Authors:
Jia, L
Yu, ET
Keogh, D
Asbeck, PM
Miraglia, P
Roskowski, A
Davis, RF
Citation: L. Jia et al., Polarization charges and polarization-induced barriers in AlxGa1-xN/GaN and InyGa1-yN/GaN heterostructures, APPL PHYS L, 79(18), 2001, pp. 2916-2918
Citation: Ym. Hsin et Pm. Asbeck, Experimental I-V characteristics of AlGaAs/GaAs and GaInP/GaAs (D)HBTs with thin bases, SOL ST ELEC, 44(4), 2000, pp. 587-592
Authors:
Miller, EJ
Dang, XZ
Wieder, HH
Asbeck, PM
Yu, ET
Sullivan, GJ
Redwing, JM
Citation: Ej. Miller et al., Trap characterization by gate-drain conductance and capacitance dispersionstudies of an AlGaN/GaN heterostructure field-effect transistor, J APPL PHYS, 87(11), 2000, pp. 8070-8073
Authors:
Mochizuki, K
Welty, RJ
Asbeck, PM
Lutz, CR
Welser, RE
Whitney, SJ
Pan, NR
Citation: K. Mochizuki et al., GaInP/GaAs collector-up tunneling-collector heterojunction bipolar transistors (C-up TC-HBTs): Optimization of fabrication process and epitaxial layer structure for high-efficiency high-power amplifiers, IEEE DEVICE, 47(12), 2000, pp. 2277-2283
Authors:
Metzger, AG
Chang, CE
Pedrotti, KD
Beccue, SM
Wang, KC
Asbeck, PM
Citation: Ag. Metzger et al., A 10-Gb/s high-isolation, 16 x 16 crosspoint switch implemented with AlGaAs/GaAs HBT's, IEEE J SOLI, 35(4), 2000, pp. 593-600
Citation: K. Mochizuki et al., GaInP/GaAs collector-up tunnelling-collector heterojunction bipolar transistors with zero-offset and low-knee-voltage characteristics, ELECTR LETT, 36(3), 2000, pp. 264-265
Authors:
Langridge, R
Thornon, T
Asbeck, PM
Larson, LE
Citation: R. Langridge et al., A power re-use technique for improved efficiency of outphasing microwave power amplifiers, IEEE MICR T, 47(8), 1999, pp. 1467-1470
Authors:
Hanington, G
Chen, PF
Asbeck, PM
Larson, LE
Citation: G. Hanington et al., High-efficiency power amplifier using dynamic power-supply voltage for CDMA applications, IEEE MICR T, 47(8), 1999, pp. 1471-1476
Authors:
Dang, XZ
Asbeck, PM
Yu, ET
Sullivan, GJ
Chen, MY
McDermott, BT
Boutros, KS
Redwing, JM
Citation: Xz. Dang et al., Measurement of drift mobility in AlGaN GaN heterostructure field-effect transistor, APPL PHYS L, 74(25), 1999, pp. 3890-3892