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Results: 1-11 |
Results: 11
ROLE OF SECONDARY-ION MASS-SPECTROMETRIC ANALYSIS IN THE BRAZING OF PRECIOUS ALLOYS
Authors: PICCIRILLO C FABRIZIO M DAOLIO S FACCHIN B
Citation: C. Piccirillo et al., ROLE OF SECONDARY-ION MASS-SPECTROMETRIC ANALYSIS IN THE BRAZING OF PRECIOUS ALLOYS, Rapid communications in mass spectrometry, 11(12), 1997, pp. 1309-1314
INFLUENCE OF SUPPORT MATERIAL ON FORMATION OF ELECTROCATALYTIC THIN-FILMS - A SECONDARY-ION MASS-SPECTROMETRY STUDY
Authors: PICCIRILLO C DAOLIO S KRISTOF J MIHALY J FACCHIN B FABRIZIO M
Citation: C. Piccirillo et al., INFLUENCE OF SUPPORT MATERIAL ON FORMATION OF ELECTROCATALYTIC THIN-FILMS - A SECONDARY-ION MASS-SPECTROMETRY STUDY, International journal of mass spectrometry and ion processes, 161(1-3), 1997, pp. 141-149
STUDY OF ZRO2 FILM EVOLUTION BY SECONDARY-ION MASS-SPECTROMETRY
Authors: DAOLIO S KRISTOF J PICCIRILLO C GELOSI S FACCHIN B PAGURA C
Citation: S. Daolio et al., STUDY OF ZRO2 FILM EVOLUTION BY SECONDARY-ION MASS-SPECTROMETRY, Rapid communications in mass spectrometry, 10(14), 1996, pp. 1769-1773
GLASS SAMPLE CHARACTERIZATION BY SECONDARY-ION MASS-SPECTROMETRY
Authors: DAOLIO S PICCIRILLO C PAGURA C FACCHIN B ZECCHIN S VERITA M
Citation: S. Daolio et al., GLASS SAMPLE CHARACTERIZATION BY SECONDARY-ION MASS-SPECTROMETRY, Rapid communications in mass spectrometry, 10(10), 1996, pp. 1286-1290
SECONDARY-ION MASS-SPECTROMETRY STUDIES ON THE FORMATION OF THE VALVEMETAL-OXIDE IN RUTHENIUM-BASED AND IRIDIUM-BASED MIXED-OXIDE ELECTRODES
Authors: DAOLIO S KRISTOF J PICCIRILLO C FACCHIN B PAGURA C
Citation: S. Daolio et al., SECONDARY-ION MASS-SPECTROMETRY STUDIES ON THE FORMATION OF THE VALVEMETAL-OXIDE IN RUTHENIUM-BASED AND IRIDIUM-BASED MIXED-OXIDE ELECTRODES, International journal of mass spectrometry and ion processes, 152(1), 1996, pp. 87-96
INVESTIGATION ON THE FORMATION OF RUO2 FILM ELECTRODE BY SECONDARY-ION MASS-SPECTROMETRY
Authors: KRISTOF J DAOLIO S PICCIRILLO C FACCHIN B MINK J
Citation: J. Kristof et al., INVESTIGATION ON THE FORMATION OF RUO2 FILM ELECTRODE BY SECONDARY-ION MASS-SPECTROMETRY, Surface science, 348(3), 1996, pp. 287-298
SECONDARY-ION MASS-SPECTROMETRIC STUDIES ON THE FORMATION MECHANISM OF IRO2 TIO2-BASED COATINGS/
Authors: KRISTOF J DAOLIO S PICCIRILLO C FACCHIN B PAGURA C
Citation: J. Kristof et al., SECONDARY-ION MASS-SPECTROMETRIC STUDIES ON THE FORMATION MECHANISM OF IRO2 TIO2-BASED COATINGS/, Rapid communications in mass spectrometry, 9(15), 1995, pp. 1475-1479
SIMS METHODS IN REACTIVITY STUDIES ON METAL-OXIDES
Authors: DAOLIO S FACCHIN B PAGURA C DEBATTISTI A GELOSI S
Citation: S. Daolio et al., SIMS METHODS IN REACTIVITY STUDIES ON METAL-OXIDES, Inorganica Chimica Acta, 235(1-2), 1995, pp. 381-390
CHARACTERIZATION OF RUO2-BASED FILM ELECTRODES BY SECONDARY-ION MASS-SPECTROMETRY
Authors: DAOLIO S FACCHIN B PAGURA C DEBATTISTI A BARBIERI A KRISTOF J
Citation: S. Daolio et al., CHARACTERIZATION OF RUO2-BASED FILM ELECTRODES BY SECONDARY-ION MASS-SPECTROMETRY, Journal of materials chemistry, 4(8), 1994, pp. 1255-1258
SECONDARY-ION MASS-SPECTROMETRY METHODOLOGY AND SURFACE-CHEMISTRY OF MIXED-OXIDE ELECTRODES - MODIFICATIONS INDUCED BY NOBLE-METAL CONTENT
Authors: DAOLIO S FACCHIN B PAGURA C DEBATTISTI A BARBIERI A
Citation: S. Daolio et al., SECONDARY-ION MASS-SPECTROMETRY METHODOLOGY AND SURFACE-CHEMISTRY OF MIXED-OXIDE ELECTRODES - MODIFICATIONS INDUCED BY NOBLE-METAL CONTENT, Rapid communications in mass spectrometry, 8(8), 1994, pp. 659-665
SURFACE CHEMICAL-CHANGES OF MIXED-OXIDE FILMS IN CL2 ANODIC PRODUCTION
Authors: DAOLIO S FACCHIN B PAGURA C DEBATTISTI A BARBIERI A
Citation: S. Daolio et al., SURFACE CHEMICAL-CHANGES OF MIXED-OXIDE FILMS IN CL2 ANODIC PRODUCTION, Rapid communications in mass spectrometry, 7(10), 1993, pp. 887-890
Risultati: 1-11 |