Citation: F. Atamny et A. Baiker, INVESTIGATION OF CARBON-BASED CATALYSTS BY SCANNING-TUNNELING-MICROSCOPY - OPPORTUNITIES AND LIMITATIONS, Applied catalysis. A, General, 173(2), 1998, pp. 201-230
Citation: F. Atamny et al., ATOMIC-RESOLUTION OF DEFECTS IN GRAPHITE STUDIED BY STM, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 344-348
Citation: M. Becht et al., SURFACE-MORPHOLOGY AND ELECTRICAL-PROPERTIES OF COPPER THIN-FILMS PREPARED BY MOCVD, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 718-722
Authors:
GOBEL U
ATAMNY F
BENSCH W
FESTER A
SCHUBERT H
SCHLOGL R
Citation: U. Gobel et al., QUANTITATIVE ASPECTS OF THE DESORPTION OF COPPER FROM THE SILICON(100) SURFACE, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 320-323
Citation: F. Atamny et al., AFM AND XRD INVESTIGATION OF CRYSTALLINE VAPOR-DEPOSITED C-60 FILMS, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 433-438