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Results: 1-25/520
Authors:
Ebert, V
Citation: V. Ebert, Gas analysis with near infrared diode lasers, TEC MES, 68(9), 2001, pp. 363-364
Authors:
Wandt, D
Fallnich, C
Welling, H
Citation: D. Wandt et al., External cavity diode lasers for gas analytics, TEC MES, 68(9), 2001, pp. 365-373
Authors:
Hildebrandt, L
Knispel, R
Sacher, J
Citation: L. Hildebrandt et al., Compact external cavity diode laser for industrial analysis, TEC MES, 68(9), 2001, pp. 374-379
Authors:
Huhse, D
Kuntz, M
Bimberg, D
Citation: D. Huhse et al., Wavelength tunable cw and pulsed semiconductor lasers with external fiber cavities for gas analysis, TEC MES, 68(9), 2001, pp. 380-387
Authors:
Weiss, C
Viehl, E
Theiss, C
Torosyan, G
Weinacht, M
Beigang, R
Wallenstein, R
Citation: C. Weiss et al., Broadband THz-radiation for gas analysis, TEC MES, 68(9), 2001, pp. 388-399
Authors:
Egermann, J
Jonuscheit, J
Seeger, T
Leipertz, A
Citation: J. Egermann et al., Investigation of diode laser-based multi-species gas sensor concepts, TEC MES, 68(9), 2001, pp. 400-405
Authors:
Ebert, V
Fernholz, T
Giesemann, C
Pitz, H
Teichert, H
Citation: V. Ebert et al., Diode-laser based in-situ detection of multiple gas species in a power plant, TEC MES, 68(9), 2001, pp. 406-414
Authors:
Ankerhold, G
Buchtal, R
Citation: G. Ankerhold et R. Buchtal, Diode laser spectroscopy for gas analysis in industrial environments, TEC MES, 68(9), 2001, pp. 415-423
Authors:
Wang, YC
Manske, E
Jager, G
Citation: Yc. Wang et al., Simultaneous length and angle measurement with a plane mirror interferometer, TEC MES, 68(7-8), 2001, pp. 319-325
Authors:
Fruhauf, J
Kronert, S
Brand, U
Citation: J. Fruhauf et al., Depth and lateral standards made of silicon, TEC MES, 68(7-8), 2001, pp. 326-332
Authors:
Merget, MM
Pfeifer, T
Pieper, KP
Citation: Mm. Merget et al., Inspection assurance via petrinets, TEC MES, 68(7-8), 2001, pp. 333-337
Authors:
Mery, D
Jaeger, T
Filbert, D
Citation: D. Mery et al., Automated quality control of castings: State of the art, TEC MES, 68(7-8), 2001, pp. 338-349
Authors:
Gatke, J
Citation: J. Gatke, Non-invasive ultrasonic flow measurement at disturbed profiles, TEC MES, 68(7-8), 2001, pp. 350-354
Authors:
Gerlach, G
Citation: G. Gerlach, The future of magnetic sensors, TEC MES, 68(6), 2001, pp. 259-260
Authors:
Schilling, M
Citation: M. Schilling, Highly sensitive magnetic field sensors for the low frequency regime, TEC MES, 68(6), 2001, pp. 261-268
Authors:
Dietmayer, KCJ
Citation: Kcj. Dietmayer, Magnetic sensors based on the AMR-effect, TEC MES, 68(6), 2001, pp. 269-279
Authors:
Treutler, CPO
Siegle, H
Citation: Cpo. Treutler et H. Siegle, Thin-film magnetic sensors for automotive applications, TEC MES, 68(6), 2001, pp. 280-285
Authors:
Popovic, RS
Drljaca, P
Schott, C
Racz, R
Citation: Rs. Popovic et al., A new CMOS Hall angular position sensor, TEC MES, 68(6), 2001, pp. 286-291
Authors:
Tewes, M
Lohndorf, M
Ludwig, A
Quandt, E
Citation: M. Tewes et al., Remotely interrogated magnetoelastic sensors, TEC MES, 68(6), 2001, pp. 292-297
Authors:
Korvink, JG
Greiner, A
Lienemann, J
Citation: Jg. Korvink et al., Numerical offset optimization of magnetic field sensor microsystems, TEC MES, 68(6), 2001, pp. 298-308
Authors:
Trankler, HR
Citation: Hr. Trankler, Charme of sensors, TEC MES, 68(5), 2001, pp. 199-199
Authors:
Teichmann, HW
Hiller, D
Westenhofer, SD
Pedersen, JS
Gale, MT
Citation: Hw. Teichmann et al., A replicated micro-optical sensor for industrial spectral analysis, TEC MES, 68(5), 2001, pp. 200-203
Authors:
Jakoby, B
Eisenschmid, H
Schatz, O
Bosch, R
Citation: B. Jakoby et al., A multi-functional sensor for oil condition evaluation, TEC MES, 68(5), 2001, pp. 204-207
Authors:
Schmid, U
Hoffmann, R
Krotz, G
Citation: U. Schmid et al., A micromachined high pressure stable mass flow sensor for common-rail injection systems, TEC MES, 68(5), 2001, pp. 208-214
Authors:
Giebeler, C
Kuiper, T
van Zon, JBAD
Doescher, M
Schulz, G
Oelgeschlaeger, D
Citation: C. Giebeler et al., Robust GMR sensors for automotive applications, TEC MES, 68(5), 2001, pp. 215-219