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Results: 1-16 |
Results: 16
A SCANNING-TRANSMISSION X-RAY MICROSCOPE FOR MATERIALS SCIENCE SPECTROMICROSCOPY AT THE ADVANCED LIGHT-SOURCE
Authors: WARWICK T FRANCK K KORTRIGHT JB MEIGS G MORONNE M MYNENI S ROTENBERG E SEAL S STEELE WF ADE H GARCIA A CERASARI S DELINGER J HAYAKAWA S HITCHCOCK AP TYLISZCZAK T KIKUMA J RIGHTOR EG SHIN HJ TONNER BP
Citation: T. Warwick et al., A SCANNING-TRANSMISSION X-RAY MICROSCOPE FOR MATERIALS SCIENCE SPECTROMICROSCOPY AT THE ADVANCED LIGHT-SOURCE, Review of scientific instruments, 69(8), 1998, pp. 2964-2973
EARLY STAGES OF COPPER ELECTROCRYSTALLIZATION - ELECTROCHEMICAL AND IN-SITU X-RAY-ABSORPTION FINE-STRUCTURE STUDIES OF COADSORPTION OF COPPER AND CHLORIDE AT THE AU(111) ELECTRODE SURFACE
Authors: WU S SHI Z LIPKOWSKI J HITCHCOCK AP TYLISZCZAK T
Citation: S. Wu et al., EARLY STAGES OF COPPER ELECTROCRYSTALLIZATION - ELECTROCHEMICAL AND IN-SITU X-RAY-ABSORPTION FINE-STRUCTURE STUDIES OF COADSORPTION OF COPPER AND CHLORIDE AT THE AU(111) ELECTRODE SURFACE, JOURNAL OF PHYSICAL CHEMISTRY B, 101(49), 1997, pp. 10310-10322
INNER-SHELL EXCITATION SPECTROSCOPY OF CLOSO-CARBORANES
Authors: HITCHCOCK AP URQUHART SG WEN AT KILCOYNE ALD TYLISZCZAK T RUHL E KOSUGI N BOZEK JD SPENCER JT MCILROY DN DOWBEN PA
Citation: Ap. Hitchcock et al., INNER-SHELL EXCITATION SPECTROSCOPY OF CLOSO-CARBORANES, JOURNAL OF PHYSICAL CHEMISTRY B, 101(18), 1997, pp. 3483-3493
CORE EXCITATION SPECTROSCOPY OF PHENYL-SUBSTITUTED AND METHYL-SUBSTITUTED SILANOL, DISILOXANE, AND DISILANE COMPOUNDS - EVIDENCE FOR PI-DELOCALIZATION ACROSS THE SI-C-PHENYL BOND
Authors: URQUHART SG TURCI CC TYLISZCZAK T BROOK MA HITCHCOCK AP
Citation: Sg. Urquhart et al., CORE EXCITATION SPECTROSCOPY OF PHENYL-SUBSTITUTED AND METHYL-SUBSTITUTED SILANOL, DISILOXANE, AND DISILANE COMPOUNDS - EVIDENCE FOR PI-DELOCALIZATION ACROSS THE SI-C-PHENYL BOND, Organometallics, 16(10), 1997, pp. 2080-2088
SI CORE-LEVEL EXCITATION OF HEXAMETHYLDISILANE STUDIED BY SYNCHROTRON-RADIATION AND MULTIPLE-SCATTERING X-ALPHA CALCULATION
Authors: XIONG JZ JIANG DT LIU ZF BAINES KM SHAM TK URQUHART SG WEN AT TYLISZCZAK T HITCHCOCK AP
Citation: Jz. Xiong et al., SI CORE-LEVEL EXCITATION OF HEXAMETHYLDISILANE STUDIED BY SYNCHROTRON-RADIATION AND MULTIPLE-SCATTERING X-ALPHA CALCULATION, Chemical physics, 203(1), 1996, pp. 81-92
ELECTRON-IMPACT CORE EXCITATION OF SF6 .1. S-2P, S-2S, AND F-1S SPECTROSCOPY
Authors: FRANCIS JT TURCI CC TYLISZCZAK T DESOUZA GGB KOSUGI N HITCHCOCK AP
Citation: Jt. Francis et al., ELECTRON-IMPACT CORE EXCITATION OF SF6 .1. S-2P, S-2S, AND F-1S SPECTROSCOPY, Physical review. A, 52(6), 1995, pp. 4665-4677
ELECTRON-IMPACT CORE EXCITATION OF SF6 .2. GENERALIZED OSCILLATOR-STRENGTHS IN THE S-2P REGION
Authors: TURCI CC FRANCIS JT TYLISZCZAK T DESOUZA GGB HITCHCOCK AP
Citation: Cc. Turci et al., ELECTRON-IMPACT CORE EXCITATION OF SF6 .2. GENERALIZED OSCILLATOR-STRENGTHS IN THE S-2P REGION, Physical review. A, 52(6), 1995, pp. 4678-4688
SURFACE STUDIES BY CORE-EXCITATION REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY
Authors: HITCHCOCK AP TYLISZCZAK T
Citation: Ap. Hitchcock et T. Tyliszczak, SURFACE STUDIES BY CORE-EXCITATION REFLECTION ELECTRON-ENERGY-LOSS SPECTROSCOPY, Surface review and letters, 2(1), 1995, pp. 43-61
EFFECT OF ANION ADSORPTION ON EARLY STAGES OF COPPER ELECTROCRYSTALLIZATION AT AU(111) SURFACE
Authors: WU S LIPKOWSKI J TYLISZCZAK T HITCHCOCK AP
Citation: S. Wu et al., EFFECT OF ANION ADSORPTION ON EARLY STAGES OF COPPER ELECTROCRYSTALLIZATION AT AU(111) SURFACE, Progress in Surface Science, 50(1-4), 1995, pp. 227-236
X-RAY-ABSORPTION STUDIES OF STRAIN IN EPITAXIAL (SI-GE) ATOMIC LAYER SUPERLATTICE AND ALLOY-FILMS
Authors: TYLISZCZAK T HITCHCOCK AP LU ZH BARIBEAU JM JACKMAN TE
Citation: T. Tyliszczak et al., X-RAY-ABSORPTION STUDIES OF STRAIN IN EPITAXIAL (SI-GE) ATOMIC LAYER SUPERLATTICE AND ALLOY-FILMS, Scanning microscopy, 8(4), 1994, pp. 795-802
SI 1S X-RAY-ABSORPTION SPECTRA OF EPITAXIAL SI-GE ATOMIC LAYER SUPERLATTICE AND ALLOY-FILMS
Authors: HITCHCOCK AP TYLISZCZAK T ROCCO MLM FRANCIS JT URQUHART SG FENG XH LU ZH BARIBEAU JM JACKMAN TE
Citation: Ap. Hitchcock et al., SI 1S X-RAY-ABSORPTION SPECTRA OF EPITAXIAL SI-GE ATOMIC LAYER SUPERLATTICE AND ALLOY-FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 1142-1147
POLARIZATION DEPENDENCE OF THE SIK-EDGE X-RAY-ABSORPTION SPECTRA OF SI-GE ATOMIC LAYER SUPERLATTICES
Authors: HITCHCOCK AP TYLISZCZAK T AEBI P FENG XH LU ZH BARIBEAU JM JACKMAN TE
Citation: Ap. Hitchcock et al., POLARIZATION DEPENDENCE OF THE SIK-EDGE X-RAY-ABSORPTION SPECTRA OF SI-GE ATOMIC LAYER SUPERLATTICES, Surface science, 301(1-3), 1994, pp. 260-272
SIMULTANEOUS MULTIPLE FILE EXAFS ANALYSIS - METHODOLOGY AND APPLICATION TO BURIED GE-SI INTERFACES
Authors: TYLISZCZAK T AEBI P HITCHCOCK AP JACKMAN TE BARIBEAU JM LOCKWOOD DJ
Citation: T. Tyliszczak et al., SIMULTANEOUS MULTIPLE FILE EXAFS ANALYSIS - METHODOLOGY AND APPLICATION TO BURIED GE-SI INTERFACES, JPN J A P 1, 32, 1993, pp. 134-136
INFLUENCE OF ANNEALING ON THE INTERFACE STRUCTURE AND STRAIN RELIEF IN SI GE HETEROSTRUCTURES ON (100) SI/
Authors: LOCKWOOD DJ BARIBEAU JM JACKMAN TE AEBI P TYLISZCZAK T HITCHCOCK AP HEADRICK RL
Citation: Dj. Lockwood et al., INFLUENCE OF ANNEALING ON THE INTERFACE STRUCTURE AND STRAIN RELIEF IN SI GE HETEROSTRUCTURES ON (100) SI/, Scanning microscopy, 7(2), 1993, pp. 457-471
SI K-EDGE AND GE K-EDGE X-RAY-ABSORPTION SPECTROSCOPY OF THE SI-GE INTERFACE IN [(SI)M(GE)N]P ATOMIC LAYER SUPERLATTICES
Authors: HITCHCOCK AP TYLISZCZAK T AEBI P XIONG JZ SHAM TK BAINES KM MUELLER KA FENG XH CHEN JM YANG BX LU ZH BARIBEAU JM JACKMAN TE
Citation: Ap. Hitchcock et al., SI K-EDGE AND GE K-EDGE X-RAY-ABSORPTION SPECTROSCOPY OF THE SI-GE INTERFACE IN [(SI)M(GE)N]P ATOMIC LAYER SUPERLATTICES, Surface science, 291(3), 1993, pp. 349-369
SN-K AND PB-L3 EXAFS, X-RAY-DIFFRACTION, AND SN-119 MOSSBAUER SPECTROSCOPIC STUDIES OF ORDERED BETA-PBSNF4 AND DISORDERED PB1-XSNXF2 (X = 0.3, 0.4) SOLID-SOLUTIONS AND PBSN4F10 - HIGH-PERFORMANCE FLUORIDE-ION CONDUCTORS
Authors: DENES G YU YH TYLISZCZAK T HITCHCOCK AP
Citation: G. Denes et al., SN-K AND PB-L3 EXAFS, X-RAY-DIFFRACTION, AND SN-119 MOSSBAUER SPECTROSCOPIC STUDIES OF ORDERED BETA-PBSNF4 AND DISORDERED PB1-XSNXF2 (X = 0.3, 0.4) SOLID-SOLUTIONS AND PBSN4F10 - HIGH-PERFORMANCE FLUORIDE-ION CONDUCTORS, Journal of solid state chemistry, 104(2), 1993, pp. 239-252
Risultati: 1-16 |