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Results:
1-14
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Results: 14
Authors:
KYUTT RN
ARGUNOVA TS
Citation: Rn. Kyutt et Ts. Argunova, APPLICATION OF X-RAY-DIFFRACTION IN LAUE GEOMETRY TO IMPERFECT NEAR-SURFACE LAYERS, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 267-275
Authors:
KIM ED
KIM SC
PARK JM
GREKHOV IV
ARGUNOVA TS
KOSTINA LS
KUDRYAVTZEVA TV
Citation: Ed. Kim et al., STRUCTURAL QUALITY OF DIRECTLY BONDED SILICON-WAFERS WITH REGULARLY GROOVED INTERFACES, Journal of the Electrochemical Society, 144(2), 1997, pp. 622-627
Authors:
ARGUNOVA TS
GREKHOV IV
GUTKIN MY
KOSTINA LS
BELYAKOVA EN
KUDRYAVTSEVA TV
KIM ED
PARK DM
Citation: Ts. Argunova et al., DISLOCATIONS IN SILICON STRUCTURES OBTAIN ED THROUGH THE DIRECT SURFACE JOINING WITH RELIEF, Fizika tverdogo tela, 38(11), 1996, pp. 3361-3364
Authors:
KYUTT RN
ARGUNOVA TS
Citation: Rn. Kyutt et Ts. Argunova, DETERMINATION OF STRUCTURAL PARAMETERS OF YBACUO THIN-FILMS BY HIGH-RESOLUTION X-RAY-DIFFRACTION METHODS, Fizika tverdogo tela, 38(1), 1996, pp. 89-100
Authors:
ARGUNOVA TS
ANDREEV AG
BELYAKOVA EI
GREKHOV IV
KOSTINA LS
KUDRYAVTSEVA TV
Citation: Ts. Argunova et al., DIRECT JOINING OF SILICON PLATES WITH REG ULAR RELIEF ON INTERFACES, Pis'ma v Zurnal tehniceskoj fiziki, 22(4), 1996, pp. 1-6
RECOMBINATION PROPERTIES OF DIRECTLY BOUN DED SILICON STRUCTURES WITHREGULAR RELIEF ON THE INTERFACE
Authors:
GREKHOV IV
BERMAN LS
ARGUNOVA TS
KOSTINA LS
BELYAKOVA EI
KUDRYAVTSEVA TV
KIM ED
KIM SC
PAK DM
Citation: Iv. Grekhov et al., RECOMBINATION PROPERTIES OF DIRECTLY BOUN DED SILICON STRUCTURES WITHREGULAR RELIEF ON THE INTERFACE, Pis'ma v Zurnal tehniceskoj fiziki, 22(23), 1996, pp. 14-18
Authors:
SHULPINA IL
ARGUNOVA TS
RATNIKOV VV
Citation: Il. Shulpina et al., DETECTION AND ANALYSIS OF DEFECTS IN MONO CRYSTALS AND EPITAXIAL LAYERS BASED ON CDTE BY THE X-RAY TOPOGRAPHY METHODS, Zurnal tehniceskoj fiziki, 65(4), 1995, pp. 180-188
Authors:
SHULPINA IL
ARGUNOVA TS
Citation: Il. Shulpina et Ts. Argunova, DETECTION OF DISLOCATIONS IN STRONGLY ABSORBING CRYSTALS BY PROJECTION X-RAY TOPOGRAPHY IN BACK REFLECTION, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 47-49
Authors:
ARGUNOVA TS
KYUTT RN
SCHEGLOV MP
FALEEV NN
Citation: Ts. Argunova et al., DETERMINATION OF YBACUO THIN-LAYER STRUCTURAL PARAMETERS BY USING HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 212-215
Authors:
KYUTT RN
RUVIMOV SS
ARGUNOVA TS
Citation: Rn. Kyutt et al., X-RAY TRIPLE-CRYSTAL DIFFRACTOMETRY AND TRANSMISSION ELECTRON-MICROSCOPY CHARACTERIZATION OF DEFECTS IN LATTICE-MISMATCHED EPITAXIAL STRUCTURES, Journal of applied crystallography, 28, 1995, pp. 700-706
Authors:
KYUTT RN
SOROKIN LM
ARGUNOVA TS
RUVIMOV SS
Citation: Rn. Kyutt et al., X-RAY-DIFFRACTION STUDY OF DISLOCATION-ST RUCTURE IN MOLECULAR-BEAM EPITAXY SYSTEMS WITH HIGH-DEGREE OF NONCORRESPONDENCE OF LATTICE-PARAMETERS, Fizika tverdogo tela, 36(9), 1994, pp. 2700-2711
Authors:
ARGUNOVA TS
KYUTT RN
MATVEEV BA
RUVIMOV SS
STUS NM
TALALAKIN GN
Citation: Ts. Argunova et al., DISTRIBUTION OF DEFORMATION IN INASSBP-IN GAASSB BINARY HETEROSTRUCTURES, Fizika tverdogo tela, 36(10), 1994, pp. 3071-3078
Authors:
MAKAROV VV
KYUTT RN
ARGUNOVA TS
SOROKIN LM
SHERMAN AB
Citation: Vv. Makarov et al., THE EFFECT OF STRUCTURAL DEFECTS ON MAGNETIC-FIELD DISTRIBUTION IN YBA2CU3O7-X FILMS, Superconductor science and technology, 6(12), 1993, pp. 822-826
Authors:
KUTT RN
SCHOLZ R
RUVIMOV SS
ARGUNOVA TS
BUDZA AA
IVANOV SV
KOPYEV PS
SOROKIN LM
SHCHEGLOV MP
Citation: Rn. Kutt et al., DISLOCATION-STRUCTURE OF MBE-GROWN EPITAXIAL GASB LAYERS ON (001) GAAS SUBSTRATES, Fizika tverdogo tela, 35(3), 1993, pp. 724-735
Risultati:
1-14
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