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Results: 1-17 |
Results: 17
SUPPLEMENT TO SIMULATION ON SEDIMENTATION OF CO2 IN DEEP-SEA
Authors: SAJI A TANII T
Citation: A. Saji et T. Tanii, SUPPLEMENT TO SIMULATION ON SEDIMENTATION OF CO2 IN DEEP-SEA, Kagaku kogaku ronbunshu, 24(4), 1998, pp. 708-710
3-DIMENSIONAL SITE DEPENDENCE OF SINGLE-ION-INDUCED CHARGE COLLECTIONAT A P-N JUNCTION-ROLE OF FUNNELING AND DIFFUSION-PROCESSES UNDER DIFFERENT ION ENERGY
Authors: MATSUKAWA T MORI S TANII T ARIMURA T KOH M IGARASHI K SUGIMOTO T OHDOMARI I
Citation: T. Matsukawa et al., 3-DIMENSIONAL SITE DEPENDENCE OF SINGLE-ION-INDUCED CHARGE COLLECTIONAT A P-N JUNCTION-ROLE OF FUNNELING AND DIFFUSION-PROCESSES UNDER DIFFERENT ION ENERGY, Journal of applied physics, 83(6), 1998, pp. 3413-3418
STUDY ON A COOL STORAGE-SYSTEM USING HCFC (HYDRO-CHLORO-FLUORO-CARBON)-141B(CCI2FCH3) (1,1-DICHLORO-1-FLUORO-ETHANE) CLATHRATE
Authors: TANII T MINEMOTO M NAKAZAWA K ANDO Y
Citation: T. Tanii et al., STUDY ON A COOL STORAGE-SYSTEM USING HCFC (HYDRO-CHLORO-FLUORO-CARBON)-141B(CCI2FCH3) (1,1-DICHLORO-1-FLUORO-ETHANE) CLATHRATE, Canadian journal of chemical engineering, 75(2), 1997, pp. 353-361
NONSCALABILITY OF ALPHA-PARTICLE-INDUCED CHARGE COLLECTION AREA
Authors: TANII T MATSUKAWA T MORI S KOH M SHIGETA B IGARASHI K OHDOMARI I
Citation: T. Tanii et al., NONSCALABILITY OF ALPHA-PARTICLE-INDUCED CHARGE COLLECTION AREA, JPN J A P 2, 35(6A), 1996, pp. 688-690
SIMULATION ON SEDIMENTATION OF CO2 IN DEE P-SEA
Authors: SAJI A NODA H TANII T KAWATA H TAKATA T SHOJI K KITAMURA H KAMATA T
Citation: A. Saji et al., SIMULATION ON SEDIMENTATION OF CO2 IN DEE P-SEA, Kagaku kogaku ronbunshu, 22(6), 1996, pp. 1273-1280
STUDY ON COOL STORAGE-SYSTEM USING HCFC ( HYDROCHLOROFLUOROCARBON)-141B (CCL2FCH3) CLATHRATE
Authors: TANII T MINEMOTO M NAKAZAWA K ANDO Y
Citation: T. Tanii et al., STUDY ON COOL STORAGE-SYSTEM USING HCFC ( HYDROCHLOROFLUOROCARBON)-141B (CCL2FCH3) CLATHRATE, Kagaku kogaku ronbunshu, 22(3), 1996, pp. 473-479
STUDY ON COOL STORAGE-SYSTEM USING CFC-11 (CCL3F) CLATHRATE
Authors: TANII T MINEMOTO M NAKAZAWA K ANDO Y
Citation: T. Tanii et al., STUDY ON COOL STORAGE-SYSTEM USING CFC-11 (CCL3F) CLATHRATE, Kagaku kogaku ronbunshu, 22(2), 1996, pp. 241-248
RADIATION IMMUNITY OF PMOSFETS AND NMOSFET EXAMINED BY MEANS OF MEV HE SINGLE-ION MICROPROBE
Authors: KOH M HORITA K SHIGETA B MATSUKAWA T KISHIDA A TANII T MORI S OHDOMARI I
Citation: M. Koh et al., RADIATION IMMUNITY OF PMOSFETS AND NMOSFET EXAMINED BY MEANS OF MEV HE SINGLE-ION MICROPROBE, Applied surface science, 104, 1996, pp. 364-368
SYNCHROTRON-RADIATION DAMAGE TEST OF INSULATING MATERIALS IN THE TRISTAN MR
Authors: MITSUI H KUMAZAWA R TANII T CHUGUN T OHSAWA Y OZAKI T TAKAYAMA K
Citation: H. Mitsui et al., SYNCHROTRON-RADIATION DAMAGE TEST OF INSULATING MATERIALS IN THE TRISTAN MR, Particle accelerators, 52(1), 1996, pp. 31-44
EVALUATION OF SOFT-ERROR HARDNESS OF DRAMS UNDER QUASI-HEAVY ION IRRADIATION USING HE SINGLE-ION MICROPROBE TECHNIQUE
Authors: MATSUKAWA T MORI S TANII T ARIMURA T KOH M IGARASHI K SUGIMOTO T OHDOMARI I
Citation: T. Matsukawa et al., EVALUATION OF SOFT-ERROR HARDNESS OF DRAMS UNDER QUASI-HEAVY ION IRRADIATION USING HE SINGLE-ION MICROPROBE TECHNIQUE, IEEE transactions on nuclear science, 43(6), 1996, pp. 2849-2855
QUANTITATIVE-ANALYSIS OF RADIATION-INDUCED SI SIO2 INTERFACE DEFECTS BY MEANS OF MEV HE SINGLE-ION IRRADIATION/
Authors: KOH M SHIGETA B IGARASHI K MATSUKAWA T TANII T MORI S OHDOMARI I
Citation: M. Koh et al., QUANTITATIVE-ANALYSIS OF RADIATION-INDUCED SI SIO2 INTERFACE DEFECTS BY MEANS OF MEV HE SINGLE-ION IRRADIATION/, Applied physics letters, 68(11), 1996, pp. 1552-1554
DISSOLUTION AND SEDIMENTATION BEHAVIOR OF CARBON-DIOXIDE CLATHRATE
Authors: SAJI A NODA H TAKAMURA Y TANII T TAKATA T KITAMURA H KAMATA T
Citation: A. Saji et al., DISSOLUTION AND SEDIMENTATION BEHAVIOR OF CARBON-DIOXIDE CLATHRATE, Energy conversion and management, 36(6-9), 1995, pp. 493-496
HNK-1 ANTIGENS AND HUMAN CYTOMEGALOVIRUS-INFECTION
Authors: OGAWAGOTO K TANII T TAKAHASHI E KUBOTA K ABE T
Citation: K. Ogawagoto et al., HNK-1 ANTIGENS AND HUMAN CYTOMEGALOVIRUS-INFECTION, Journal of neurochemistry, 65, 1995, pp. 193-193
REVERSE-MODE SINGLE-ION BEAM-INDUCED CHARGE (R-MODE SIBIC) IMAGING FOR THE TEST OF TOTAL-DOSE EFFECTS IN N-CH METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR (MOSFET)
Authors: KOH M HARA K HORITA K SHIGETA B MATSUKAWA T KISHIDA A TANII T GOTO M OHDOMARI I
Citation: M. Koh et al., REVERSE-MODE SINGLE-ION BEAM-INDUCED CHARGE (R-MODE SIBIC) IMAGING FOR THE TEST OF TOTAL-DOSE EFFECTS IN N-CH METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR (MOSFET), JPN J A P 2, 33(7A), 1994, pp. 120000962-120000965
DEVELOPMENT OF THE SINGLE-ION BEAM-INDUCED CHARGE (SIBIC) IMAGING TECHNIQUE USING THE SINGLE-ION MICROPROBE SYSTEM
Authors: KOH M HARA K HORITA K SHIGETA B MATSUKAWA T KISHIDA A TANII T GOTO M OHDOMARI I
Citation: M. Koh et al., DEVELOPMENT OF THE SINGLE-ION BEAM-INDUCED CHARGE (SIBIC) IMAGING TECHNIQUE USING THE SINGLE-ION MICROPROBE SYSTEM, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 93(1), 1994, pp. 82-86
TOTAL-DOSE DEPENDENCE OF SOFT-ERROR HARDNESS IN 64KBIT SRAMS EVALUATED BY SINGLE-ION MICROPROBE TECHNIQUE
Authors: MATSUKAWA T KISHIDA A TANII T KOH M HORITA K HARA K SHIGETA B GOTO M MATSUDA S KUBOYAMA S OHDOMARI I
Citation: T. Matsukawa et al., TOTAL-DOSE DEPENDENCE OF SOFT-ERROR HARDNESS IN 64KBIT SRAMS EVALUATED BY SINGLE-ION MICROPROBE TECHNIQUE, IEEE transactions on nuclear science, 41(6), 1994, pp. 2071-2076
STUDY ON FIXATION OF CARBON-DIOXIDE IN CL ATHRATE HYDRATE
Authors: SAJI A SAKAI M NODA H TANII T KAWATA Y KITAMURA H KAMATA T
Citation: A. Saji et al., STUDY ON FIXATION OF CARBON-DIOXIDE IN CL ATHRATE HYDRATE, Kagaku kogaku ronbunshu, 19(5), 1993, pp. 745-752
Risultati: 1-17 |