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Results: 1-22 |
Results: 22
QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION
Authors: ZUO JM
Citation: Jm. Zuo, QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION, Materials transactions, JIM, 39(9), 1998, pp. 938-946
AB-INITIO LDA CALCULATIONS OF THE MEAN COULOMB POTENTIAL V-0 IN SLABSOF CRYSTALLINE SI, GE AND MGO
Authors: KIM MY ZUO JM SPENCE JCH
Citation: My. Kim et al., AB-INITIO LDA CALCULATIONS OF THE MEAN COULOMB POTENTIAL V-0 IN SLABSOF CRYSTALLINE SI, GE AND MGO, Physica status solidi. a, Applied research, 166(1), 1998, pp. 445-451
A NEW APPROACH TO LATTICE-PARAMETER MEASUREMENTS USING DYNAMIC ELECTRON-DIFFRACTION AND PATTERN-MATCHING
Authors: ZUO JM KIM M HOLMESTAD R
Citation: Jm. Zuo et al., A NEW APPROACH TO LATTICE-PARAMETER MEASUREMENTS USING DYNAMIC ELECTRON-DIFFRACTION AND PATTERN-MATCHING, Journal of Electron Microscopy, 47(2), 1998, pp. 121-127
APPLICATION OF THE CONVERGENT-BEAM IMAGING (CBIM) TECHNIQUE TO THE ANALYSIS OF CRYSTAL DEFECTS
Authors: MORNIROLI JP CORDIER P VANCAPPELLEN E ZUO JM SPENCE J
Citation: Jp. Morniroli et al., APPLICATION OF THE CONVERGENT-BEAM IMAGING (CBIM) TECHNIQUE TO THE ANALYSIS OF CRYSTAL DEFECTS, Microscopy microanalysis microstructures, 8(3), 1997, pp. 187-202
ACCURATE MEASUREMENTS OF CRYSTAL-STRUCTURE FACTORS USING A FEG ELECTRON-MICROSCOPE
Authors: REN G ZUO JM PENG LM
Citation: G. Ren et al., ACCURATE MEASUREMENTS OF CRYSTAL-STRUCTURE FACTORS USING A FEG ELECTRON-MICROSCOPE, Micron, 28(6), 1997, pp. 459-467
THE THEORETICAL CHARGE-DENSITY OF SILICON - EXPERIMENTAL TESTING OF EXCHANGE AND CORRELATION POTENTIALS
Authors: ZUO JM BLAHA P SCHWARZ K
Citation: Jm. Zuo et al., THE THEORETICAL CHARGE-DENSITY OF SILICON - EXPERIMENTAL TESTING OF EXCHANGE AND CORRELATION POTENTIALS, Journal of physics. Condensed matter, 9(36), 1997, pp. 7541-7561
DOES ELECTRON HOLOGRAPHY ENERGY-FILTER
Authors: SPENCE JCH ZUO JM
Citation: Jch. Spence et Jm. Zuo, DOES ELECTRON HOLOGRAPHY ENERGY-FILTER, Ultramicroscopy, 69(3), 1997, pp. 185-190
LOW-ENERGY POINT REFLECTION ELECTRON-MICROSCOPY
Authors: SPENCE JCH ZHANG X WEIERSTALL U ZUO JM MUNRO E ROUSE J
Citation: Jch. Spence et al., LOW-ENERGY POINT REFLECTION ELECTRON-MICROSCOPY, Surface review and letters, 4(3), 1997, pp. 577-587
CHARGE-DENSITY OF MGO - IMPLICATIONS OF PRECISE NEW MEASUREMENTS FOR THEORY
Authors: ZUO JM OKEEFFE M REZ P SPENCE JCH
Citation: Jm. Zuo et al., CHARGE-DENSITY OF MGO - IMPLICATIONS OF PRECISE NEW MEASUREMENTS FOR THEORY, Physical review letters, 78(25), 1997, pp. 4777-4780
ELECTRON DETECTION CHARACTERISTICS OF SLOW-SCAN CCD CAMERA
Authors: ZUO JM
Citation: Jm. Zuo, ELECTRON DETECTION CHARACTERISTICS OF SLOW-SCAN CCD CAMERA, Ultramicroscopy, 66(1-2), 1996, pp. 21-33
PERFORMANCE OF IMAGING PLATES FOR ELECTRON RECORDING
Authors: ZUO JM MCCARTNEY MR SPENCE JCH
Citation: Jm. Zuo et al., PERFORMANCE OF IMAGING PLATES FOR ELECTRON RECORDING, Ultramicroscopy, 66(1-2), 1996, pp. 35-47
SHORT-RANGE ORDERED STRUCTURE OF GA0.47IN0.53AS STUDIED BY ENERGY-FILTERED ELECTRON-DIFFRACTION AND HREM
Authors: SHINDO D GOMYO A ZUO JM SPENCE JCH
Citation: D. Shindo et al., SHORT-RANGE ORDERED STRUCTURE OF GA0.47IN0.53AS STUDIED BY ENERGY-FILTERED ELECTRON-DIFFRACTION AND HREM, Journal of Electron Microscopy, 45(1), 1996, pp. 99-104
ON THE BEAM SELECTION AND CONVERGENCE IN THE BLOCH-WAVE METHOD
Authors: ZUO JM WEICKENMEIER AL
Citation: Jm. Zuo et Al. Weickenmeier, ON THE BEAM SELECTION AND CONVERGENCE IN THE BLOCH-WAVE METHOD, Ultramicroscopy, 57(4), 1995, pp. 375-383
DIRECT RETRIEVAL OF CRYSTAL-STRUCTURE FACTORS IN THEED
Authors: PENG LM ZUO JM
Citation: Lm. Peng et Jm. Zuo, DIRECT RETRIEVAL OF CRYSTAL-STRUCTURE FACTORS IN THEED, Ultramicroscopy, 57(1), 1995, pp. 1-9
EFFECT OF MN DOPING ON CHARGE-DENSITY IN GAMMA-TIAL BY QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION
Authors: HOLMESTAD R ZUO JM SPENCE JCH HOIER R HORITA Z
Citation: R. Holmestad et al., EFFECT OF MN DOPING ON CHARGE-DENSITY IN GAMMA-TIAL BY QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 72(3), 1995, pp. 579-601
GRAIN-BOUNDARY CONSTRAINT AND OXYGEN DEFICIENCY IN YBA2CU3O7-DELTA - APPLICATION OF THE COINCIDENCE SITE LATTICE MODEL TO A NONCUBIC SYSTEM
Authors: ZHU YM ZUO JM MOODENBAUGH AR SUENAGA M
Citation: Ym. Zhu et al., GRAIN-BOUNDARY CONSTRAINT AND OXYGEN DEFICIENCY IN YBA2CU3O7-DELTA - APPLICATION OF THE COINCIDENCE SITE LATTICE MODEL TO A NONCUBIC SYSTEM, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 70(6), 1994, pp. 969-984
ON THE MINIMUM NUMBER OF BEAMS NEEDED TO DISTINGUISH ENANTIOMORPHS INX-RAY AND ELECTRON-DIFFRACTION
Authors: SPENCE JCH ZUO JM OKEEFFE M MARTHINSEN K HOIER R
Citation: Jch. Spence et al., ON THE MINIMUM NUMBER OF BEAMS NEEDED TO DISTINGUISH ENANTIOMORPHS INX-RAY AND ELECTRON-DIFFRACTION, Acta crystallographica. Section A, Foundations of crystallography, 50, 1994, pp. 647-650
NEW METHOD OF BRAVAIS LATTICE DETERMINATION
Authors: ZUO JM
Citation: Jm. Zuo, NEW METHOD OF BRAVAIS LATTICE DETERMINATION, Ultramicroscopy, 52(3-4), 1993, pp. 459-464
ACCURATE MEASUREMENTS OF MEAN INNER POTENTIAL OF CRYSTAL WEDGES USINGDIGITAL ELECTRON HOLOGRAMS
Authors: GAJDARDZISKAJOSIFOVSKA M MCCARTNEY MR DERUIJTER WJ SMITH DJ WEISS JK ZUO JM
Citation: M. Gajdardziskajosifovska et al., ACCURATE MEASUREMENTS OF MEAN INNER POTENTIAL OF CRYSTAL WEDGES USINGDIGITAL ELECTRON HOLOGRAMS, Ultramicroscopy, 50(3), 1993, pp. 285-299
COHERENT ELECTRON NANODIFFRACTION FROM PERFECT AND IMPERFECT CRYSTALS
Authors: ZUO JM SPENCE JCH
Citation: Jm. Zuo et Jch. Spence, COHERENT ELECTRON NANODIFFRACTION FROM PERFECT AND IMPERFECT CRYSTALS, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 68(5), 1993, pp. 1055-1078
ELECTRON HOLOGRAPHIC STUDY OF FERROELECTRIC DOMAIN-WALLS - COMMENT
Authors: SPENCE JCH COWLEY JM ZUO JM
Citation: Jch. Spence et al., ELECTRON HOLOGRAPHIC STUDY OF FERROELECTRIC DOMAIN-WALLS - COMMENT, Applied physics letters, 62(19), 1993, pp. 2446-2447
A TRANSMISSION ELECTRON-MICROSCOPY DIFFRACTION AND SIMULATION METHOD FOR EARLY-STAGE STUDIES OF THE EVOLUTION OF GEL-DERIVED ZIRCONIA PRECURSORS
Authors: TONG JZ ZUO JM EYRING L
Citation: Jz. Tong et al., A TRANSMISSION ELECTRON-MICROSCOPY DIFFRACTION AND SIMULATION METHOD FOR EARLY-STAGE STUDIES OF THE EVOLUTION OF GEL-DERIVED ZIRCONIA PRECURSORS, Journal of the American Ceramic Society, 76(4), 1993, pp. 857-864
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