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ZASTROW U
LOO R
SZOT R
MOERS J
GRABOLLA T
BEHAMMER D
VESCAN L
Citation: U. Zastrow et al., SIMS DEPTH PROFILING OF VERTICAL P-CHANNEL SI-MOS TRANSISTOR STRUCTURES, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 203-207
Authors:
LOO R
VESCAN L
BEHAMMER D
MOERS J
GRABOLLA T
LANGEN W
KLAES D
ZASTROW U
KORDOS P
Citation: R. Loo et al., VERTICAL SI P-MOS TRANSISTOR SELECTIVELY GROWN BY LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITION, Thin solid films, 294(1-2), 1997, pp. 267-270
Authors:
BEHAMMER D
WIECZOREK K
ALBERS JN
FRIEDRICH S
SCHREIBER HU
BOSCH BG
Citation: D. Behammer et al., BASE CONTACT RESISTANCE LIMITS TO LATERAL SCALING OF FULLY SELF-ALIGNED DOUBLE MESA SIGE-HBTS, Solid-state electronics, 41(8), 1997, pp. 1105-1110
Authors:
BEHAMMER D
ALBERS JN
GEPPERT W
BOSCH BG
SCHUPPEN A
KIBBEL H
Citation: D. Behammer et al., FULLY SELF-ALIGNED DOUBLE MESA SIGE-HBT WITH EXTERNAL TRANSISTOR OPTIMIZATION, Electronics Letters, 32(19), 1996, pp. 1830-1832