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Results: 1-25/31
Authors:
Gryaznov, S
Pongracz, K
Matray, T
Schultz, R
Pruzan, R
Aimi, J
Chin, A
Harley, C
Shea-Herbert, B
Shay, J
Oshima, Y
Asai, A
Yamashita, Y
Citation: S. Gryaznov et al., Telomerase inhibitors - Oligonucleotide phosphoramidates as potential therapeutic agents, NUCLEOS NUC, 20(4-7), 2001, pp. 401-410
Authors:
Tseng, CH
Lin, CW
Chang, TK
Cheng, HC
Chin, A
Citation: Ch. Tseng et al., Effects of excimer laser dopant activation on low temperature polysilicon thin-film transistors with lightly doped drains, EL SOLID ST, 4(11), 2001, pp. G94-G97
Authors:
Chin, A
Yang, MY
Sun, CL
Chen, SY
Citation: A. Chin et al., Stack gate PZT/Al2O3 one transistor ferroelectric memory, IEEE ELEC D, 22(7), 2001, pp. 336-338
Authors:
Chin, A
Citation: A. Chin, The integral cohomology of some p-groups, COMM ALGEB, 29(3), 2001, pp. 933-949
Authors:
Bustamante, ANP
Hammons, DA
Peale, RE
Chai, BHT
Richardson, M
Chin, A
Citation: Anp. Bustamante et al., Simultaneous cw dual-wavelength laser action and tunability performance ofdiode-pumped Yb3+: Sr-5(VO4)(3)F, OPT COMMUN, 192(3-6), 2001, pp. 309-313
Authors:
Chin, A
Radhakrishnan, J
Fornell, L
John, E
Citation: A. Chin et al., Effects of tezosentan, a dual endothelin receptor antagonist, on the cardiovascular and renal systems of neonatal piglets, J PED SURG, 36(12), 2001, pp. 1824-1828
Authors:
Lin, YH
Chen, YC
Chan, KT
Pan, FM
Hsieh, IJ
Chin, A
Citation: Yh. Lin et al., The strong degradation of 30 angstrom gate oxide integrity contaminated bycopper, J ELCHEM SO, 148(4), 2001, pp. F73-F76
Authors:
Sun, CL
Chen, SY
Yang, MY
Chin, A
Citation: Cl. Sun et al., Characteristics of Pb(Zr0.53Ti0.47)O-3 on metal and Al2O3/Si substrates, J ELCHEM SO, 148(11), 2001, pp. F203-F206
Authors:
Lin, YH
Pan, FM
Liao, YC
Chen, YC
Hsieh, IJ
Chin, A
Citation: Yh. Lin et al., Cu contamination effect in oxynitride gate dielectrics, J ELCHEM SO, 148(11), 2001, pp. G627-G629
Authors:
Leemans, W
Chattopadhyay, S
Esarey, E
Zholents, A
Zolotorev, M
Chin, A
Schoenlein, R
Shank, CV
Citation: W. Leemans et al., Femtosecond X-ray generation through relativistic electron beam-laser interaction, CR AC S IV, 1(3), 2000, pp. 279-296
Authors:
Louie, S
Chin, A
Gill, MA
Citation: S. Louie et al., Activity of dalteparin sodium in polypropylene syringes, AM J HEAL S, 57(8), 2000, pp. 760-762
Authors:
Wu, YH
Chin, A
Shih, KH
Wu, CC
Liao, CP
Pai, SC
Chi, CC
Citation: Yh. Wu et al., Fabrication of very high resistivity Si with low loss and cross talk, IEEE ELEC D, 21(9), 2000, pp. 442-444
Authors:
Wu, YH
Yang, MY
Chin, A
Chen, WJ
Kwei, CM
Citation: Yh. Wu et al., Electrical characteristics of high quality La2O3 gate dielectric with equivalent oxide thickness of 5 angstrom, IEEE ELEC D, 21(7), 2000, pp. 341-343
Authors:
Wu, YH
Chin, A
Citation: Yh. Wu et A. Chin, High temperature formed SiGeP-MOSFET's with good device characteristics, IEEE ELEC D, 21(7), 2000, pp. 350-352
Authors:
Wu, YH
Chin, A
Chen, WJ
Citation: Yh. Wu et al., Thickness dependent gate oxide quality of thin thermal oxide grown on hightemperature formed SiGe, IEEE ELEC D, 21(6), 2000, pp. 289-291
Authors:
Wu, YH
Chin, A
Citation: Yh. Wu et A. Chin, Gate oxide integrity of thermal oxide grown on high temperature formed Si0.3Ge0.7, IEEE ELEC D, 21(3), 2000, pp. 113-115
Authors:
Swindale, NV
Stjepanovic, G
Chin, A
Mikelberg, FS
Citation: Nv. Swindale et al., Automated analysis of normal and glaucomatous optic nerve head topography images, INV OPHTH V, 41(7), 2000, pp. 1730-1742
Authors:
Chin, A
Citation: A. Chin, New ad fad, FORBES, 166(11), 2000, pp. 26-26
Authors:
Wu, YH
Huang, CH
Chen, WJ
Lin, CN
Chin, A
Citation: Yh. Wu et al., The buried oxide properties in oxygen plasma-enhanced low-temperature wafer bonding, J ELCHEM SO, 147(7), 2000, pp. 2754-2756
Authors:
Wu, YH
Chen, SB
Chin, A
Chen, WJ
Citation: Yh. Wu et al., High-quality thermal oxide grown on high-temperature-formed SiGe, J ELCHEM SO, 147(5), 2000, pp. 1962-1964
Authors:
Lin, YH
Wu, YH
Chin, A
Pan, FM
Citation: Yh. Lin et al., The effect of copper on gate oxide integrity, J ELCHEM SO, 147(11), 2000, pp. 4305-4306
Authors:
Lin, BC
Cheng, YC
Chin, A
Wang, T
Tsai, C
Citation: Bc. Lin et al., Deuterium effect on stress-induced leakage current, JPN J A P 1, 38(4B), 1999, pp. 2337-2340
Authors:
Nii, LJ
Chin, A
Cao, TM
Gill, MA
Citation: Lj. Nii et al., Stability of sumatriptan succinate in polypropylene syringes, AM J HEAL S, 56(10), 1999, pp. 983-985
Authors:
Wu, YH
Chen, WJ
Chang, SL
Chin, A
Gwo, S
Tsai, C
Citation: Yh. Wu et al., Improved electrical characteristics of CoSi2 using HF-vapor pretreatment, IEEE ELEC D, 20(7), 1999, pp. 320-322
Authors:
Wu, YH
Chen, WJ
Chang, SL
Chin, A
Gwo, S
Tsai, C
Citation: Yh. Wu et al., Improved electrical characteristics of CoSi2 using HF-vapor pretreatment, IEEE ELEC D, 20(5), 1999, pp. 200-202