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Results: 1-18 |
Results: 18
Noise measurements and fluctuation analysis in nanoparticle films
Authors: Kish, LB Otten, F Vandamme, LKJ Vajtai, R Granqvist, CG Marlow, B Kruis, E Fissan, H Ederth, J Chaoguang, P
Citation: Lb. Kish et al., Noise measurements and fluctuation analysis in nanoparticle films, PHYSICA E, 11(2-3), 2001, pp. 131-136
Current crowding and 1/f noise in polycrystalline silicon thin film transistors
Authors: Mercha, A Vandamme, LKJ Pichon, L Carin, R Bonnaud, O
Citation: A. Mercha et al., Current crowding and 1/f noise in polycrystalline silicon thin film transistors, J APPL PHYS, 90(8), 2001, pp. 4019-4026
Comment on 'Comparison of excess 1/f noise spectra in trimmed and untrimmed thick film resistors'
Authors: Mercha, A Feyaerts, R Vandamme, LKJ
Citation: A. Mercha et al., Comment on 'Comparison of excess 1/f noise spectra in trimmed and untrimmed thick film resistors', INT J ELECT, 88(3), 2001, pp. 315-319
Low frequency gate noise in a diode-connected MESFET: measurements and modeling
Authors: Lambert, B Malbert, N Verdier, F Labat, N Touboul, A Vandamme, LKJ
Citation: B. Lambert et al., Low frequency gate noise in a diode-connected MESFET: measurements and modeling, IEEE DEVICE, 48(4), 2001, pp. 628-633
Current crowding and its effect on 1/f noise and third harmonic distortion- a case study for quality assessment of resistors
Authors: Vandamme, EP Vandamme, LKJ
Citation: Ep. Vandamme et Lkj. Vandamme, Current crowding and its effect on 1/f noise and third harmonic distortion- a case study for quality assessment of resistors, MICROEL REL, 40(11), 2000, pp. 1847-1853
The influence of a digital spectrum analyzer on the uncertainty in 1/f noise parameters
Authors: Briaire, J Vandamme, LKJ
Citation: J. Briaire et Lkj. Vandamme, The influence of a digital spectrum analyzer on the uncertainty in 1/f noise parameters, MICROEL REL, 40(11), 2000, pp. 1975-1980
Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors
Authors: Bruce, S Vandamme, LKJ Rydberg, A
Citation: S. Bruce et al., Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors, IEEE DEVICE, 47(9), 2000, pp. 1772-1773
Temperature dependence and electrical properties of dominant low-frequencynoise source in SiGeHBT
Authors: Bruce, S Vandamme, LKJ Rydberg, A
Citation: S. Bruce et al., Temperature dependence and electrical properties of dominant low-frequencynoise source in SiGeHBT, IEEE DEVICE, 47(5), 2000, pp. 1107-1112
Critical discussion on unified 1/f noise models for MOSFETs
Authors: Vandamme, EP Vandamme, LKJ
Citation: Ep. Vandamme et Lkj. Vandamme, Critical discussion on unified 1/f noise models for MOSFETs, IEEE DEVICE, 47(11), 2000, pp. 2146-2152
Charge diffusion noise in monocrystalline PbS nanoparticle films
Authors: Otten, F Kish, LB Granqvist, CG Vandamme, LKJ Vajtai, R Kruis, FE Fissan, H
Citation: F. Otten et al., Charge diffusion noise in monocrystalline PbS nanoparticle films, APPL PHYS L, 77(21), 2000, pp. 3421-3422
1/f noise as a diagnostic tool to investigate the quality of isotropic conductive adhesive bonds
Authors: Vandamme, LKJ Perichaud, MG Noguera, E Danto, Y Behner, U
Citation: Lkj. Vandamme et al., 1/f noise as a diagnostic tool to investigate the quality of isotropic conductive adhesive bonds, IEEE T COMP, 22(3), 1999, pp. 446-454
Anomalous behaviour of the current noise in long-narrow-channel MOSFETS and its interpretation
Authors: Vandamme, LKJ Kiss, LB Stoelinga, OLJ
Citation: Lkj. Vandamme et al., Anomalous behaviour of the current noise in long-narrow-channel MOSFETS and its interpretation, SOL ST ELEC, 43(4), 1999, pp. 697-700
Comments on "Variation of the exponent of flicker noise in MOSFETs"
Authors: Jones, BK Kiss, LB Vandamme, LKJ
Citation: Bk. Jones et al., Comments on "Variation of the exponent of flicker noise in MOSFETs", SOL ST ELEC, 43(4), 1999, pp. 815-817
Comments on "Normal and anomalous behaviour of the RTS noise amplitude in forward biased in InGaAs/InP photodiodes"
Authors: Vandamme, LKJ
Citation: Lkj. Vandamme, Comments on "Normal and anomalous behaviour of the RTS noise amplitude in forward biased in InGaAs/InP photodiodes", SOL ST ELEC, 43(3), 1999, pp. 691-692
Effects of RF life-test on LF electrical parameters of GaAs power MESFETs
Authors: Saysset-Malbert, N Lambert, B Maneux, C Labat, N Touboul, A Danto, Y Vandamme, LKJ Huguet, P Auxemery, P Garat, F
Citation: N. Saysset-malbert et al., Effects of RF life-test on LF electrical parameters of GaAs power MESFETs, MICROEL REL, 39(6-7), 1999, pp. 1061-1066
1/f Noise in conductive adhesive bonds under mechanical stress as a sensitive and fast diagnostic tool for reliability assessment
Authors: Vandamme, LKJ Perichaud, MG Noguera, E Danto, Y Behner, U
Citation: Lkj. Vandamme et al., 1/f Noise in conductive adhesive bonds under mechanical stress as a sensitive and fast diagnostic tool for reliability assessment, MICROEL REL, 39(6-7), 1999, pp. 1089-1094
Automated system for noise-measurements on low-ohmic samples and magnetic sensors
Authors: Jonker, RJW Briaire, J Vandamme, LKJ
Citation: Rjw. Jonker et al., Automated system for noise-measurements on low-ohmic samples and magnetic sensors, IEEE INSTR, 48(3), 1999, pp. 730-735
Measurement of low-frequency base and collector current noise and coherence in SiGe heterojunction bipolar transistors using transimpedance amplifiers
Authors: Bruce, SPO Vandamme, LKJ Rydberg, A
Citation: Spo. Bruce et al., Measurement of low-frequency base and collector current noise and coherence in SiGe heterojunction bipolar transistors using transimpedance amplifiers, IEEE DEVICE, 46(5), 1999, pp. 993-1000
Risultati: 1-18 |