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Citation: G. Knowles et al., Assessing the performance of visible (665 nm) vertical cavity surface emitting lasers using high pressure and low temperature techniques, PHYS ST S-B, 223(2), 2001, pp. 581-585
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Citation: Te. Sale et al., Gain-cavity alignment in efficient visible (660 nm) VCSELs studied using high pressure techniques, PHYS ST S-B, 223(2), 2001, pp. 587-591
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Citation: Ad. Andreev et al., Theoretical performance and structure optimization of 3.5-4.5 mu m InGaSb/InGaAlSb multiple-quantum-well lasers, APPL PHYS L, 78(18), 2001, pp. 2640-2642
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Citation: M. Silver et al., Design and ASE characteristics of 1550-nm polarization-insensitive semiconductor optical amplifiers containing tensile and compressive wells, IEEE J Q EL, 36(1), 2000, pp. 118-122
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Citation: Af. Phillips et al., The temperature dependence of 1.3-and 1.5-mu m compressively strained InGaAs(P) MQW semiconductor lasers, IEEE S T QU, 5(3), 1999, pp. 401-412
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Citation: T. Higashi et al., Experimental analysis of temperature dependence in 1.3-mu m AlGaInAs-InP strained MQW lasers, IEEE S T QU, 5(3), 1999, pp. 413-419
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Citation: T. Higashi et al., Observation of reduced nonradiative current in 1.3-mu m AlGaInAs-InP strained MQW lasers, IEEE PHOTON, 11(4), 1999, pp. 409-411
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Citation: Pma. Vicente et al., Quantum-well and cavity-mode resonance effects in a vertical-cavity surface-emitting laser structure, observed by photoreflectance using hydrostatic pressure and temperature tuning, PHYS ST S-B, 211(1), 1999, pp. 255-262
Citation: J. Allam et Ar. Adams, High pressure measurements and the "universal" scaling of impact ionization with bandstructure, PHYS ST S-B, 211(1), 1999, pp. 335-344
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Citation: Af. Phillips et al., The hydrostatic pressure dependence of the threshold current in 1.3 mu m InGaAsP quantum well semiconductor diode lasers, PHYS ST S-B, 211(1), 1999, pp. 513-518
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Citation: Sj. Sweeney et al., Dependence of threshold current on QW position and on pressure in 1.5 mu mInGaAs(P) lasers, PHYS ST S-B, 211(1), 1999, pp. 525-531
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Citation: H. Page et al., Carrier leakage effects in GaAsP/AlGaAs single-quantum-well lasers determined by hydrostatic pressure measurements, PHYS ST S-B, 211(1), 1999, pp. 533-538
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