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Results: 1-25 | 26-40
Results: 1-25/40
FORMATION OF SELF-ASSEMBLED OCTADECYLSILOXANE MONOLAYERS ON MICA AND SILICON SURFACES STUDIED BY ATOMIC-FORCE MICROSCOPY AND INFRARED-SPECTROSCOPY
Authors: VALIANT T BRUNNER H MAYER U HOFFMANN H LEITNER T RESCH R FRIEDBACHER G
Citation: T. Valiant et al., FORMATION OF SELF-ASSEMBLED OCTADECYLSILOXANE MONOLAYERS ON MICA AND SILICON SURFACES STUDIED BY ATOMIC-FORCE MICROSCOPY AND INFRARED-SPECTROSCOPY, JOURNAL OF PHYSICAL CHEMISTRY B, 102(37), 1998, pp. 7190-7197
IN-SITU INVESTIGATION OF HUMIDITY-INDUCED CHANGES ON HUMAN HAIR AND ANTENNAE OF THE HONEY-BEE, APIS-MELLIFERA L., BY SCANNING FORCE MICROSCOPY
Authors: RESCH R EHN R TICHY H FRIEDBACHER G
Citation: R. Resch et al., IN-SITU INVESTIGATION OF HUMIDITY-INDUCED CHANGES ON HUMAN HAIR AND ANTENNAE OF THE HONEY-BEE, APIS-MELLIFERA L., BY SCANNING FORCE MICROSCOPY, Applied physics A: Materials science & processing, 66, 1998, pp. 607-611
INVESTIGATION OF ZNS THIN-FILMS ON SI(100) BY PHASE DETECTION IMAGINGAND YOUNGS MODULUS MICROSCOPY
Authors: RESCH R FRIEDBACHER G GRASSERBANER M LINDROOS S KANNIAINEN T VALKONEN MP LESKELA M
Citation: R. Resch et al., INVESTIGATION OF ZNS THIN-FILMS ON SI(100) BY PHASE DETECTION IMAGINGAND YOUNGS MODULUS MICROSCOPY, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 613-617
IN-SITU INVESTIGATION OF AEROSOL-PARTICLES BY ATOMIC-FORCE MICROSCOPY
Authors: KOLLENSPERGER G FRIEDBACHER G GRASSERBAUER M
Citation: G. Kollensperger et al., IN-SITU INVESTIGATION OF AEROSOL-PARTICLES BY ATOMIC-FORCE MICROSCOPY, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 716-721
ATOMIC-FORCE MICROSCOPY STUDIES OF ZNS FILMS GROWN ON (100)GAAS BY THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD
Authors: VALKONEN MP LINDROOS S KANNIAINEN T LESKELA M RESCH R FRIEDBACHER G GRASSERBAUER M
Citation: Mp. Valkonen et al., ATOMIC-FORCE MICROSCOPY STUDIES OF ZNS FILMS GROWN ON (100)GAAS BY THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD, Journal of materials research, 13(6), 1998, pp. 1688-1692
GROWTH OF ZINC-SULFIDE THIN-FILMS ON (100)SI WITH THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD STUDIED BY ATOMIC-FORCE MICROSCOPY
Authors: VALKONEN MP LINDROOS S RESCH R LESKELA M FRIEDBACHER G GRASSERBAUER M
Citation: Mp. Valkonen et al., GROWTH OF ZINC-SULFIDE THIN-FILMS ON (100)SI WITH THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD STUDIED BY ATOMIC-FORCE MICROSCOPY, Applied surface science, 136(1-2), 1998, pp. 131-136
KELLNER,ROBERT - OBITUARY
Authors: GRASSBAUER M FRIEDBACHER G
Citation: M. Grassbauer et G. Friedbacher, KELLNER,ROBERT - OBITUARY, TrAC. Trends in analytical chemistry, 17(1), 1998, pp. 4-4
ROUGHNESS AND DEPOSITION MECHANISM OF DLC FILMS PREPARED BY RF PLASMAGLOW-DISCHARGE
Authors: ALI A HIRAKURI KK FRIEDBACHER G
Citation: A. Ali et al., ROUGHNESS AND DEPOSITION MECHANISM OF DLC FILMS PREPARED BY RF PLASMAGLOW-DISCHARGE, Vacuum, 51(3), 1998, pp. 363-368
SURFACE MODIFICATION OF PLATINUM THIN-FILM ELECTRODES TOWARDS A DEFINED ROUGHNESS AND MICROPOROSITY
Authors: ASCHAUER E FASCHING R VARAHRAM M JOBST G URBAN G NICOLUSSI G HUSINSKY W FRIEDBACHER G GRASSERBAUER M
Citation: E. Aschauer et al., SURFACE MODIFICATION OF PLATINUM THIN-FILM ELECTRODES TOWARDS A DEFINED ROUGHNESS AND MICROPOROSITY, Journal of electroanalytical chemistry [1992], 426(1-2), 1997, pp. 157-165
IN-SITU INVESTIGATIONS ON THE SILAR-GROWTH OF ZNS FILMS AS STUDIED BYTAPPING MODE ATOMIC-FORCE MICROSCOPY
Authors: RESCH R FRIEDBACHER G GRASSERBAUER M KANNIAINEN T LINDROOS S LESKELA M NIINISTO L
Citation: R. Resch et al., IN-SITU INVESTIGATIONS ON THE SILAR-GROWTH OF ZNS FILMS AS STUDIED BYTAPPING MODE ATOMIC-FORCE MICROSCOPY, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 80-84
INVESTIGATION OF AEROSOL-PARTICLES BY ATOMIC-FORCE MICROSCOPY
Authors: KOLLENSPERGER G FRIEDBACHER G GRASSERBAUER M DORFFNER L
Citation: G. Kollensperger et al., INVESTIGATION OF AEROSOL-PARTICLES BY ATOMIC-FORCE MICROSCOPY, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 268-273
INVESTIGATION OF SURFACE CHANGES ON MICA INDUCED BY ATOMIC-FORCE MICROSCOPY IMAGING UNDER LIQUIDS
Authors: RESCH R FRIEDBACHER G GRASSERBAUER M
Citation: R. Resch et al., INVESTIGATION OF SURFACE CHANGES ON MICA INDUCED BY ATOMIC-FORCE MICROSCOPY IMAGING UNDER LIQUIDS, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 352-355
THE EFFECT OF ULTRASONIC VIBRATION ON CVD DIAMOND NUCLEATION
Authors: KENJI KH YOSHII M FRIEDBACHER G GRASSERBAUER M
Citation: Kh. Kenji et al., THE EFFECT OF ULTRASONIC VIBRATION ON CVD DIAMOND NUCLEATION, DIAMOND AND RELATED MATERIALS, 6(8), 1997, pp. 1031-1035
AFM STUDIES ON ZNS THIN-FILMS GROWN BY ATOMIC LAYER EPITAXY
Authors: IHANUS J RITALA M LESKELA M PROHASKA T RESCH R FRIEDBACHER G GRASSERBAUER M
Citation: J. Ihanus et al., AFM STUDIES ON ZNS THIN-FILMS GROWN BY ATOMIC LAYER EPITAXY, Applied surface science, 120(1-2), 1997, pp. 43-50
LATERAL FORCE MICROSCOPY AND FORCE MODULATION MICROSCOPY ON SILAR-GROWN LEAD SULFIDE SAMPLES
Authors: RESCH R FRIEDBACHER G GRASSERBAUER M KANNIAINEN T LINDROOS S LESKELA M NIINISTO L
Citation: R. Resch et al., LATERAL FORCE MICROSCOPY AND FORCE MODULATION MICROSCOPY ON SILAR-GROWN LEAD SULFIDE SAMPLES, Applied surface science, 120(1-2), 1997, pp. 51-57
PHASE IMAGING AS AN EXTENSION TO TAPPING MODE AFM FOR THE IDENTIFICATION OF MATERIAL PROPERTIES ON HUMIDITY-SENSITIVE SURFACES
Authors: SCHMITZ I SCHREINER M FRIEDBACHER G GRASSERBAUER M
Citation: I. Schmitz et al., PHASE IMAGING AS AN EXTENSION TO TAPPING MODE AFM FOR THE IDENTIFICATION OF MATERIAL PROPERTIES ON HUMIDITY-SENSITIVE SURFACES, Applied surface science, 115(2), 1997, pp. 190-198
PAPERS PRESENTED AT THE SXM-2 WORKSHOP - VIENNA, AUSTRIA - 16-18 SEPTEMBER 1996 - PREFACE
Authors: FRIEDBACHER G FUCHS H GUNTHERODT HJ
Citation: G. Friedbacher et al., PAPERS PRESENTED AT THE SXM-2 WORKSHOP - VIENNA, AUSTRIA - 16-18 SEPTEMBER 1996 - PREFACE, Surface and interface analysis, 25(7-8), 1997, pp. 481-481
THIN-FILM CHARACTERIZATION OF DIAMOND-LIKE CARBON-FILMS PREPARED BY RF PLASMA CHEMICAL-VAPOR-DEPOSITION
Authors: HIRAKURI KK MINORIKAWA T FRIEDBACHER G GRASSERBAUER M
Citation: Kk. Hirakuri et al., THIN-FILM CHARACTERIZATION OF DIAMOND-LIKE CARBON-FILMS PREPARED BY RF PLASMA CHEMICAL-VAPOR-DEPOSITION, Thin solid films, 302(1-2), 1997, pp. 5-11
SURFACE-ENHANCED INFRARED-ABSORPTION SPECTROSCOPY (SEIRA) USING MULTIREFLECTION ATR-ELEMENTS
Authors: WANZENBOCK HD EDLMIZAIKOFF B FRIEDBACHER G GRASSERBAUER M KELLNER R ARNTZEN M LUYVEN T THEISS W GROSSE P
Citation: Hd. Wanzenbock et al., SURFACE-ENHANCED INFRARED-ABSORPTION SPECTROSCOPY (SEIRA) USING MULTIREFLECTION ATR-ELEMENTS, Mikrochimica acta, 1997, pp. 665-667
PROCEEDINGS OF THE 8TH SYMPOSIUM ON SOLID-STATE ANALYSIS, HELD IN VIENNA, AUSTRIA, JULY 3-5, 1995
Authors: WEGSCHEIDER W FRIEDBACHER G GRASSERBAUER M
Citation: W. Wegscheider et al., PROCEEDINGS OF THE 8TH SYMPOSIUM ON SOLID-STATE ANALYSIS, HELD IN VIENNA, AUSTRIA, JULY 3-5, 1995, Mikrochimica acta, 125(1-4), 1997, pp. 1-1
ANALYTICAL CHARACTERIZATION OF SURFACES BY SCANNING FORCE MICROSCOPY
Authors: FRIEDBACHER G RESCH R SCHMITZ I KOLLENSPERGER G SCHREINER M GRASSERBAUER M
Citation: G. Friedbacher et al., ANALYTICAL CHARACTERIZATION OF SURFACES BY SCANNING FORCE MICROSCOPY, Annali di chimica, 87(3-4), 1997, pp. 145-163
TAPPING-MODE AFM IN COMPARISON TO CONTACT-MODE AFM AS A TOOL FOR IN-SITU INVESTIGATIONS OF SURFACE-REACTIONS WITH REFERENCE TO GLASS CORROSION
Authors: SCHMITZ I SCHREINER M FRIEDBACHER G GRASSERBAUER M
Citation: I. Schmitz et al., TAPPING-MODE AFM IN COMPARISON TO CONTACT-MODE AFM AS A TOOL FOR IN-SITU INVESTIGATIONS OF SURFACE-REACTIONS WITH REFERENCE TO GLASS CORROSION, Analytical chemistry, 69(6), 1997, pp. 1012-1018
AFM AND STM STUDIES ON IN2O3 AND ITO THIN-FILMS DEPOSITED BY ATOMIC LAYER EPITAXY
Authors: ASIKAINEN T RITALA M LESKELA R PROHASKA T FRIEDBACHER G GRASSERBAUER M
Citation: T. Asikainen et al., AFM AND STM STUDIES ON IN2O3 AND ITO THIN-FILMS DEPOSITED BY ATOMIC LAYER EPITAXY, Applied surface science, 99(2), 1996, pp. 91-98
STUDIES ON THE MORPHOLOGY OF AL2O3 THIN-FILMS GROWN BY ATOMIC LAYER EPITAXY
Authors: RITALA M SALONIEMI H LESKELA M PROHASKA T FRIEDBACHER G GRASSERBAUER M
Citation: M. Ritala et al., STUDIES ON THE MORPHOLOGY OF AL2O3 THIN-FILMS GROWN BY ATOMIC LAYER EPITAXY, Thin solid films, 286(1-2), 1996, pp. 54-58
GROWTH OF ZINC-SULFIDE THIN-FILMS WITH THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD AS STUDIED BY ATOMIC-FORCE MICROSCOPY
Authors: KANNIAINEN T LINDROOS S PROHASKA T FRIEDBACHER G LESKELA M GRASSERBAUER M NIINISTO L
Citation: T. Kanniainen et al., GROWTH OF ZINC-SULFIDE THIN-FILMS WITH THE SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION METHOD AS STUDIED BY ATOMIC-FORCE MICROSCOPY, Journal of materials chemistry, 5(7), 1995, pp. 985-989
Risultati: 1-25 | 26-40