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Results:
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Results: 22
Authors:
Engelberg, S
Beck, U
Freyland, W
Citation: S. Engelberg et al., Transition from ionic to metallic glasses by rapid quenching of Bi-BiCl3 and Bi-BiCl3-KCl melts, J PHYS CH B, 105(15), 2001, pp. 2951-2956
Authors:
Beck, U
Citation: U. Beck, Untitled, SOZ WELT, 52(1), 2001, pp. 3-3
Authors:
Puchinger, M
Wagner, T
Fini, P
Kisailus, D
Beck, U
Bill, J
Aldinger, F
Arzt, E
Lange, FF
Citation: M. Puchinger et al., Chemical solution deposition derived buffer layers for MOCVD-grown GaN films, J CRYST GR, 233(1-2), 2001, pp. 57-67
Authors:
Hamilton, MA
Barnes, AC
Beck, U
Buchanan, P
Howells, WS
Citation: Ma. Hamilton et al., A neutron diffraction and isotopic substitution measurement of the structure of liquid Cu2Se, J PHYS-COND, 12(46), 2000, pp. 9525-9538
Authors:
Barnes, AC
Hamilton, MA
Beck, U
Fischer, HE
Citation: Ac. Barnes et al., A determination of the structure of liquid Ag2Te using neutron diffractionand isotopic substitution and its comparison to Ag2Se, J PHYS-COND, 12(33), 2000, pp. 7311-7322
Authors:
Reck, J
Beck, U
Dohrmann, JK
Citation: J. Reck et al., Electrodeposition of CdSe films: In-situ study by spectroscopic ellipsometry, Z PHYS CHEM, 214, 2000, pp. 83-93
Authors:
Chudoba, T
Schwarzer, N
Richter, F
Beck, U
Citation: T. Chudoba et al., Determination of mechanical film properties of a bilayer system due to elastic indentation measurements with a spherical indenter, THIN SOL FI, 377, 2000, pp. 366-372
Authors:
Beck, U
Citation: U. Beck, The cosmopolitan perspective: sociology of the second age of modernity, BR J SOCIOL, 51(1), 2000, pp. 79-105
Authors:
Beck, U
Citation: U. Beck, More and different from what was expected: The importation of French literature into National-Socialist Germany, ARCH STUD N, 237(1), 2000, pp. 92-107
Authors:
Nordlund, K
Beck, U
Metzger, TH
Patel, JR
Citation: K. Nordlund et al., Diffuse x-ray streaks from stacking faults in Si analyzed by atomistic simulations, APPL PHYS L, 76(7), 2000, pp. 846-848
Authors:
Beck, U
Metzger, TH
Peisl, J
Patel, JR
Citation: U. Beck et al., Diffuse x-ray rods and scattering from point defect clusters in ion implanted silicon, APPL PHYS L, 76(19), 2000, pp. 2698-2700
Authors:
Koslowski, T
Beck, U
Citation: T. Koslowski et U. Beck, Charge separation in Coulomb liquids: mean-spherical approximation and Monte Carlo simulation, J PHYS-COND, 11(15), 1999, pp. 3019-3028
Authors:
Rodewald, D
Bill, J
Beck, U
Puchinger, M
Wagner, T
Greiner, A
Aldinger, F
Citation: D. Rodewald et al., GaN derived from carbodiimide-based polymer precursors, ADVAN MATER, 11(18), 1999, pp. 1502
Authors:
Smith, TJ
Andersen, KH
Beck, U
Capellmann, H
Kremer, RK
Neumann, KU
Scharpf, O
Simon, A
Ziebeck, KRA
Citation: Tj. Smith et al., A polarized neutron scattering study of the normal phase in YBa2Cu3O6.95, J SUPERCOND, 12(1), 1999, pp. 95-97
Authors:
Beck, U
Citation: U. Beck, The future of work, or: The political economy of insecurity, BERL J SOZ, 9(4), 1999, pp. 467
Authors:
Beck, U
Chang, CH
Metzger, TH
Griffin, PB
Patel, JR
Citation: U. Beck et al., Diffuse X-ray streaks from defects and surface features in boron implantedsilicon, PHYS ST S-B, 215(1), 1999, pp. 779-783
Authors:
Becker, A
Schulten-Oberborsch, G
Beck, U
Vestweber, KH
Citation: A. Becker et al., Stoma care nurses: Good value for money?, WORLD J SUR, 23(7), 1999, pp. 638-643
Authors:
Maser, K
Mohr, U
Leihkauf, R
Ecker, K
Beck, U
Grambole, D
Grotzschel, R
Herrmann, F
Krauser, J
Weidinger, A
Citation: K. Maser et al., Hydrogen migration in wet-thermally grown silicon dioxide layers due to high dose N-15 ion beam irradiation, MICROEL ENG, 48(1-4), 1999, pp. 139-142
Authors:
Beck, U
Citation: U. Beck, Current status of sociology: How the coming generation intends on promoting the social sciences, SOZ WELT, 50(4), 1999, pp. 343-346
Authors:
Beck, U
Freyland, W
Citation: U. Beck et W. Freyland, A neutron diffraction study on liquid Rb-Sb alloys, J NON-CRYST, 250, 1999, pp. 250-252
Authors:
Beck, U
Citation: U. Beck, Democracy beyond the nation-state - A cosmopolitical manifesto (Reprinted), DISSENT, 46(1), 1999, pp. 53-55
Authors:
Hoffmann, V
Kurt, R
Kammer, K
Thielsch, R
Wirth, T
Beck, U
Citation: V. Hoffmann et al., Interference phenomena at transparent layers in glow discharge optical emission spectrometry, APPL SPECTR, 53(8), 1999, pp. 987-990
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