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Results: 25
Authors:
BADAWI KF
GOUDEAU P
DURAND N
Citation: Kf. Badawi et al., CONSISTENT INTERPRETATION OF NEGATIVE POI SSONS RATIO REPORTED IN METALLIC MULTILAYERS - ROLE OF STRESS-FREE LATTICE-PARAMETER, EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2(1), 1998, pp. 1-6
Authors:
RENAULT PO
BADAWI KF
BIMBAULT L
GOUDEAU P
ELKAIM E
LAURIAT JP
Citation: Po. Renault et al., POISSONS RATIO MEASUREMENT IN TUNGSTEN THIN-FILMS COMBINING AN X-RAY DIFFRACTOMETER WITH IN-SITU TENSILE TESTER, Applied physics letters, 73(14), 1998, pp. 1952-1954
Authors:
BRANGER V
DURAND N
HAGHIRIGOSNET AM
BADAWI KF
RAVET MF
Citation: V. Branger et al., RESIDUAL-STRESSES AND INTRA-GRANULAR MICR OSTRUCTURE DETERMINATION OFTHIN W-FILMS DEPOSITED BY RF MAGNETRON SPUTTERING, Journal de physique. III, 7(6), 1997, pp. 1247-1260
Authors:
AUZARY S
BADAWI KF
BIMBAULT L
RABIER J
GABORIAUD RJ
GOUDEAU P
Citation: S. Auzary et al., AN X-RAY-DIFFRACTION STUDY OF MICROSTRUCT URAL AND MECHANICAL STATE OF SUPERCONDUCTING YBCO THIN-FILM, Journal de physique. III, 7(1), 1997, pp. 35-46
Authors:
CONSIGLIO R
DURAND N
BADAWI KF
MACQUART P
LERBET F
ASSOUL M
VONSTEBUT J
Citation: R. Consiglio et al., MECHANICAL STRENGTH ASSESSMENT OF VERY THIN-FILMS FOR OPTICAL AND ELECTRONIC APPLICATIONS, Surface & coatings technology, 97(1-3), 1997, pp. 192-199
Authors:
BIMBAULT L
BADAWI KF
GOUDEAU P
MIMAULT J
PROUX O
Citation: L. Bimbault et al., STRUCTURAL-ANALYSIS OF AU-PT MULTILAYERS USING COMPLEMENTARY X-RAY TECHNIQUES, Journal de physique. IV, 6(C7), 1996, pp. 43-51
Authors:
GOUDEAU P
BADAWI KF
NAUDON A
JAULIN M
DURAND N
BIMBAULT L
BRANGER V
Citation: P. Goudeau et al., NEW X-RAY-DIFFRACTION EQUIPMENT FOR ANALY SIS OF MECHANICAL STATES (STRESS AND MICRODEFORMATION) OF THIN NANOCRYSTALLINE FILMS, Journal de physique. IV, 6(C4), 1996, pp. 187-196
Authors:
BRANGER V
PELOSIN V
BADAWI KF
GOUDEAU P
Citation: V. Branger et al., STUDY OF THE MECHANICAL AND MICROSTRUCTURAL STATE OF PLATINUM THIN-FILMS, Thin solid films, 275(1-2), 1996, pp. 22-24
Authors:
BIMBAULT L
BADAWI KF
GOUDEAU P
BRANGER V
DURAND N
Citation: L. Bimbault et al., PROFILE ANALYSIS OF THIN-FILM X-RAY-DIFFRACTION PEAKS, Thin solid films, 275(1-2), 1996, pp. 40-43
Authors:
DURAND N
BADAWI KF
GOUDEAU P
Citation: N. Durand et al., INFLUENCE OF MICROSTRUCTURE ON RESIDUAL-STRESS IN TUNGSTEN THIN-FILMSANALYZED BY X-RAY-DIFFRACTION, Thin solid films, 275(1-2), 1996, pp. 168-171
Authors:
DURAND N
BADAWI KF
GOUDEAU P
Citation: N. Durand et al., RESIDUAL-STRESSES AND MICROSTRUCTURE IN TUNGSTEN THIN-FILMS ANALYZED BY X-RAY DIFFRACTION-EVOLUTION UNDER ION IRRADIATION, Journal of applied physics, 80(9), 1996, pp. 5021-5027
Authors:
PRANEVICIUS L
BADAWI KF
DURAND N
DELAFOND J
GOUDEAU P
Citation: L. Pranevicius et al., RELAXATION OF RESIDUAL-STRESSES IN HIGHLY STRESSED MULTILAYERS INITIATED BY ION IRRADIATION, Surface & coatings technology, 71(3), 1995, pp. 254-258
Authors:
PRANEVICIUS L
BADAWI KF
DURAND N
DELAFOND J
TEMPLIER C
Citation: L. Pranevicius et al., SURFACE ROUGHENING RESULTING FROM ION IRRADIATION OF MULTILAYERED MATERIALS, Vacuum, 46(1), 1995, pp. 77-84
Authors:
RATS D
BIMBAULT L
VANDENBULCKE L
HERBIN R
BADAWI KF
Citation: D. Rats et al., CRYSTALLINE QUALITY AND RESIDUAL-STRESSES IN DIAMOND LAYERS BY RAMAN AND X-RAY-DIFFRACTION ANALYSES, Journal of applied physics, 78(8), 1995, pp. 4994-5001
Authors:
JONNARD P
VERGAND F
BONNELLE C
BADAWI KF
Citation: P. Jonnard et al., CORRELATION BETWEEN ELECTRONIC AND ATOMIC STRUCTURES IN AG-NI MULTILAYERS, Journal of applied physics, 77(11), 1995, pp. 6044-6045
Authors:
BRENIER R
BERANGER M
CANUT B
GEA L
RAMOS SMM
THEVENARD P
BADAWI KF
Citation: R. Brenier et al., X-RAY STUDY OF ELASTIC AND PLASTIC STRAINS IN NA-IMPLANTED (001) MONOCRYSTALLINE MGO(), Journal of applied physics, 77(10), 1995, pp. 5004-5007
Authors:
PELOSIN V
BADAWI KF
BRANGER V
Citation: V. Pelosin et al., INTERNAL-FRICTION AND ITS THERMAL EVOLUTION MEASURED ON VERY THIN PLATINUM FILMS, Applied physics letters, 66(6), 1995, pp. 691-693
Authors:
DURAND N
BIMBAULT L
BADAWI KF
GOUDEAU P
Citation: N. Durand et al., MICRODISTORTION MEASUREMENT IN AU TEXTURE D THIN-FILMS BY X-RAY-DIFFRACTION, Journal de physique. III, 4(6), 1994, pp. 1025-1032
Authors:
PAILLE L
GERLAND M
VILLAIN JP
BADAWI KF
PRESLES HN
BOUCHET B
Citation: L. Paille et al., SURFACE MECHANICAL-PROPERTIES OF AN EXPLO SIVE TREATED STAINLESS-STEEL, Journal de physique. III, 4(2), 1994, pp. 305-319
Authors:
DURAND N
BADAWI KF
GOUDEAU P
NAUDON A
Citation: N. Durand et al., RESIDUAL-STRESS EVOLUTION IN TUNGSTEN THI N-FILMS UNDER IRRADIATION, Journal de physique. III, 4(1), 1994, pp. 25-34
Authors:
DURAND N
BADAWI KF
DECLEMY A
GOUDEAU P
Citation: N. Durand et al., ORIGIN OF RESIDUAL-STRESS IN A TEXTURED AU THIN-FILM ON A LIF SUBSTRATE, Applied surface science, 81(2), 1994, pp. 119-126
Authors:
BADAWI KF
DURAND N
GOUDEAU P
PELOSIN V
Citation: Kf. Badawi et al., RESIDUAL-STRESSES AND MICROSTRUCTURE OF AG-NI MULTILAYERS, Applied physics letters, 65(24), 1994, pp. 3075-3077
Authors:
BADAWI KF
KAHLOUN C
GRILHE J
Citation: Kf. Badawi et al., RATIONAL FORMALISM OF THE RESIDUAL-STRESS DETERMINATION METHOD BY X-RAY-DIFFRACTION - APPLICATION ON THIN-FILMS AND MULTILAYERS, Journal de physique. III, 3(6), 1993, pp. 1183-1188
Authors:
BADAWI KF
GOUDEAU P
PACAUD J
JAOUEN C
DELAFOND J
NAUDON A
GLADYSZEWSKI G
Citation: Kf. Badawi et al., X-RAY-DIFFRACTION STUDY OF RESIDUAL-STRESS MODIFICATION IN CU W SUPERLATTICES IRRADIATED BY LIGHT AND HEAVY-IONS/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-1, 1993, pp. 404-407
Authors:
ANDRZEJEWSKI H
BADAWI KF
ROLLAND B
Citation: H. Andrzejewski et al., THE ROUGHNESS IN THE DIFFUSION WELDING OF TI-6AL-4V ALLOY, Welding journal, 72(9), 1993, pp. 190000435-190000439
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