Citation: Ej. Stanek et al., Biasing factors for simple soil ingestion estimates in mass balance studies of soil ingestion, HUM ECOL R, 7(2), 2001, pp. 329-355
Authors:
Zorn, M
Pfeifhofer, HW
Grill, D
Kranner, I
Citation: M. Zorn et al., Responses of plastid pigments to desiccation and rehydration in the desertlichen Ramalina maciformis, SYMBIOSIS, 31(1-3), 2001, pp. 201-211
Authors:
Brudno, M
Gelfand, MS
Spengler, S
Zorn, M
Dubchak, I
Conboy, JG
Citation: M. Brudno et al., Computational analysis of candidate intron regulatory elements for tissue-specific alternative pre-mRNA splicing, NUCL ACID R, 29(11), 2001, pp. 2338-2348
Authors:
Visbeck, S
Hannappel, T
Zorn, M
Zettler, JT
Willig, F
Citation: S. Visbeck et al., Temperature dependence and origin of InP(100) reflectance anisotropy down to 20 K - art. no. 245303, PHYS REV B, 6324(24), 2001, pp. 5303
Authors:
Xing, EP
Wolf, DM
Dubchak, I
Spengler, S
Zorn, M
Muchnik, I
Kulikowski, C
Citation: Ep. Xing et al., Automatic discovery of sub-molecular sequence domains in multi-aligned sequences: A dynamic programming algorithm for multiple alignment segmentation, J THEOR BIO, 212(2), 2001, pp. 129-139
Authors:
Haberland, K
Bhattacharya, A
Zorn, M
Weyers, M
Zettler, JT
Richter, W
Citation: K. Haberland et al., MOVPE growth of (Al,Ga)InP-based laser structures monitored by real-time reflectance anisotropy spectroscopy, J ELEC MAT, 29(1), 2000, pp. 94-98
Authors:
Schmidt, WG
Esser, N
Frisch, AM
Vogt, P
Bernholc, J
Bechstedt, F
Zorn, M
Hannappel, T
Visbeck, S
Willig, F
Richter, W
Citation: Wg. Schmidt et al., Understanding reflectance anisotropy: Surface-state signatures and bulk-related features in the optical spectrum of InP(001)(2X4), PHYS REV B, 61(24), 2000, pp. R16335-R16338
Authors:
Hannappel, T
Visbeck, S
Zorn, M
Zettler, JT
Willig, F
Citation: T. Hannappel et al., Reflectance anisotropy spectra for the transition from the P-rich to the In-rich surface reconstruction of InP(100), J CRYST GR, 221, 2000, pp. 124-128
Authors:
Zettler, JT
Haberland, K
Zorn, M
Pristovsek, M
Richter, W
Kurpas, P
Weyers, M
Citation: Jt. Zettler et al., Real-time monitoring of MOVPE device growth by reflectance anisotropy spectroscopy and related optical techniques, J CRYST GR, 195(1-4), 1998, pp. 151-162