Citation: Fd. Auret et al., ELECTRICAL CHARACTERIZATION OF SPUTTER-DEPOSITION-INDUCED DEFECTS IN EPITAXIALLY GROWN N-GAAS LAYERS, Vacuum, 46(8-10), 1995, pp. 1087-1090
Citation: Fd. Auret et al., NEW ELECTRON-IRRADIATION-INDUCED ELECTRON TRAP IN EPITAXIALLY GROWN SI-DOPED N-GAAS, Applied physics letters, 67(22), 1995, pp. 3277-3279
Citation: Fd. Auret et al., NEUTRON-IRRADIATION INDUCED DEFECTS IN LOW FREE-CARRIER CONCENTRATIONEPITAXIALLY GROWN N-GAAS, JPN J A P 1, 33(5A), 1994, pp. 2633-2634
Citation: Sa. Goodman et al., ELECTRIC-FIELD EFFECT ON THE EMISSION OF ELECTRON-IRRADIATION-INDUCEDDEFECTS IN N-GAAS, JPN J A P 1, 33(4A), 1994, pp. 1949-1953
Citation: Sa. Goodman et al., THE EFFECT OF ALPHA-PARTICLE AND PROTON IRRADIATION ON THE ELECTRICALAND DEFECT PROPERTIES OF N-GAAS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 90(1-4), 1994, pp. 349-353
Authors:
AURET FD
WILSON A
GOODMAN SA
MYBURG G
MEYER WE
Citation: Fd. Auret et al., ELECTRICAL CHARACTERISTICS OF NEUTRON-IRRADIATION INDUCED DEFECTS IN N-GAAS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 90(1-4), 1994, pp. 387-391
Citation: G. Myburg et al., FERMI-LEVEL PINNING BY VARIOUS METAL SCHOTTKY CONTACTS ON (100)-OMVPE-GROWN N-GAAS, Thin solid films, 249(1), 1994, pp. 95-99
Citation: Sa. Goodman et al., HOLE DEFECTS IN MOLECULAR-BEAM EPITAXIALLY GROWN P-GAAS INTRODUCED BYALPHA-IRRADIATION, Journal of applied physics, 75(2), 1994, pp. 1222-1224
Citation: Sa. Goodman et Fd. Auret, DEEP-LEVEL TRANSIENT SPECTROSCOPY CHARACTERIZATION OF DEFECTS INTRODUCED IN N-GAAS AFTER ALPHA-IRRADIATION AT 15-K, JPN J A P 2, 32(8B), 1993, pp. 120001120-120001122
Authors:
AURET FD
GOODMAN SA
MEYER WE
ERASMUS RM
MYBURG G
Citation: Fd. Auret et al., DEEP-LEVEL TRANSIENT SPECTROSCOPY CHARACTERIZATION OF ELECTRON-IRRADIATION-INDUCED HOLE TRAPS IN P-GAAS GROWN BY MOLECULAR-BEAM EPITAXY, JPN J A P 2, 32(7B), 1993, pp. 120000974-120000977
Citation: Fd. Auret et al., ELECTRICAL CHARACTERIZATION OF DEFECTS INTRODUCED IN N-GAAS BY ALPHA-IRRADIATION AND BETA-IRRADIATION FROM RADIONUCLIDES, Applied physics. A, Solids and surfaces, 56(6), 1993, pp. 547-553
Citation: Fd. Auret et al., EFFECT OF ELECTRON-BEAM DEPOSITION RATE ON THE ELECTRICAL-PROPERTIES OF TI N-GAAS AND PT/N-GAAS CONTACTS/, Thin solid films, 235(1-2), 1993, pp. 163-168
Authors:
GOODMAN SA
AURET FD
HAYES M
MYBURG G
MEYER WE
Citation: Sa. Goodman et al., ELECTRICAL AND DEFECT CHARACTERIZATION OF N-TYPE GAAS IRRADIATED WITHALPHA-PARTICLES USING A VANDEGRAAFF ACCELERATOR AND AN AM-241 RADIO-NUCLIDE SOURCE, Physica status solidi. a, Applied research, 140(2), 1993, pp. 381-390