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Results: 126-150/1117
Authors:
Chan, PK
Ng, LS
Siek, L
Lau, KT
Citation: Pk. Chan et al., Designing CMOS folded-cascode operational amplifier with flicker noise minimisation, MICROELEC J, 32(1), 2001, pp. 69-73
Authors:
Kamoulakos, G
Haniotakis, T
Tsiatouhas, Y
Schoellkopf, JP
Arapoyanni, A
Citation: G. Kamoulakos et al., Device simulation of a n-DMOS cell with trench isolation, MICROELEC J, 32(1), 2001, pp. 75-80
Authors:
Lusth, JC
Hanna, CB
Diaz-Velez, JC
Citation: Jc. Lusth et al., Eliminating non-logical states from linear quantum-dot-cellular automata, MICROELEC J, 32(1), 2001, pp. 81-84
Authors:
Liu, KW
Anwar, AFM
Citation: Kw. Liu et Afm. Anwar, An analytical model of small-signal parameters for GaAs/AlGaAs inverted high electron mobility transistors, MICROELEC J, 32(1), 2001, pp. 85-88
Authors:
Rencz, M
Szekely, V
Citation: M. Rencz et V. Szekely, Papers presented at the 1999 Workshop on the Thermal Investigations of ICsand Microstructures (THERMINIC), MICROELEC J, 31(9-10), 2000, pp. 725-726
Authors:
Szekely, V
Ress, S
Poppe, A
Torok, S
Magyari, D
Benedek, Z
Torki, K
Courtois, B
Rencz, M
Citation: V. Szekely et al., New approaches in the transient thermal measurements, MICROELEC J, 31(9-10), 2000, pp. 727-733
Authors:
Breglio, G
Spirito, P
Citation: G. Breglio et P. Spirito, Experimental detection of time dependent temperature maps in power bipolartransistors, MICROELEC J, 31(9-10), 2000, pp. 735-739
Authors:
Breglio, G
Rinaldi, N
Spirito, P
Citation: G. Breglio et al., Thermal mapping and 3D numerical simulation of new cellular power MOS affected by electro-thermal instability, MICROELEC J, 31(9-10), 2000, pp. 741-746
Authors:
Bosc, JM
Dupuy, P
Gil, J
Dorkel, JM
Sarrabayrouse, G
Citation: Jm. Bosc et al., Thermal characterization of LDMOS transistors for accelerating stress testing, MICROELEC J, 31(9-10), 2000, pp. 747-752
Authors:
D'Amore, D
Maffezzoni, P
Citation: D. D'Amore et P. Maffezzoni, Electro-thermal analysis of paralleled bipolar devices, MICROELEC J, 31(9-10), 2000, pp. 753-758
Authors:
Stepowicz, WJ
Zarebski, J
Citation: Wj. Stepowicz et J. Zarebski, Influence of electrothermal interactions on nonisothermal small-signal parameters of BJTs in ICs, MICROELEC J, 31(9-10), 2000, pp. 759-764
Authors:
Wang, DG
Muller, PK
Citation: Dg. Wang et Pk. Muller, Improving cooling efficiency by increasing fan power usage, MICROELEC J, 31(9-10), 2000, pp. 765-771
Authors:
Sultan, GI
Citation: Gi. Sultan, Enhancing forced convection heat transfer from multiple protruding heat sources simulating electronic components in a horizontal channel by passive cooling, MICROELEC J, 31(9-10), 2000, pp. 773-779
Authors:
Janicki, M
Napieralski, A
Citation: M. Janicki et A. Napieralski, Modelling electronic circuit radiation cooling using analytical thermal model, MICROELEC J, 31(9-10), 2000, pp. 781-785
Authors:
Kreutz, EW
Pirch, N
Ebert, T
Wester, R
Ollier, B
Loosen, P
Poprawe, R
Citation: Ew. Kreutz et al., Simulation of micro-channel heat sinks optoelectronic microsystems, MICROELEC J, 31(9-10), 2000, pp. 787-790
Authors:
Liew, LA
Tuantranont, A
Bright, VM
Citation: La. Liew et al., Modeling of thermal actuation in a bulk-micromachined CMOS micromirror, MICROELEC J, 31(9-10), 2000, pp. 791-801
Authors:
Bianchi, RA
Karam, JM
Courtois, B
Nadal, R
Pressecq, F
Sifflet, S
Citation: Ra. Bianchi et al., CMOS-compatible temperature sensor with digital output for wide temperature range applications, MICROELEC J, 31(9-10), 2000, pp. 803-810
Authors:
Szekely, V
Nagy, A
Torok, S
Hajas, G
Rencz, M
Citation: V. Szekely et al., Realization of an electronically controlled thermal resistance, MICROELEC J, 31(9-10), 2000, pp. 811-814
Authors:
Volz, S
Saulnier, JB
Chen, G
Beauchamp, P
Citation: S. Volz et al., Computation of thermal conductivity of Si/Ge superlattices by molecular dynamics techniques, MICROELEC J, 31(9-10), 2000, pp. 815-819
Authors:
Zakrzewski, J
Firszt, F
Legowski, S
Meczynska, H
Sekulska, B
Szatkowski, J
Paszkowicz, W
Citation: J. Zakrzewski et al., Photoacoustic investigations of beryllium containing wide gap II-VI mixed crystals, MICROELEC J, 31(9-10), 2000, pp. 821-824
Authors:
Kuntman, A
Kuntman, H
Citation: A. Kuntman et H. Kuntman, A study on dielectric properties of a new polyimide film suitable for interlayer dielectric material in microelectronics applications, MICROELEC J, 31(8), 2000, pp. 629-634
Authors:
Yun, I
Hyun, KS
Citation: I. Yun et Ks. Hyun, Zinc diffusion process investigation of InP-based test structures for high-speed avalanche photodiode fabrication, MICROELEC J, 31(8), 2000, pp. 635-639
Authors:
Lim, KM
Kang, HC
Sung, MY
Citation: Km. Lim et al., A study on the poly-Si TFT and novel pixel structure for low flicker, MICROELEC J, 31(8), 2000, pp. 641-646
Authors:
Koukab, A
Bath, A
Thevenin, P
Citation: A. Koukab et al., Improved bias-thermal-stress method for the insulator charge measurement of BN/InP MIS structures, MICROELEC J, 31(8), 2000, pp. 647-651
Authors:
Spassov, D
Atanassova, E
Beshkov, G
Citation: D. Spassov et al., Effects of rapid thermal annealing in vacuum on electrical properties of thin Ta2O5-Si structures, MICROELEC J, 31(8), 2000, pp. 653-661