AAAAAA

   
Results: 1-9 |
Results: 9
Origins of total-dose response variability in linear bipolar microcircuits
Authors: Barnaby, HJ Cirba, CR Schrimpf, RD Fleetwood, DM Pease, RL Shaneyfelt, MR Turflinger, T Krieg, JF Maher, MC
Citation: Hj. Barnaby et al., Origins of total-dose response variability in linear bipolar microcircuits, IEEE NUCL S, 47(6), 2000, pp. 2342-2349
Circuit technique for threshold voltage stabilization using substrate biasin total dose environments
Authors: Shreedhara, JK Barnaby, HJ Bhuva, BL Kerns, DV Kerns, SE
Citation: Jk. Shreedhara et al., Circuit technique for threshold voltage stabilization using substrate biasin total dose environments, IEEE NUCL S, 47(6), 2000, pp. 2557-2560
Analysis of single-event transients in analog circuits
Authors: Adell, P Schrimpf, RD Barnaby, HJ Marec, R Chatry, C Calvel, P Barillot, C Mion, O
Citation: P. Adell et al., Analysis of single-event transients in analog circuits, IEEE NUCL S, 47(6), 2000, pp. 2616-2623
Modeling BJT radiation response with non-uniform energy distributions of interface traps
Authors: Barnaby, HJ Cirba, C Schrimpf, RD Kosier, SL Fouillat, P Montagner, X
Citation: Hj. Barnaby et al., Modeling BJT radiation response with non-uniform energy distributions of interface traps, IEEE NUCL S, 47(3), 2000, pp. 514-518
Charge deposition modeling of thermal neutron products in fast submicron MOS devices
Authors: Zhu, XW Massengill, LW Cirba, CR Barnaby, HJ
Citation: Xw. Zhu et al., Charge deposition modeling of thermal neutron products in fast submicron MOS devices, IEEE NUCL S, 46(6), 1999, pp. 1378-1385
Minimizing gain degradation in lateral PNP bipolar junction transistors using gate control
Authors: Barnaby, HJ Cirba, C Schrimpf, RD Kosier, S Fouillat, P Montagner, X
Citation: Hj. Barnaby et al., Minimizing gain degradation in lateral PNP bipolar junction transistors using gate control, IEEE NUCL S, 46(6), 1999, pp. 1652-1659
Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response
Authors: Barnaby, HJ Schrimpf, RD Pease, RL Cole, P Turflinger, T Krieg, J Titus, J Emily, D Gehlhausen, M Witczak, SC Maher, MC Van Nort, D
Citation: Hj. Barnaby et al., Identification of degradation mechanisms in a bipolar linear voltage comparator through correlation of transistor and circuit response, IEEE NUCL S, 46(6), 1999, pp. 1666-1673
Threshold voltage stabilization in radiation environments
Authors: Kerns, DV Barnaby, HJ Kerns, SE
Citation: Dv. Kerns et al., Threshold voltage stabilization in radiation environments, IEEE NUCL S, 45(6), 1998, pp. 3175-3178
Moderated degradation enhancement of lateral pnp transistors due to measurement bias
Authors: Witczak, SC Schrimpf, RD Barnaby, HJ Lacoe, RC Mayer, DC Galloway, KF Pease, RL Fleetwood, DM
Citation: Sc. Witczak et al., Moderated degradation enhancement of lateral pnp transistors due to measurement bias, IEEE NUCL S, 45(6), 1998, pp. 2644-2648
Risultati: 1-9 |