanocrystals studied by extended x-ray absorption fine structure method, APPL PHYS L, 78(23), 2001, pp. 3684-3686
Authors:
Huang, S
Soo, YL
Bechmann, M
Kao, YH
Wu, X
Coutts, TJ
Dhere, R
Moutinho, HR
Citation: S. Huang et al., Interface morphology of CdS thin films grown on cadmium stannate and glasssubstrates studied by grazing incidence x-ray scattering, J VAC SCI A, 17(5), 1999, pp. 2685-2691
Authors:
Soo, YL
Huang, S
Kao, YH
Chen, JG
Hulbert, SL
Geisz, JF
Kurtz, S
Olson, JM
Kurtz, SR
Jones, ED
Allerman, AA
Citation: Yl. Soo et al., Local structures and interface morphology of InxGa1-xAs1-yNy thin films grown on GaAs, PHYS REV B, 60(19), 1999, pp. 13605-13611
Authors:
Soo, YL
Huang, S
Kao, YH
Deb, SK
Ramanathan, K
Takizawa, T
Citation: Yl. Soo et al., Migration of constituent atoms and interface morphology in a heterojunction between CdS and CuInSe2 single crystals, J APPL PHYS, 86(11), 1999, pp. 6052-6058
Authors:
Huang, S
Soo, YL
Ming, ZH
Kao, YH
Na, MH
Chang, HC
Lee, EH
Luo, H
Peck, J
Mountziaris, TJ
Citation: S. Huang et al., Studies of ZnSe-based semiconductor thin films using grazing incidence x-ray scattering and diffraction, J APPL PHYS, 85(1), 1999, pp. 237-243
Authors:
Soo, YL
Huang, SW
Kao, YH
Chhabra, V
Kulkarni, B
Veliadis, JVD
Bhargava, RN
Citation: Yl. Soo et al., Controlled agglomeration of Tb-doped Y2O3 nanocrystals studied by x-ray absorption fine structure, x-ray excited luminescence, and photoluminescence, APPL PHYS L, 75(16), 1999, pp. 2464-2466