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Results: 1-16 |
Results: 16
Focusing hard X-ray with a single lens
Authors: Zhang, YP Katoh, T Kagoshima, Y Matui, J Tsusaka, Y
Citation: Yp. Zhang et al., Focusing hard X-ray with a single lens, JPN J A P 2, 40(1AB), 2001, pp. L75-L77
10 keV X-ray phase-contrast microscopy for observing transparent specimens
Authors: Kagoshima, Y Ibuki, T Yokoyama, Y Tsusaka, Y Matsui, J Takai, K Aino, M
Citation: Y. Kagoshima et al., 10 keV X-ray phase-contrast microscopy for observing transparent specimens, JPN J A P 2, 40(11A), 2001, pp. L1190-L1192
High resolution X-ray fluorescence measurements using a flat analyzer crystal and an X-ray CCD
Authors: Hayakawa, S Kagoshima, Y Tsusaka, Y Matsui, J Hirokawa, T
Citation: S. Hayakawa et al., High resolution X-ray fluorescence measurements using a flat analyzer crystal and an X-ray CCD, J TR MICROP, 19(4), 2001, pp. 615-621
Scanning hard X-ray microscope with tantalum phase zone plate at the Hyogo-BL (BL24XU) of SPring-8
Authors: Kagoshima, Y Takai, K Ibuki, T Yokoyama, Y Hashida, T Yokoyama, K Takeda, S Urakawa, M Miyamoto, N Tsusaka, Y Matsui, J Aino, M
Citation: Y. Kagoshima et al., Scanning hard X-ray microscope with tantalum phase zone plate at the Hyogo-BL (BL24XU) of SPring-8, NUCL INST A, 467, 2001, pp. 872-876
Rocking curve measurements of infrared LEDs using highly parallel X-ray microbeam
Authors: Takeda, S Yokoyama, K Urakawa, M Ibuki, T Takai, K Tsusaka, Y Kagoshima, Y Matsui, J Miyamoto, N
Citation: S. Takeda et al., Rocking curve measurements of infrared LEDs using highly parallel X-ray microbeam, NUCL INST A, 467, 2001, pp. 974-977
Study of local strain distribution in semiconductor devices using high-resolution X-ray microbeam diffractometry
Authors: Yokoyama, K Takeda, S Urakawa, M Tsusaka, Y Kagoshima, Y Matsui, J Kimura, S Kimura, H Kobayashi, K Ohhira, T Izumi, K Miyamoto, N
Citation: K. Yokoyama et al., Study of local strain distribution in semiconductor devices using high-resolution X-ray microbeam diffractometry, NUCL INST A, 467, 2001, pp. 1205-1208
Hyogo beamline at SPring-8: multiple station beamline with the TROIKA concept
Authors: Tsusaka, Y Yokoyama, K Takeda, S Takai, K Kagoshima, Y Matsui, J
Citation: Y. Tsusaka et al., Hyogo beamline at SPring-8: multiple station beamline with the TROIKA concept, NUCL INST A, 467, 2001, pp. 670-673
X-ray phase-contrast imaging with submicron resolution by using extremely asymmetric Bragg diffractions
Authors: Kobayashi, K Izumi, K Kimura, H Kimura, S Ibuki, T Yokoyama, Y Tsusaka, Y Kagoshima, Y Matsui, J
Citation: K. Kobayashi et al., X-ray phase-contrast imaging with submicron resolution by using extremely asymmetric Bragg diffractions, APPL PHYS L, 78(1), 2001, pp. 132-134
Formation of parallel X-ray microbeam and its application
Authors: Tsusaka, Y Yokoyama, K Takeda, S Urakawa, M Kagoshima, Y Matsui, J Kimura, S Kimura, H Kobayashi, K Izumi, K
Citation: Y. Tsusaka et al., Formation of parallel X-ray microbeam and its application, JPN J A P 2, 39(6B), 2000, pp. L635-L637
500-nm-resolution 10 keV X-ray imaging transmission microscope with tantalum phase zone plates
Authors: Kagoshima, Y Ibuki, T Takai, K Yokoyama, Y Miyamoto, N Tsusaka, Y Matsui, J
Citation: Y. Kagoshima et al., 500-nm-resolution 10 keV X-ray imaging transmission microscope with tantalum phase zone plates, JPN J A P 2, 39(5A), 2000, pp. L433-L435
In situ observation of superstructures on InP(001) surface under hydrogen atmospheric environment with using grazing incidence X-ray diffraction
Authors: Kawamura, T Watanabe, Y Utsumi, Y Uwai, K Matsui, J Kagoshima, Y Tsusaka, Y Fujikawa, S
Citation: T. Kawamura et al., In situ observation of superstructures on InP(001) surface under hydrogen atmospheric environment with using grazing incidence X-ray diffraction, J CRYST GR, 221, 2000, pp. 106-110
High-resolution microbeam x-ray diffractometry applied to InGaAsP/InP layers grown by narrow-stripe selective metal-organic vapor phase epitaxy
Authors: Kimura, S Kimura, H Kobayashi, K Oohira, T Izumi, K Sakata, Y Tsusaka, Y Yokoyama, K Takeda, S Urakawa, M Kagoshima, Y Matsui, J
Citation: S. Kimura et al., High-resolution microbeam x-ray diffractometry applied to InGaAsP/InP layers grown by narrow-stripe selective metal-organic vapor phase epitaxy, APPL PHYS L, 77(9), 2000, pp. 1286-1288
Reconstruction of an InP(001) surface grown by metalorganic vapor phase epitaxy in atmospheric hydrogen environment
Authors: Kawamura, T Watanabe, Y Utsumi, Y Uwai, K Matsui, J Kagoshima, Y Tsusaka, Y Fujikawa, S
Citation: T. Kawamura et al., Reconstruction of an InP(001) surface grown by metalorganic vapor phase epitaxy in atmospheric hydrogen environment, APPL PHYS L, 77(7), 2000, pp. 996-998
Characterization of diamond single crystals for synchrotron radiation monochromators
Authors: Tsusaka, Y Takeda, S Takai, K Yokoyama, K Kagoshima, Y Matsui, J Sato, S Toda, N Kimura, S
Citation: Y. Tsusaka et al., Characterization of diamond single crystals for synchrotron radiation monochromators, JPN J A P 1, 38, 1999, pp. 616-619
Phase-contrast X-ray imaging using bath vertically and horizontally expanded synchrotron radiation X-rays with asymmetric Bragg reflection
Authors: Kagoshima, Y Tsusaka, Y Yokoyama, K Takai, K Takeda, S Matsui, J
Citation: Y. Kagoshima et al., Phase-contrast X-ray imaging using bath vertically and horizontally expanded synchrotron radiation X-rays with asymmetric Bragg reflection, JPN J A P 2, 38(4B), 1999, pp. L470-L472
Construction of the multilayered-mirror monochromator beam line for the study of synchrotron radiation stimulated process
Authors: Mekaru, H Tsusaka, Y Miyamae, T Kinoshita, T Urisu, T Masui, S Toyota, E Takenaka, H
Citation: H. Mekaru et al., Construction of the multilayered-mirror monochromator beam line for the study of synchrotron radiation stimulated process, REV SCI INS, 70(6), 1999, pp. 2601-2605
Risultati: 1-16 |