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Results: 51-75/77
Authors:
NG W
RAYCHAUDHURI AK
LIANG S
SINGH S
SOLAK H
WELNAK J
CERRINA F
MARGARITONDO G
UNDERWOOD JH
KORTRIGHT JB
PERERA RCC
Citation: W. Ng et al., HIGH-RESOLUTION SPECTROMICROSCOPY WITH MAXIMUM - PHOTOEMISSION SPECTROSCOPY REACHES THE 1000-ANGSTROM SCALE, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 422-430
Authors:
WELLS GM
BRODSKY EL
REILLY M
TAYLOR JW
CERRINA F
Citation: Gm. Wells et al., THE CENTER FOR X-RAY-LITHOGRAPHY FACILITY STATUS AND BEAMLINES DEVELOPMENT, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 347(1-3), 1994, pp. 466-471
Authors:
RAYCHAUDHURI AK
CERRINA F
Citation: Ak. Raychaudhuri et F. Cerrina, STATUS OF SOFT-X-RAY PHOTOEMISSION MICROSCOPY UTILIZING SYNCHROTRON-RADIATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 87(1-4), 1994, pp. 104-111
Authors:
GOZZO F
MARSI M
BERGER H
MARGARITONDO G
OTTOLENGHI A
RAYCHAUDHURI AK
NG W
LIANG S
SINGH S
WELNAK JT
WALLACE JP
CAPASSO C
CERRINA F
Citation: F. Gozzo et al., MICROSCOPIC-SCALE LATERAL INHOMOGENEITIES OF THE SCHOTTKY-BARRIER FORMATION PROCESS (VOL B48, PG 17163, 1993), Physical review. B, Condensed matter, 49(19), 1994, pp. 14085-14085
Authors:
MOSES WW
DERENZO SE
WEBER MJ
RAYCHAUDHURI AK
CERRINA F
Citation: Ww. Moses et al., SCINTILLATION MECHANISMS IN CERIUM FLUORIDE, Journal of luminescence, 59(1-2), 1994, pp. 89-100
Authors:
LAUDON MF
LAIRD DL
ENGELSTAD RL
CERRINA F
Citation: Mf. Laudon et al., MECHANICAL RESPONSE OF X-RAY MASKS, JPN J A P 1, 32(12B), 1993, pp. 5928-5932
Authors:
CHEN G
WALLACE JP
CERRINA F
Citation: G. Chen et al., LINEAR-FRESNEL-ZONE-PLATE-BASED 2-STATE ALIGNMENT METHOD FOR SUB-0.25MU-M X-RAY-LITHOGRAPHY SYSTEM, JPN J A P 1, 32(12B), 1993, pp. 5977-5981
Authors:
CERRINA F
Citation: F. Cerrina, PAPERS FROM THE 37TH INTERNATIONAL-SYMPOSIUM ON ELECTRON, ION, AND PHOTON BEAMS - 1-4 JUNE 1993 SHERATON-HARBOR-ISLAND-HOTEL SAN-DIEGO, CALIFORNIA - PREFACE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2152-2152
Authors:
TURNER S
CERRINA F
Citation: S. Turner et F. Cerrina, OPTIMIZATION OF AERIAL IMAGE QUALITY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2446-2451
Authors:
DIFABRIZIO E
GRELLA L
LUCIANI L
GENTILI M
BACIOCCHI M
FIGLIOMENI M
MASTROGIACOMO L
MAGGIORA R
LEONARD Q
CERRINA F
MOLINO M
POWDERLY D
Citation: E. Difabrizio et al., METROLOGY OF HIGH-RESOLUTION RESIST STRUCTURES ON INSULATING SUBSTRATES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2456-2462
Authors:
KRASNOPEROVA AA
XIAO J
CERRINA F
DIFABRIZIO E
LUCIANI L
FIGLIOMENI M
GENTILI M
Citation: Aa. Krasnoperova et al., FABRICATION OF HARD X-RAY PHASE ZONE-PLATE BY X-RAY-LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2588-2591
Authors:
KRASNOPEROVA AA
TURNER SW
OCOLA L
CERRINA F
Citation: Aa. Krasnoperova et al., EFFECT OF LOW-SOLUBILITY SURFACE-LAYER ON DEVELOPMENT OF AZ-PF514, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2829-2833
Authors:
OCOLA LE
CERRINA F
Citation: Le. Ocola et F. Cerrina, PARAMETRIC MODELING OF PHOTOELECTRON EFFECTS IN X-RAY-LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2839-2844
Authors:
PAN SW
REILLY MT
TAYLOR JW
CERRINA F
Citation: Sw. Pan et al., OPTIMIZATION DESIGN PROGRAM FOR CHEMICALLY AMPLIFIED RESIST PROCESS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2845-2849
Authors:
GUO JZY
LEONARD Q
CERRINA F
DIFABRIZIO E
LUCIANI L
GENTILI M
FRANK J
Citation: Jzy. Guo et al., EXPERIMENTAL-STUDY OF AERIAL IMAGES IN X-RAY-LITHOGRAPHY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2902-2905
Authors:
GENTILI M
GRELLA L
DIFABRIZIO E
LUCIANI L
BACIOCCHI M
FIGLIOMENI M
MAGGIORA R
MASTROGIACOMO L
CERRINA F
Citation: M. Gentili et al., DEVELOPMENT OF AN ELECTRON-BEAM PROCESS FOR THE FABRICATION OF X-RAY NANOMASKS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2938-2942
Authors:
REILLY M
WELLS GM
GUO J
WALLACE JP
EDWARDS N
CERRINA F
MELNGAILIS J
Citation: M. Reilly et al., X-RAY MASK REPLICATION USING SQUARE SYNCHROTRON-RADIATION ILLUMINATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 2971-2975
Authors:
WELLS GM
BRODSKY EL
CERRINA F
WALDO WG
Citation: Gm. Wells et al., EVALUATION OF BERYLLIUM FOILS FOR X-RAY-LITHOGRAPHY BEAMLINES, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 11(6), 1993, pp. 3008-3011
Authors:
DESTASIO G
PERFETTI P
NG W
RAYCHAUDHURI AK
LIANG SH
SINGH S
COLE RK
GUO ZY
WALLACE J
CAPASSO C
CERRINA F
MERCANTI D
CIOTTI MT
GOZZO F
MARGARITONDO G
Citation: G. Destasio et al., SCANNING PHOTOEMISSION SPECTROMICROSCOPY OF NEURONS, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 48(2), 1993, pp. 1478-1482
Authors:
WHITE V
BAJIKAR S
DENTON D
CERRINA F
LAI B
YUN WB
LEGNINI D
XIAO Y
CHRZAS J
DIFABRIZIO E
GRELLA L
BACIOCCHI M
Citation: V. White et al., MICROFABRICATION OF PHASE-SHIFTING ZONE PLATES FOR HARD X-RAYS, Microelectronic engineering, 21(1-4), 1993, pp. 99-102
Authors:
CERRINA F
BASZLER F
TURNER S
KHAN M
Citation: F. Cerrina et al., TRANSMIT - A BEAMLINE MODELING PROGRAM, Microelectronic engineering, 21(1-4), 1993, pp. 103-106
Authors:
GOZZO F
MARSI M
BERGER H
MARGARITONDO G
OTTOLENGHI A
RAYCHAUDHURI AK
NG W
LIANG S
SINGH S
WELNAK JT
WALLACE JP
CAPASSO C
CERRINA F
Citation: F. Gozzo et al., MICROSCOPIC-SCALE LATERAL INHOMOGENEITIES OF THE SCHOTTKY-BARRIER-FORMATION PROCESS, Physical review. B, Condensed matter, 48(23), 1993, pp. 17163-17167
Authors:
CALVERT JM
KOLOSKI TS
DRESSICK WJ
DULCEY CS
PECKERAR MC
CERRINA F
TAYLOR JW
SUH DW
WOOD OR
MACDOWELL AA
DSOUZA R
Citation: Jm. Calvert et al., PROJECTION X-RAY-LITHOGRAPHY WITH ULTRATHIN IMAGING LAYERS AND SELECTIVE ELECTROLESS METALLIZATION, Optical engineering, 32(10), 1993, pp. 2437-2445
Authors:
CAPASSO C
NG W
RAYCHAUDHURI AK
LIANG SH
COLE RK
GUO ZY
WALLACE J
CERRINA F
UNDERWOOD J
PERERA R
KORTRIGHT J
DESTASIO G
MARGARITONDO G
Citation: C. Capasso et al., SCANNING PHOTOEMISSION MICROSCOPY ON MAXIMUM REACHES 0.1 MICRON RESOLUTION, Surface science, 287, 1993, pp. 1046-1050
Authors:
GUO JZY
CERRINA F
Citation: Jzy. Guo et F. Cerrina, MODELING X-RAY PROXIMITY LITHOGRAPHY, IBM journal of research and development, 37(3), 1993, pp. 331-349