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Results:
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Results: 18
Authors:
Sutton, AP
Todorov, TN
Cawkwell, MJ
Hoekstra, J
Citation: Ap. Sutton et al., A simple model of atomic interactions in noble metals based explicitly on electronic structure, PHIL MAG A, 81(7), 2001, pp. 1833-1848
Authors:
Yanaka, M
Henry, BM
Roberts, AP
Grovenor, CRM
Briggs, GAD
Sutton, AP
Miyamoto, T
Tsukahara, Y
Takeda, N
Chater, RJ
Citation: M. Yanaka et al., How cracks in SiOx-coated polyester films affect gas permeation, THIN SOL FI, 397(1-2), 2001, pp. 176-185
Authors:
Todorov, TN
Hoekstra, J
Sutton, AP
Citation: Tn. Todorov et al., Current-induced embrittlement of atomic wires, PHYS REV L, 86(16), 2001, pp. 3606-3609
Authors:
Burlakov, VM
Briggs, GAD
Sutton, AP
Tsukahara, Y
Citation: Vm. Burlakov et al., Monte Carlo simulation of growth of porous SiOx by vapor deposition, PHYS REV L, 86(14), 2001, pp. 3052-3055
Authors:
Castell, MR
Dudarev, SL
Muggelberg, C
Sutton, AP
Briggs, GAD
Goddard, DT
Citation: Mr. Castell et al., Microscopy of metal oxide surfaces, MICROS MICR, 6(4), 2000, pp. 324-328
Authors:
Todorov, TN
Hoekstra, J
Sutton, AP
Citation: Tn. Todorov et al., Current-induced forces in atomic-scale conductors, PHIL MAG B, 80(3), 2000, pp. 421-455
Authors:
Monzen, R
Jenkins, ML
Sutton, AP
Citation: R. Monzen et al., The bcc-to-9R martensitic transformation of Cn precipitates and the relaxation process of elastic strains in an Fe-Cu alloy, PHIL MAG A, 80(3), 2000, pp. 711-723
Authors:
Dudarev, SL
Castell, MR
Botton, GA
Savrasov, SY
Muggelberg, C
Briggs, GAD
Sutton, AP
Goddard, DT
Citation: Sl. Dudarev et al., Understanding STM images and EELS spectra of oxides with strongly correlated electrons: a comparison of nickel and uranium oxides, MICRON, 31(4), 2000, pp. 363-372
Authors:
Oleinik, II
Pettifor, DG
Sutton, AP
Butler, JE
Citation: Ii. Oleinik et al., Theoretical study of chemical reactions on CVD diamond surfaces, DIAM RELAT, 9(3-6), 2000, pp. 241-245
Authors:
Hoekstra, J
Sutton, AP
Todorov, TN
Horsfield, AP
Citation: J. Hoekstra et al., Electromigration of vacancies in copper, PHYS REV B, 62(13), 2000, pp. 8568-8571
Authors:
Walsh, TR
Wilson, M
Sutton, AP
Citation: Tr. Walsh et al., Hydrolysis of the amorphous silica surface. II. Calculation of activation barriers and mechanisms, J CHEM PHYS, 113(20), 2000, pp. 9191-9201
Authors:
Walsh, TR
Harkins, CG
Sutton, AP
Citation: Tr. Walsh et al., A theoretical study of polyimide flexibility, J CHEM PHYS, 112(9), 2000, pp. 4402-4412
Authors:
Valladares, A
Petford-Long, AK
Sutton, AP
Citation: A. Valladares et al., The core reconstruction of the 90 degrees partial dislocation in silicon, PHIL MAG L, 79(1), 1999, pp. 9-17
Authors:
Dudarev, SL
Castell, MR
Briggs, GAD
Sutton, AP
Citation: Sl. Dudarev et al., Bulk and surface electronic structure of NiO and CoO: a comparative ab initio LSDA+U analysis and application to the interpretation of STM images, PHYSICA B, 261, 1999, pp. 717-718
Authors:
Rautiainen, TT
Sutton, AP
Citation: Tt. Rautiainen et Ap. Sutton, Influence of the atomic diffusion mechanism on morphologies, kinetics, andthe mechanisms of coarsening during phase separation, PHYS REV B, 59(21), 1999, pp. 13681-13692
Authors:
Castell, MR
Dudarev, SL
Briggs, GAD
Sutton, AP
Citation: Mr. Castell et al., Unexpected differences in the surface electronic structure of NiO and CoO observed by STM and explained by first-principles theory, PHYS REV B, 59(11), 1999, pp. 7342-7345
Authors:
Battaile, CC
Srolovitz, DJ
Oleinik, II
Pettifor, DG
Sutton, AP
Harris, SJ
Butler, JE
Citation: Cc. Battaile et al., Etching effects during the chemical vapor deposition of (100) diamond, J CHEM PHYS, 111(9), 1999, pp. 4291-4299
Authors:
Kenny, SD
Nguyen-Manh, D
Fujitani, H
Sutton, AP
Citation: Sd. Kenny et al., Ab initio modelling of alumina, PHIL MAG L, 78(6), 1998, pp. 469-476
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