Authors:
PATHAK LC
MISHRA SK
BHATTACHARYA D
CHOPRA KL
Citation: Lc. Pathak et al., A COMPARATIVE-STUDY OF YBCO POWDERS PREPARED BY DIFFERENT PROCESSES, Journal of materials science letters, 16(14), 1997, pp. 1208-1211
Authors:
KASIVISWANATHAN S
SRINIVAS V
KAR AK
MATHUR BK
CHOPRA KL
Citation: S. Kasiviswanathan et al., SCANNING TUNNELING SPECTROSCOPY OF INDIUM TIN OXIDE FILM IN AIR, Applied surface science, 115(4), 1997, pp. 399-401
Authors:
KASIVISWANATHAN S
SRINIVAS V
KAR AK
MATHUR BK
CHOPRA KL
Citation: S. Kasiviswanathan et al., OBSERVATION OF DEVIATION OF ELECTRONIC BEHAVIOR OF INDIUM TIN OXIDE FILM AT GRAIN-BOUNDARY USING SCANNING TUNNELING MICROSCOPE, Solid state communications, 101(11), 1997, pp. 831-834
Authors:
SARKAR A
RAY SK
DHAR A
BATTACHARYA D
CHOPRA KL
Citation: A. Sarkar et al., IN-SITU GROWN SUPERCONDUCTING YBCO FILMS ON BUFFERED SILICON SUBSTRATES FOR DEVICE APPLICATIONS, Journal of superconductivity, 9(2), 1996, pp. 217-222
Authors:
KASIVISWANATHAN S
KUMAR PSA
MATHUR BK
CHOPRA KL
Citation: S. Kasiviswanathan et al., SURFACE-STRUCTURE OF SILVER THIN-FILMS ON IN2O3-SN AND AL2O3, Bulletin of Materials Science, 19(2), 1996, pp. 411-416
Citation: Mn. Islam et al., XPS AND X-RAY-DIFFRACTION STUDIES OF ALUMINUM-DOPED ZINC-OXIDE TRANSPARENT CONDUCTING FILMS, Thin solid films, 280(1-2), 1996, pp. 20-25
Authors:
PANDA B
RAY SK
DHAR A
SARKAR A
BHATTACHARYA D
CHOPRA KL
Citation: B. Panda et al., ELECTRON-BEAM DEPOSITED LEAD-LANTHANUM-ZIRCONATE-TITANATE THIN-FILMS FOR SILICON-BASED DEVICE APPLICATIONS, Journal of applied physics, 79(2), 1996, pp. 1008-1012
Authors:
KUMAR PSA
PANDA B
RAY SK
MATHUR BK
BHATTACHARYA D
CHOPRA KL
Citation: Psa. Kumar et al., EFFECT OF ELECTRODE MICROSTRUCTURE ON LEAKAGE CURRENT IN LEAD-LANTHANUM-ZIRCONATE-TITANATE MULTILAYER CAPACITORS, Applied physics letters, 68(10), 1996, pp. 1344-1346
Authors:
PATHAK LC
MUKUNDA PG
GODKHINDI MM
BHATTACHARYA D
CHOPRA KL
Citation: Lc. Pathak et al., SINTERING CHARACTERISTICS OF PYROPHORICALLY GENERATED Y-BA-CU-O SUPERCONDUCTOR POWDERS UNDER VACUUM, Journal of materials science letters, 14(21), 1995, pp. 1528-1530
Authors:
RAO MVH
SRINIVAS V
RAO VV
MATHUR BK
CHOPRA KL
Citation: Mvh. Rao et al., OBSERVATION OF FIELD-INDUCED FRAGMENTATION OF NICKEL CLUSTERS USING SCANNING-TUNNELING-MICROSCOPY, Applied surface science, 89(4), 1995, pp. 417-421
Citation: Ij. Das et Kl. Chopra, BACKSCATTER DOSE PERTURBATION IN KILOVOLTAGE PHOTON BEAMS AT HIGH ATOMIC-NUMBER INTERFACES, Medical physics, 22(6), 1995, pp. 767-773
Citation: Mvh. Rao et al., SCANNING-TUNNELING-MICROSCOPY STUDIES OF NUCLEATION AND GROWTH OF SILVER FILMS, Journal of Materials Science, 30(10), 1995, pp. 2682-2685
Authors:
ACHARYA PK
BANERJEE HD
CHOPRA KL
SAHA SC
RAY S
Citation: Pk. Acharya et al., EFFECT OF HYDROGEN DILUTION IN SILANE ON LIGHT-INDUCED DEGRADATION OFHYDROGENATED AMORPHOUS-SILICON FILMS FOR SOLAR PHOTOVOLTAIC APPLICATIONS, Solar energy materials and solar cells, 32(1), 1994, pp. 21-28
Authors:
CHAUDHARY S
GOGIA B
SINGH KJ
KASHYAP SC
PANDYA DK
CHOPRA KL
Citation: S. Chaudhary et al., KOSTERLITZ-THOULESS TRANSITION AND FLUCTUATION EFFECTS IN YBA2CU3O7-XTHIN-FILMS, Physica. C, Superconductivity, 235, 1994, pp. 2687-2688
Authors:
MISHRA SK
SARKAR A
RAY SK
PATHAK LC
BHATTACHARYA D
CHOPRA KL
DAS SR
Citation: Sk. Mishra et al., LANGMUIR PROBE DIAGNOSTICS OF A RADIO-FREQUENCY MAGNETRON DISCHARGE FOR DEPOSITION OF HIGH-TC YBCO FILMS (VOL 11, PG 2747, 1993), Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(2), 1994, pp. 603-603