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Results:
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Results: 24
Authors:
Banhart, J
Stanzick, H
Helfen, L
Baumbach, T
Nijhof, K
Citation: J. Banhart et al., Real-time X-ray investigation of aluminum foam sandwich production (vol 3,pg 407, 2001), ADV ENG MAT, 3(7), 2001, pp. 507-507
Authors:
Banhart, J
Stanzick, H
Helfen, L
Baumbach, T
Nijhof, K
Citation: J. Banhart et al., Real-time X-ray investigation of aluminum foam sandwich production, ADV ENG MAT, 3(6), 2001, pp. 407-411
Authors:
Zeimer, U
Grenzer, J
Baumbach, T
Lubbert, D
Mazuelas, A
Erbert, G
Citation: U. Zeimer et al., Strain and temperature distribution in broad-area high-power laser diodes under operation determined by high resolution X-ray diffraction and topography, MAT SCI E B, 80(1-3), 2001, pp. 87-90
Authors:
Osten, W
Seebacher, S
Baumbach, T
Juptner, W
Citation: W. Osten et al., The metrological basis for the inspection of microcomponents by Digital Holography, TEC MES, 68(2), 2001, pp. 68-79
Authors:
Osten, W
Seebacher, S
Baumbach, T
Juptner, W
Citation: W. Osten et al., A measurement system for the determination of material properties of microcomponents on the basis of digital holography, TEC MES, 68(2), 2001, pp. 80-85
Authors:
Seebacher, S
Osten, W
Baumbach, T
Juptner, W
Citation: S. Seebacher et al., The determination of material parameters of microcomponents using digital holography, OPT LASER E, 36(2), 2001, pp. 103-126
Authors:
Mazuelas, A
Dotor, ML
Golmayo, D
Zeimer, U
Baumbach, T
Luebbert, D
Grenzer, J
Baruchel, J
Citation: A. Mazuelas et al., Observation of dislocation generation in highly strained quantum well lasers during operation, J PHYS D, 34(10A), 2001, pp. A117-A121
Authors:
Mikulik, P
Jergel, M
Baumbach, T
Majkova, E
Pincik, E
Luby, S
Ortega, L
Tucoulou, R
Hudek, P
Kostic, I
Citation: P. Mikulik et al., Coplanar and non-coplanar x-ray reflectivity characterization of lateral W/Si multilayer gratings, J PHYS D, 34(10A), 2001, pp. A188-A192
Authors:
Banhart, J
Stanzick, H
Helfen, L
Baumbach, T
Citation: J. Banhart et al., Metal foam evolution studied by synchrotron radioscopy, APPL PHYS L, 78(8), 2001, pp. 1152-1154
Authors:
Giannini, C
Baumbach, T
Lubbert, D
Felici, R
Tapfer, L
Marschner, T
Stolz, W
Jin-Phillipp, NY
Phillipp, F
Citation: C. Giannini et al., Strain-driven transition from stepped interfaces to regularly spaced macrosteps in (GaIn)As/Ga(PAs) symmetrically strained superlattices, PHYS REV B, 61(3), 2000, pp. 2173-2179
Authors:
Baumbach, T
Lubbert, D
Gailhanou, M
Citation: T. Baumbach et al., Strain relaxation in surface nano-structures studied by X-ray diffraction methods, MAT SCI E B, 69, 2000, pp. 392-396
Authors:
Buttard, D
Eymery, J
Rieutord, F
Fournel, F
Lubbert, D
Baumbach, T
Moriceau, H
Citation: D. Buttard et al., Grazing incidence X-ray studies of twist-bonded Si/Si and Si/SiO2 interfaces, PHYSICA B, 283(1-3), 2000, pp. 103-107
Authors:
Lubbert, D
Baumbach, T
Hartwig, J
Boller, E
Pernot, E
Citation: D. Lubbert et al., mu m-resolved high resolution X-ray diffraction imaging for semiconductor quality control, NUCL INST B, 160(4), 2000, pp. 521-527
Authors:
Baumbach, T
Lubbert, D
Gailhanou, M
Citation: T. Baumbach et al., Strain and shape analysis of multilayer surface gratings by coplanar and by grazing-incidence x-ray diffraction, J APPL PHYS, 87(8), 2000, pp. 3744-3758
Authors:
Baumbach, T
Lubbert, D
Gailhanou, M
Citation: T. Baumbach et al., Strain relaxation in surface nano-structures studied by X-ray diffraction methods, JPN J A P 1, 38(12A), 1999, pp. 6591-6596
Authors:
Ponti, S
Baumbach, T
Citation: S. Ponti et T. Baumbach, Non-uniform strain in epitaxial surface gratings: Beyond the ordinary elastic description, PHYS LETT A, 251(1), 1999, pp. 61-66
Authors:
Lubbert, D
Baumbach, T
Ponti, S
Pietsch, U
Leprince, L
Schneck, J
Talneau, A
Citation: D. Lubbert et al., Strain investigation of low strained buried gratings by grazing incidence X-ray diffraction and elasticity theory, EUROPH LETT, 46(4), 1999, pp. 479-485
Authors:
Mikulik, P
Baumbach, T
Citation: P. Mikulik et T. Baumbach, X-ray reflection by rough multilayer gratings: Dynamical and kinematical scattering, PHYS REV B, 59(11), 1999, pp. 7632-7643
Authors:
Buttard, D
Dolino, G
Bellet, D
Baumbach, T
Rieutord, F
Citation: D. Buttard et al., X-ray reflectivity investigation of thin p-type porous silicon layers, SOL ST COMM, 109(1), 1999, pp. 1-5
Authors:
Voss, M
Suesse, H
Ortmann, W
Baumbach, T
Citation: M. Voss et al., Shift detection by restoration, PATT RECOG, 32(12), 1999, pp. 2067-2068
Authors:
Baumbach, T
Lubbert, D
Citation: T. Baumbach et D. Lubbert, Grazing incidence diffraction by laterally patterned semiconductor nanostructures, J PHYS D, 32(6), 1999, pp. 726-740
Authors:
Lubbert, D
Jenichen, B
Baumbach, T
Grahn, HT
Paris, G
Mazuelas, A
Kojima, T
Arai, S
Citation: D. Lubbert et al., Elastic stress relaxation in GaInAsP quantum wires on InP, J PHYS D, 32(10A), 1999, pp. A21-A25
Authors:
Zeimer, U
Baumbach, T
Grenzer, J
Lubbert, D
Mazuelas, A
Pietsch, U
Erbert, G
Citation: U. Zeimer et al., In situ characterization of strain distribution in broad-area high-power lasers under operation by high-resolution x-ray diffraction and topography using synchrotron radiation, J PHYS D, 32(10A), 1999, pp. A123-A127
Authors:
Ulyanenkov, A
Baumbach, T
Darowski, N
Pietsch, U
Wang, KH
Forchel, A
Wiebach, T
Citation: A. Ulyanenkov et al., In-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001], J APPL PHYS, 85(3), 1999, pp. 1524-1530
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