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Results: 1-15 |
Results: 15

Authors: Nijdam, AJ Gardeniers, JGE Berenschot, JW van Veenendaal, E van Suchtelen, J Elwenspoek, M
Citation: Aj. Nijdam et al., Influence of the angle between etched (near) Si{111} surfaces and the substrate orientation on the underetch rate during anisotropic wet-chemical etching of silicon, J MICROM M, 11(5), 2001, pp. 499-503

Authors: van Veenendaal, E Cuppen, HM van Enckevort, WJP van Suchtelen, J Nijdam, AJ Elwenspoek, M Vlieg, E
Citation: E. Van Veenendaal et al., A Monte Carlo study of etching in the presence of a mask junction, J MICROM M, 11(4), 2001, pp. 409-415

Authors: van Veenendaal, E Sato, K Shikida, M van Suchtelen, J
Citation: E. Van Veenendaal et al., Micromorphology of single crystalline silicon surfaces during anisotropic wet chemical etching in KOH and TMAH, SENS ACTU-A, 93(3), 2001, pp. 219-231

Authors: van Veenendaal, E Sato, K Shikida, M Nijdam, AJ van Suchtelen, J
Citation: E. Van Veenendaal et al., Micro-morphology of single crystalline silicon surfaces during anisotropicwet chemical etching in KOH: velocity source forests, SENS ACTU-A, 93(3), 2001, pp. 232-242

Authors: de Theije, FK van Veenendaal, E van Enckevort, WJP Vlieg, E
Citation: Fk. De Theije et al., Oxidative etching of cleaved synthetic diamond {111} surfaces, SURF SCI, 492(1-2), 2001, pp. 91-105

Authors: Nijdam, AJ van Veenendaal, E Cuppen, HM van Suchtelen, J Reed, ML Gardeniers, JGE van Enckevort, WJP Vlieg, E Elwenspoek, M
Citation: Aj. Nijdam et al., Formation and stabilization of pyramidal etch hillocks on silicon {100} inanisotropic etchants: Experiments and Monte Carlo simulation, J APPL PHYS, 89(7), 2001, pp. 4113-4123

Authors: van Veenendaal, E Nijdam, AJ van Suchtelen, J Sato, K Gardeniers, JGE van Enckevort, WJP Elwenspoek, M
Citation: E. Van Veenendaal et al., Simulation of anisotropic wet chemical etching using a physical model, SENS ACTU-A, 84(3), 2000, pp. 324-329

Authors: Cuppen, HM van Veenendaal, E van Suchtelen, J van Enckevort, WJP Vlieg, E
Citation: Hm. Cuppen et al., A Monte Carlo study of dislocation growth and etching of crystals, J CRYST GR, 219(1-2), 2000, pp. 165-175

Authors: van Veenendaal, E van Beurden, P van Enckevort, WJP Vlieg, E van Suchtelen, J Elwenspoek, M
Citation: E. Van Veenendaal et al., Monte Carlo study of kinetic smoothing during dissolution and etching of the Kossel (100) and silicon (111) surfaces, J APPL PHYS, 88(8), 2000, pp. 4595-4604

Authors: van Suchtelen, J van Veenendaal, E
Citation: J. Van Suchtelen et E. Van Veenendaal, The construction of orientation-dependent crystal growth and etch rate functions I. Mathematical and physical aspects, J APPL PHYS, 87(12), 2000, pp. 8721-8731

Authors: van Veenendaal, E van Suchtelen, J van Enckevort, WJP Sato, K Nijdam, AJ Gardeniers, JGE Elwenspoek, M
Citation: E. Van Veenendaal et al., The construction of orientation-dependent crystal growth and etch rate functions II: Application to wet chemical etching of silicon in potassium hydroxide, J APPL PHYS, 87(12), 2000, pp. 8732-8740

Authors: Nijdam, AJ van Veenendaal, E Gardeniers, JGE Kentgens, APM Nachtegaal, GH Elwenspoek, M
Citation: Aj. Nijdam et al., Si-29-nuclear magnetic resonance on the etching products of silicon in potassium hydroxide solutions, J ELCHEM SO, 147(6), 2000, pp. 2195-2198

Authors: van Beurden, P van Veenendaal, E van Enckevort, WJP Knops, HJF
Citation: P. Van Beurden et al., A Monte Carlo investigation into the equilibrium properties of the Si{111}surface, SURF SCI, 424(1), 1999, pp. 109-116

Authors: van Suchtelen, J Nijdam, AJ van Veenendaal, E
Citation: J. Van Suchtelen et al., The velocity source concept, J CRYST GR, 199, 1999, pp. 17-21

Authors: van Veenendaal, E van Hoof, PJCM van Suchtelen, J van Enckevort, WJP Bennema, P
Citation: E. Van Veenendaal et al., Kinetic roughening of the Kossel (1 0 0) surface, J CRYST GR, 199, 1999, pp. 22-26
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