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Results: 1-8 |
Results: 8
ON TRANSIENT MARKOV-PROCESSES OF ORNSTEIN-UHLENBECK TYPE
Authors: YAMAMURO K
Citation: K. Yamamuro, ON TRANSIENT MARKOV-PROCESSES OF ORNSTEIN-UHLENBECK TYPE, Nagoya Mathematical Journal, 149, 1998, pp. 19-32
ADVANCED ECLIPSE PULSED-LASER DEPOSITION METHOD FOR GROWTH OF PEROVSKITE CRYSTALS AND RELATIVES
Authors: MORITA E YAMAMURO K TACHIKI M KOBAYASHI T
Citation: E. Morita et al., ADVANCED ECLIPSE PULSED-LASER DEPOSITION METHOD FOR GROWTH OF PEROVSKITE CRYSTALS AND RELATIVES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 121(1-4), 1997, pp. 412-414
OPTICAL CHARACTERIZATION OF SRM-3BI4TIMO3M-FILMS GROWN BY PULSED-LASER DEPOSITION METHOD(3 (M=4, 5, 6) THIN)
Authors: TACHIKI M YAMAMURO K KOBAYASHI T
Citation: M. Tachiki et al., OPTICAL CHARACTERIZATION OF SRM-3BI4TIMO3M-FILMS GROWN BY PULSED-LASER DEPOSITION METHOD(3 (M=4, 5, 6) THIN), JPN J A P 2, 35(6A), 1996, pp. 719-721
THIN-FILM GROWTH OF SRBITIO SYSTEM BY PLD METHOD AND OPTICAL CHARACTERIZATION
Authors: TACHIKI M YAMAMURO K KOBAYASHI T
Citation: M. Tachiki et al., THIN-FILM GROWTH OF SRBITIO SYSTEM BY PLD METHOD AND OPTICAL CHARACTERIZATION, Materials science & engineering. B, Solid-state materials for advanced technology, 41(1), 1996, pp. 131-133
PT SRBI4TI4O15/SI-MOS SYSTEM - PRELIMINARY-STUDY EMPLOYING AN INVERTED MOS CONFIGURATION/
Authors: YAMAMURO K TACHIKI M KOBAYASHI T
Citation: K. Yamamuro et al., PT SRBI4TI4O15/SI-MOS SYSTEM - PRELIMINARY-STUDY EMPLOYING AN INVERTED MOS CONFIGURATION/, Materials science & engineering. B, Solid-state materials for advanced technology, 41(1), 1996, pp. 174-177
MULTIDIMENSIONAL PROCESS OF ORNSTEIN-UHLENBECK TYPE WITH NONDIAGONALIZABLE MATRIX IN LINEAR DRIFT TERMS
Authors: SATO K WATANABE T YAMAMURO K YAMAZATO M
Citation: K. Sato et al., MULTIDIMENSIONAL PROCESS OF ORNSTEIN-UHLENBECK TYPE WITH NONDIAGONALIZABLE MATRIX IN LINEAR DRIFT TERMS, Nagoya Mathematical Journal, 141, 1996, pp. 45-78
DEVELOPMENT OF A SCANNING REFLECTION ELECTRON-MICROSCOPE FOR INSITU OBSERVATION OF CRYSTAL-GROWTH
Authors: FUWA K YAMAMURO K YANAGIDA H SHIMIZU S
Citation: K. Fuwa et al., DEVELOPMENT OF A SCANNING REFLECTION ELECTRON-MICROSCOPE FOR INSITU OBSERVATION OF CRYSTAL-GROWTH, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 328(3), 1993, pp. 592-595
INSITU OBSERVATION OF THE GROWTH-PROCESS OF THE INAS-GAAS HETEROEPITAXIAL SYSTEM USING SCANNING MICROPROBE REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION TOTAL-REFLECTION ANGLE X-RAY SPECTROSCOPY
Authors: SHIMIZU S YAMAMURO K FUWA K YANAGIDA H YAMAKAWA H INO S
Citation: S. Shimizu et al., INSITU OBSERVATION OF THE GROWTH-PROCESS OF THE INAS-GAAS HETEROEPITAXIAL SYSTEM USING SCANNING MICROPROBE REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION TOTAL-REFLECTION ANGLE X-RAY SPECTROSCOPY, Thin solid films, 228(1-2), 1993, pp. 18-22
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