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Results: 1-25/44
Authors:
ABURANO RD
HONG HW
CHUNG KS
NELSON MC
ZSCHACK P
CHEN H
CHIANG TC
Citation: Rd. Aburano et al., C-60 GE(100)-(2X1) INTERFACIAL STRUCTURE, Physical review. B, Condensed matter, 57(11), 1998, pp. 6636-6641
Authors:
ROESLER JM
MILLER T
CHIANG TC
Citation: Jm. Roesler et al., PHOTOELECTRON HOLOGRAPHY STUDIES OF BI ON SI(111), Surface science, 417(1), 1998, pp. 1143-1147
Authors:
KIDD T
ABURANO RD
HONG HW
GOG T
CHIANG TC
Citation: T. Kidd et al., STRUCTURAL DETERMINATION OF THE C-60 GE(111) INTERFACE VIA X-RAY-DIFFRACTION/, Surface science, 397(1-3), 1998, pp. 185-190
Authors:
LUH DA
MILLER T
CHIANG TC
Citation: Da. Luh et al., 3-DIMENSIONAL ATOMIC IMAGES OF AS SI(111) OBTAINED BY DERIVATIVE PHOTOELECTRON HOLOGRAPHY/, Physical review letters, 81(19), 1998, pp. 4160-4163
Authors:
HANSEN ED
MILLER T
CHIANG TC
Citation: Ed. Hansen et al., OBSERVATION OF PHOTOEMISSION LINE WIDTHS NARROWER THAN THE INVERSE LIFETIME, Physical review letters, 80(8), 1998, pp. 1766-1769
Authors:
CHEN SK
CHIANG TC
Citation: Sk. Chen et Tc. Chiang, DIGITIZING OF RADIOGRAPHS WITH A ROLLER-TYPE CCD-SCANNER, Oral surgery, oral medicine, oral pathology, oral radiology and endodontics, 83(6), 1997, pp. 719-724
Authors:
HANSEN ED
MILLER T
CHIANG TC
Citation: Ed. Hansen et al., QUANTUM-WELL OR BULK-LIKE BEHAVIOR OF CU LAYERS ON CO, Journal of physics. Condensed matter, 9(32), 1997, pp. 435-440
Authors:
LIN DS
MILLER T
CHIANG TC
Citation: Ds. Lin et al., ATOMIC-LEVEL INVESTIGATION OF THE GROWTH OF SI GE BY ULTRAHIGH-VACUUMCHEMICAL-VAPOR-DEPOSITION/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 919-926
Authors:
CHIANG TC
Citation: Tc. Chiang, SURFACE AND BULK PHOTOEMISSION - SOME OLD PROBLEMS AND NEW FINDINGS, Zhongguo wuli xuekan, 35(4), 1997, pp. 496-508
Authors:
HERTZPICCIOTTO I
KORTE J
SCHULZ M
CHIANG TC
BALL LM
Citation: I. Hertzpicciotto et al., CARBON-BLACK RISK ASSESSMENT COMPARISON IS FLAWED, Regulatory toxicology and pharmacology, 26(3), 1997, pp. 338-339
Authors:
HANSEN ED
MILLER T
CHIANG TC
Citation: Ed. Hansen et al., SURFACE PHOTOEMISSION IN AG(100), Physical review. B, Condensed matter, 55(3), 1997, pp. 1871-1875
Authors:
ROESLER JM
SIEGER MT
MILLER T
CHIANG TC
Citation: Jm. Roesler et al., NEW EXPERIMENTAL-TECHNIQUE OF PHOTOELECTRON HOLOGRAPHY APPLIED TO BI TRIMERS ON SI(111), Surface science, 380(2-3), 1997, pp. 485-490
Authors:
MILLER T
HANSEN ED
MCMAHON WE
CHIANG TC
Citation: T. Miller et al., DIRECT TRANSITIONS, INDIRECT TRANSITIONS, AND SURFACE PHOTOEMISSION IN THE PROTOTYPICAL SYSTEM AG(111), Surface science, 376(1-3), 1997, pp. 32-42
Authors:
LUH DA
SIEGER MT
MILLER T
CHIANG TC
Citation: Da. Luh et al., SB ON SI(111) STUDIED BY BRANCHING-RATIO PHOTOELECTRON HOLOGRAPHY, Surface science, 374(1-3), 1997, pp. 345-349
Authors:
LUH DA
MILLER T
CHIANG TC
Citation: Da. Luh et al., STATISTICAL CROSS-LINKING AT THE SI(111) SIO2 INTERFACE/, Physical review letters, 79(16), 1997, pp. 3014-3017
Authors:
HANSEN ED
MILLER T
CHIANG TC
Citation: Ed. Hansen et al., OVERLAYER TEST OF SURFACE PHOTOEMISSION EFFECT IN CU(100), Physical review letters, 78(14), 1997, pp. 2807-2810
Authors:
MCMAHON WE
MILLER T
CHIANG TC
Citation: We. Mcmahon et al., ELECTRONIC-PROPERTIES OF THE LEAKY QUANTUM-WELL SYSTEM AG(111) AU/AG/, Physical review. B, Condensed matter, 54(15), 1996, pp. 10800-10806
Authors:
ROESLER JM
MILLER T
CHIANG TC
Citation: Jm. Roesler et al., STRUCTURE DETERMINATION OF ORDERED 1 3-MONOLAYER PB ON GE(111) BY PHOTOELECTRON HOLOGRAPHY/, Surface science, 348(1-2), 1996, pp. 161-167
Authors:
MILLER T
MCMAHON WE
CHIANG TC
Citation: T. Miller et al., INTERFERENCE BETWEEN BULK AND SURFACE PHOTOEMISSION TRANSITIONS IN AG(111), Physical review letters, 77(6), 1996, pp. 1167-1170
Authors:
SIEGER MT
LUH DA
MILLER T
CHIANG TC
Citation: Mt. Sieger et al., PHOTOEMISSION EXTENDED FINE-STRUCTURE STUDY OF THE SIO2 SI(111) INTERFACE (VOL 77, PG 2758, 1996)/, Physical review letters, 77(26), 1996, pp. 5312-5312
Authors:
SIEGER MT
LUH DA
MILLER T
CHIANG TC
Citation: Mt. Sieger et al., PHOTOEMISSION EXTENDED FINE-STRUCTURE STUDY OF THE SIO2 SI(111) INTERFACE/, Physical review letters, 77(13), 1996, pp. 2758-2761
Authors:
HONG HW
ABURANO RD
CHUNG KS
LIN DS
HIRSCHOM ES
CHIANG TC
CHEN H
Citation: Hw. Hong et al., X-RAY TRUNCATION ROD STUDY OF GE(001) SURFACE ROUGHENING BY MOLECULAR-BEAM HOMOEPITAXIAL GROWTH, Journal of applied physics, 79(9), 1996, pp. 6858-6864
Authors:
ABURANO RD
HONG H
ROESLER JM
CHUNG K
LIN DS
ZSCHACK P
CHEN H
CHIANG TC
Citation: Rd. Aburano et al., BOUNDARY-STRUCTURE DETERMINATION OF AG SI(111) INTERFACES BY X-RAY-DIFFRACTION/, Physical review. B, Condensed matter, 52(3), 1995, pp. 1839-1847
Authors:
SIEGER MT
MILLER T
CHIANG TC
Citation: Mt. Sieger et al., REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION AND PHOTOEMISSION-STUDY OF GASB(1OO) RECONSTRUCTIONS, Physical review. B, Condensed matter, 52(11), 1995, pp. 8256-8265
Authors:
ABURANO RD
HONG HW
ROESLER JM
LIN DS
CHIANG TC
ZSCHACK P
Citation: Rd. Aburano et al., X-RAY STUDY OF THE AG SI(III) INTERFACE, Surface science, 339(1-2), 1995, pp. 891-896