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Results: 1-13 |
Results: 13
Observation of photodiode and electroluminescence effects for a-C/a-C : H multilayer nanostructures on silicon
Authors: Baranov, AM Varfolomeev, AE Nefedov, AA Calliari, L Speranza, G Laidani, N Anderle, M
Citation: Am. Baranov et al., Observation of photodiode and electroluminescence effects for a-C/a-C : H multilayer nanostructures on silicon, DIAM RELAT, 10(3-7), 2001, pp. 1040-1042
Study of the discharge gas trapping during thin-film growth
Authors: Amorosi, S Anderle, M Benvenuti, C Calatroni, S Carver, J Chiggiato, P Neupert, H Vollenberg, W
Citation: S. Amorosi et al., Study of the discharge gas trapping during thin-film growth, VACUUM, 60(1-2), 2001, pp. 89-94
Carbon effect on the phase structure and the hardness of RF sputtered zirconia films
Authors: Laidani, N Micheli, V Anderle, M
Citation: N. Laidani et al., Carbon effect on the phase structure and the hardness of RF sputtered zirconia films, THIN SOL FI, 382(1-2), 2001, pp. 23-29
Cubic boron nitride deposition on silicon substrates at room temperature by KrF excimer laser ablation of h-BN
Authors: Acquaviva, S Leggieri, G Luches, A Perrone, A Zocco, A Laidani, N Speranza, G Anderle, M
Citation: S. Acquaviva et al., Cubic boron nitride deposition on silicon substrates at room temperature by KrF excimer laser ablation of h-BN, APPL PHYS A, 70(2), 2000, pp. 197-201
Development of DLC film technology for electronic application
Authors: Baranov, AM Varfolomeev, AE Nefedov, AA Anderle, M Calliari, L Speranza, G Landini, N
Citation: Am. Baranov et al., Development of DLC film technology for electronic application, DIAM RELAT, 9(3-6), 2000, pp. 649-653
Semi-quantitative description of C hybridization via s- and p-partial density of states probing: An electron spectroscopy study
Authors: Speranza, G Calliari, L Laidani, N Anderle, M
Citation: G. Speranza et al., Semi-quantitative description of C hybridization via s- and p-partial density of states probing: An electron spectroscopy study, DIAM RELAT, 9(11), 2000, pp. 1856-1861
Structural and compositional study of B-C-N films produced by laser ablation of B4C targets in N-2 atmosphere
Authors: Laidani, N Anderle, M Canteri, R Elia, L Luches, A Martino, M Micheli, V Speranza, G
Citation: N. Laidani et al., Structural and compositional study of B-C-N films produced by laser ablation of B4C targets in N-2 atmosphere, APPL SURF S, 157(3), 2000, pp. 135-144
XPS and SIMS depth profiling of oxynitrides
Authors: Vanzetti, L Bersani, M Sbetti, M Anderle, M
Citation: L. Vanzetti et al., XPS and SIMS depth profiling of oxynitrides, SURF INT AN, 30(1), 2000, pp. 255-259
Surface study of perfluoropolyether-urethane cross-linked polymers
Authors: Turri, S Radice, S Canteri, R Speranza, G Anderle, M
Citation: S. Turri et al., Surface study of perfluoropolyether-urethane cross-linked polymers, SURF INT AN, 29(12), 2000, pp. 873-886
Effect of Si on the electronic structure of sputter-deposited C films: an electron spectroscopy study
Authors: Speranza, G Laidani, N Calliari, L Anderle, M
Citation: G. Speranza et al., Effect of Si on the electronic structure of sputter-deposited C films: an electron spectroscopy study, DIAM RELAT, 8(2-5), 1999, pp. 517-521
Chemical structure of films grown by AlN laser ablation: an X-ray photoelectron spectroscopy study
Authors: Laidani, N Vanzetti, L Anderle, M Basillais, A Boulmer-Leborgue, C Perriere, J
Citation: N. Laidani et al., Chemical structure of films grown by AlN laser ablation: an X-ray photoelectron spectroscopy study, SURF COAT, 122(2-3), 1999, pp. 242-246
Characterization of rapid thermal processing oxynitrides by SIMS and XPS analyses
Authors: Bersani, M Vanzetti, L Sbetti, M Anderle, M
Citation: M. Bersani et al., Characterization of rapid thermal processing oxynitrides by SIMS and XPS analyses, APPL SURF S, 145, 1999, pp. 301-305
A study of physical properties and gas-surface interaction of vanadium oxide thin films
Authors: Rella, R Siciliano, P Cricenti, A Generosi, R Girasole, M Vanzetti, L Anderle, M Coluzza, C
Citation: R. Rella et al., A study of physical properties and gas-surface interaction of vanadium oxide thin films, THIN SOL FI, 349(1-2), 1999, pp. 254-259
Risultati: 1-13 |