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Results: 1-25 | 26-33
Results: 1-25/33
ONLINE TESTING FOR VLSI - A COMPENDIUM OF APPROACHES
Authors: NICOLAIDIS M ZORIAN Y
Citation: M. Nicolaidis et Y. Zorian, ONLINE TESTING FOR VLSI - A COMPENDIUM OF APPROACHES, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 12(1-2), 1998, pp. 7-20
EFFICIENT TOTALLY SELF-CHECKING SHIFTER DESIGN
Authors: DUARTE RO NICOLAIDIS M BEDERR H ZORIAN Y
Citation: Ro. Duarte et al., EFFICIENT TOTALLY SELF-CHECKING SHIFTER DESIGN, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 12(1-2), 1998, pp. 29-39
CHALLENGES AND OPTIONS
Authors: ZORIAN Y
Citation: Y. Zorian, CHALLENGES AND OPTIONS, IEEE design & test of computers, 15(4), 1998, pp. 3-3
ONCE AGAIN, A SUPER ISSUE - EIC MESSAGE
Authors: ZORIAN Y
Citation: Y. Zorian, ONCE AGAIN, A SUPER ISSUE - EIC MESSAGE, IEEE design & test of computers, 15(3), 1998, pp. 3-3
EFFECTIVE BUILT-IN SELF-TEST FOR BOOTH MULTIPLIERS
Authors: GIZOPOULOS D PASCHALIS A ZORIAN Y
Citation: D. Gizopoulos et al., EFFECTIVE BUILT-IN SELF-TEST FOR BOOTH MULTIPLIERS, IEEE design & test of computers, 15(3), 1998, pp. 105-111
OUR NEW-WORLD
Authors: ZORIAN Y
Citation: Y. Zorian, OUR NEW-WORLD, IEEE design & test of computers, 15(2), 1998, pp. 1-1
ITC-97 PANEL SESSIONS, PART 2
Authors: BHAVSAR D ZORIAN Y
Citation: D. Bhavsar et Y. Zorian, ITC-97 PANEL SESSIONS, PART 2, IEEE design & test of computers, 15(2), 1998, pp. 5-6
A D-AND-T ROUNDTABLE - TESTING MIXED LOGIC AND DRAM CHIPS
Authors: AMERIAN MR ATWELL WD BURGESS I FLEEMAN GD LEPEJIAN DY ZARRINFAR F ZORIAN Y
Citation: Mr. Amerian et al., A D-AND-T ROUNDTABLE - TESTING MIXED LOGIC AND DRAM CHIPS, IEEE design & test of computers, 15(2), 1998, pp. 86-92
D-AND-T - 15TH YEAR IN-SERVICE
Authors: ZORIAN Y
Citation: Y. Zorian, D-AND-T - 15TH YEAR IN-SERVICE, IEEE design & test of computers, 15(1), 1998, pp. 1-1
ITC-97 PANEL SESSIONS
Authors: BHAVSAR D ZORIAN Y
Citation: D. Bhavsar et Y. Zorian, ITC-97 PANEL SESSIONS, IEEE design & test of computers, 15(1), 1998, pp. 7
TESTING THE INTERCONNECT OF RAM-BASED FPGAS
Authors: RENOVELL M PORTAL JM FIGUERAS J ZORIAN Y
Citation: M. Renovell et al., TESTING THE INTERCONNECT OF RAM-BASED FPGAS, IEEE design & test of computers, 15(1), 1998, pp. 45-50
SPECIAL ISSUE ON MULTICHIP-MODULE TESTING AND DESIGN FOR TESTABILITY
Authors: ZORIAN Y
Citation: Y. Zorian, SPECIAL ISSUE ON MULTICHIP-MODULE TESTING AND DESIGN FOR TESTABILITY, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 10(1-2), 1997, pp. 6-6
FUNDAMENTALS OF MCM TESTING AND DESIGN-FOR-TESTABILITY
Authors: ZORIAN Y
Citation: Y. Zorian, FUNDAMENTALS OF MCM TESTING AND DESIGN-FOR-TESTABILITY, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 10(1-2), 1997, pp. 7-14
AN EFFECTIVE MULTICHIP BIST SCHEME
Authors: ZORIAN Y BEDERR H
Citation: Y. Zorian et H. Bederr, AN EFFECTIVE MULTICHIP BIST SCHEME, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 10(1-2), 1997, pp. 87-95
GUEST EDITORS INTRODUCTION - DESIGN AND TEST OF CORE-BASED SYSTEMS ONCHIPS
Authors: ZORIAN Y GUPTA RK
Citation: Y. Zorian et Rk. Gupta, GUEST EDITORS INTRODUCTION - DESIGN AND TEST OF CORE-BASED SYSTEMS ONCHIPS, IEEE design & test of computers, 14(4), 1997, pp. 14-14
INTRODUCING CORE-BASED SYSTEM-DESIGN
Authors: GUPTA R ZORIAN Y
Citation: R. Gupta et Y. Zorian, INTRODUCING CORE-BASED SYSTEM-DESIGN, IEEE design & test of computers, 14(4), 1997, pp. 15-25
ABOUT THIS SUPER ISSUE
Authors: WAGNER K ZORIAN Y
Citation: K. Wagner et Y. Zorian, ABOUT THIS SUPER ISSUE, IEEE design & test of computers, 14(3), 1997, pp. 1-1
TESTING EMBEDDED CORES
Authors: ANDERSON TL CHANDRAMOULI R DEY S HEMMADY S MALLIPEDDI C RAJSUMAN R WALTHER R ZORIAN Y
Citation: Tl. Anderson et al., TESTING EMBEDDED CORES, IEEE design & test of computers, 14(2), 1997, pp. 81-89
KEEPING IN TOUCH
Authors: WAGNER K ZORIAN Y
Citation: K. Wagner et Y. Zorian, KEEPING IN TOUCH, IEEE design & test of computers, 14(1), 1997, pp. 4-5
3RD INTERNATIONAL TEST SYNTHESIS WORKSHOP - CORE TESTING
Authors: ZORIAN Y ANDERSON T
Citation: Y. Zorian et T. Anderson, 3RD INTERNATIONAL TEST SYNTHESIS WORKSHOP - CORE TESTING, IEEE design & test of computers, 13(3), 1996, pp. 6
EUROPEAN TEST WORKSHOP
Authors: ZORIAN Y
Citation: Y. Zorian, EUROPEAN TEST WORKSHOP, IEEE design & test of computers, 13(3), 1996, pp. 8-8
A D-AND-T ROUND-TABLE - DEEP-SUBMICRON TEST IN COOPERATION WITH THE TEST TECHNOLOGY TECHNICAL COMMITTEE
Authors: ZORIAN Y BUTLER KM MALY W KOENEMANN BK NEEDHAM W AITKEN RC CAMPBELL RL
Citation: Y. Zorian et al., A D-AND-T ROUND-TABLE - DEEP-SUBMICRON TEST IN COOPERATION WITH THE TEST TECHNOLOGY TECHNICAL COMMITTEE, IEEE design & test of computers, 13(3), 1996, pp. 102-108
UNTITLED
Authors: WAGNER KD ZORIAN Y
Citation: Kd. Wagner et Y. Zorian, UNTITLED, IEEE design & test of computers, 13(2), 1996, pp. 2-2
EAST MEETS WEST
Authors: ZORIAN Y HLAVICKA J
Citation: Y. Zorian et J. Hlavicka, EAST MEETS WEST, IEEE design & test of computers, 13(1), 1996, pp. 5-7
PROGRAMMABLE BIST SPACE COMPACTORS
Authors: IVANOV A TSUJI BK ZORIAN Y
Citation: A. Ivanov et al., PROGRAMMABLE BIST SPACE COMPACTORS, I.E.E.E. transactions on computers, 45(12), 1996, pp. 1393-1404
Risultati: 1-25 | 26-33