Citation: Ba. Mccormick et al., Bronchopleural fistula complicating group A beta-haemolytic streptococcal pneumonia. Use of a Fogarty embolectomy catheter for selective bronchial blockade, INTEN CAR M, 25(5), 1999, pp. 535-537
Authors:
Ding, XZ
Zhang, FM
Liu, XH
Wang, PW
Durrer, WG
Cheung, WY
Wong, SP
Wilson, IH
Citation: Xz. Ding et al., Ion beam assisted deposition of diamond-like nanocomposite films in an acetylene atmosphere, THIN SOL FI, 346(1-2), 1999, pp. 82-85
Authors:
Xie, Z
Luo, EZ
Peng, HB
Zhao, BR
Hu, GD
Wilson, IH
Xu, JB
Zhao, LH
Citation: Z. Xie et al., Studies of leakage current inhomogeneity of Pb(Zr, Ti)O-3/YBa2Cu3Ox heterostructures on a nanometer scale, J NON-CRYST, 254, 1999, pp. 112-117
Authors:
Four, S
Devine, RAB
Luo, EZ
Wilson, IH
Cheng, HS
Citation: S. Four et al., Properties of tantalum pentoxide (Ta2O5) obtained by plasma assisted deposition using a TaF5 source, J NON-CRYST, 254, 1999, pp. 139-145
Authors:
Gritsenko, VA
Svitasheva, SN
Petrenko, IP
Wong, H
Xu, JB
Wilson, IH
Citation: Va. Gritsenko et al., Study of excess silicon at Si3N4 thermal SiO2 interface using ellipsometric measurements, J ELCHEM SO, 146(2), 1999, pp. 780-785
Authors:
Hu, GD
Wilson, IH
Xu, JB
Cheung, WY
Wong, SP
Wong, HK
Citation: Gd. Hu et al., Structure control and characterization of SrBi2Ta2O9 thin films by a modified annealing method (vol 74, pg 1221, 1999), APPL PHYS L, 75(14), 1999, pp. 2151-2151
Citation: Gd. Hu et al., Domain imaging and local piezoelectric properties of the (200)-predominantSrBi2Ta2O9 thin film, APPL PHYS L, 75(11), 1999, pp. 1610-1612
Authors:
Hu, GD
Wilson, IH
Xu, JB
Cheung, WY
Wong, SP
Wong, HK
Citation: Gd. Hu et al., Structure control and characterization of SrBi2Ta2O9 thin films by a modified annealing method, APPL PHYS L, 74(9), 1999, pp. 1221-1223
Authors:
Hu, GD
Xu, JB
Wilson, IH
Cheung, WY
Ke, N
Wong, SP
Citation: Gd. Hu et al., Effects of a Bi4Ti3O12 buffer layer on SrBi2Ta2O9 thin films prepared by the metalorganic decomposition, APPL PHYS L, 74(24), 1999, pp. 3711-3713
Citation: Yj. Chen et al., An STM and atomic force microscopy study of the effects of 1.8 MeV electron bombardment on the surface of graphite, J MATER SCI, 33(18), 1998, pp. 4657-4663