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Results: 1-12 |
Results: 12
Subnanometer resolution in depth profiling using glancing Auger electrons
Authors: Drozdov, MN Danil'tsev, VM Drozdov, YN Khrykin, OI Shashkin, VI
Citation: Mn. Drozdov et al., Subnanometer resolution in depth profiling using glancing Auger electrons, TECH PHYS L, 27(2), 2001, pp. 114-117
A new method for determining the sharpness of InGaAs/GaAs heterojunctions by auger depth profiling
Authors: Drozdov, MN Danil'tsev, VM Drozdov, YN Khrykin, OI Shashkin, VI
Citation: Mn. Drozdov et al., A new method for determining the sharpness of InGaAs/GaAs heterojunctions by auger depth profiling, TECH PHYS L, 27(10), 2001, pp. 868-870
A new approach to AFM investigation of buried Al/InxGa1-xAs/GaAs interfaces and quantum dots
Authors: Danil'tsev, VM Drozdov, MN Drozdov, YN Khrykin, OI Shashkin, VI Shuleshova, IY Vostokov, NV
Citation: Vm. Danil'Tsev et al., A new approach to AFM investigation of buried Al/InxGa1-xAs/GaAs interfaces and quantum dots, PHYS LOW-D, 3-4, 2001, pp. 321-326
Single-crystalline GaAs, AlGaAs, and InGaAs layers grown by metalorganic VPE on porous GaAs substrates
Authors: Buzynin, YN Gusev, SA Danil'tsev, VM Drozdov, MN Drozdov, YN Murel', AV Khrykin, OI Shashkin, VI
Citation: Yn. Buzynin et al., Single-crystalline GaAs, AlGaAs, and InGaAs layers grown by metalorganic VPE on porous GaAs substrates, TECH PHYS L, 26(4), 2000, pp. 298-301
Investigation of the compositional changes of a Y-Ba-Cu-OHTSC target underion sputtering
Authors: Vorob'ev, AK Gaponov, SV Drozdov, MN Klyuenkov, EB Masterov, DV
Citation: Ak. Vorob'Ev et al., Investigation of the compositional changes of a Y-Ba-Cu-OHTSC target underion sputtering, PHYS SOL ST, 42(4), 2000, pp. 603-608
Compositional and optical properties GaNxAs1-x layers grown by MOCVD
Authors: Gaponova, DM Danil'tsev, VM Drozdov, MN Drozdov, YN Krasil'nikov, ZF Revin, DG Tolstoguzov, AB Khrykin, OI Shashkin, VI
Citation: Dm. Gaponova et al., Compositional and optical properties GaNxAs1-x layers grown by MOCVD, IAN FIZ, 64(2), 2000, pp. 358-361
On the possibility of the in situ growth control and nondestructive depth profiling of ultrathin multilayer structures using keV hydrogen ions
Authors: Kurnaev, VA Trifonov, NN Drozdov, MN Salashchenko, NN
Citation: Va. Kurnaev et al., On the possibility of the in situ growth control and nondestructive depth profiling of ultrathin multilayer structures using keV hydrogen ions, VACUUM, 56(4), 2000, pp. 253-255
Possibility of nondestructive layer-by-layer analysis of multilayer structures of ultrathin films using low-energy hydrogen ions
Authors: Kurnaev, VA Trifonov, NN Drozdov, MN Salashchenko, NN
Citation: Va. Kurnaev et al., Possibility of nondestructive layer-by-layer analysis of multilayer structures of ultrathin films using low-energy hydrogen ions, TECH PHYS L, 25(6), 1999, pp. 442-443
Optically active layers of silicon doped with erbium during sublimation molecular-beam epitaxy
Authors: Andreev, AY Andreev, BA Drozdov, MN Krasil'nik, ZF Stepikhova, MV Shmagin, VB Kuznetsov, VP Rubtsova, RA Uskova, EA Karpov, YA Ellmer, H Palmetshofer, L Piplits, K Hutter, H
Citation: Ay. Andreev et al., Optically active layers of silicon doped with erbium during sublimation molecular-beam epitaxy, SEMICONDUCT, 33(2), 1999, pp. 131-134
Y-Ba-Cu-O thin films composition formation during magnetron sputtering
Authors: Drozdov, MN Gaponov, SV Gusev, SA Kluenkov, EB Luchin, VI Masterov, DV Saykov, SK Vorobiev, AK
Citation: Mn. Drozdov et al., Y-Ba-Cu-O thin films composition formation during magnetron sputtering, IEEE APPL S, 9(2), 1999, pp. 2371-2374
Electrical and optical properties of silicon, doped by erbium during sublimational molecular beam epitaxy
Authors: Andreev, AY Andreev, BA Drozdov, MN Ellmer, H Kuznetsov, VP Kalugin, NG Krasilnic, ZF Karpov, YA Palmetshofer, L Piplits, K Rubtsova, RA Stepikhova, MV Uskova, EA Shmagin, VB Hutter, H
Citation: Ay. Andreev et al., Electrical and optical properties of silicon, doped by erbium during sublimational molecular beam epitaxy, IAN FIZ, 63(2), 1999, pp. 392-399
Influence of desorption on the composition of high-temperature superconducting thin films during magnetron sputtering
Authors: Vorob'ev, AK Gaponov, SV Drozdov, MN Klyuenkov, EB Luchin, VI Masterov, DV
Citation: Ak. Vorob'Ev et al., Influence of desorption on the composition of high-temperature superconducting thin films during magnetron sputtering, TECH PHYS L, 24(12), 1998, pp. 952-953
Risultati: 1-12 |