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Results: 1-11 |
Results: 11
Low driving voltages and memory effect in organic thin-film transistors with a ferroelectric gate insulator
Authors: Velu, G Legrand, C Tharaud, O Chapoton, A Remiens, D Horowitz, G
Citation: G. Velu et al., Low driving voltages and memory effect in organic thin-film transistors with a ferroelectric gate insulator, APPL PHYS L, 79(5), 2001, pp. 659-661
In situ deposition of sputtered PZT films: control of the growth temperature by the sputtered lead flux
Authors: Velu, G Remiens, D
Citation: G. Velu et D. Remiens, In situ deposition of sputtered PZT films: control of the growth temperature by the sputtered lead flux, VACUUM, 56(3), 2000, pp. 199-204
Growth and properties of PbTiO3/Pb(Zr, Ti)O-3 heterostructures deposited by sputtering on Si substrates
Authors: Velu, G Haccart, T Remiens, D
Citation: G. Velu et al., Growth and properties of PbTiO3/Pb(Zr, Ti)O-3 heterostructures deposited by sputtering on Si substrates, INTEGR FERR, 23(1-4), 1999, pp. 1-14
Electrical properties of sputtered PZT films on stabilized platinum electrode
Authors: Velu, G Remiens, D
Citation: G. Velu et D. Remiens, Electrical properties of sputtered PZT films on stabilized platinum electrode, J EUR CERAM, 19(11), 1999, pp. 2005-2013
Piezoelectric properties of PZT films for microcantilever
Authors: Cattan, E Haccart, T Velu, G Remiens, D Bergaud, C Nicu, L
Citation: E. Cattan et al., Piezoelectric properties of PZT films for microcantilever, SENS ACTU-A, 74(1-3), 1999, pp. 60-64
Dielectric and ferroelectric properties of Perovskite Pb(Zr, Ti)O-3 films deposited by sputtering on Si substrate
Authors: Velu, G Remiens, G
Citation: G. Velu et G. Remiens, Dielectric and ferroelectric properties of Perovskite Pb(Zr, Ti)O-3 films deposited by sputtering on Si substrate, MICROEL REL, 39(2), 1999, pp. 241-250
Dielectric characterization of ferroelectric thin films deposited on silicon
Authors: Legrand, C Haccart, T Velu, G Chambonnet, D Remiens, D Burgnies, L Mehri, F Carru, JC
Citation: C. Legrand et al., Dielectric characterization of ferroelectric thin films deposited on silicon, MICROEL REL, 39(2), 1999, pp. 251-256
The characterisation of PZT films of differing orientations for MEMS applications
Authors: Jenkins, DFL Clegg, WW Velu, G Cattan, E Remiens, D
Citation: Dfl. Jenkins et al., The characterisation of PZT films of differing orientations for MEMS applications, FERROELECTR, 224(1-4), 1999, pp. 687-694
Remanent piezoelectric constant of PZT thin films
Authors: Cattan, E Manceau, JF Haccart, T Biwersi, S Velu, G Remiens, D Bastien, F
Citation: E. Cattan et al., Remanent piezoelectric constant of PZT thin films, FERROELECTR, 224(1-4), 1999, pp. 735-742
Effect of poling treatment on e(31) piezoelectric constant of sputtered PZT thin films
Authors: Cattan, E Mollier, A Velu, G Remiens, D
Citation: E. Cattan et al., Effect of poling treatment on e(31) piezoelectric constant of sputtered PZT thin films, J PHYS IV, 8(P9), 1998, pp. 229-232
Influence of PbTiO3 buffer layer on structural and electrical properties of Pb(Zr,Ti)O-3 films produced by sputter deposition technique
Authors: Velu, G Jaber, B Haccart, T Remiens, D
Citation: G. Velu et al., Influence of PbTiO3 buffer layer on structural and electrical properties of Pb(Zr,Ti)O-3 films produced by sputter deposition technique, J PHYS IV, 8(P9), 1998, pp. 243-246
Risultati: 1-11 |