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Results: 1-7 |
Results: 7
Proton dosimetry measurements and calculations in electronic packages using optically stimulated luminescent films
Authors: Ranchoux, G Plattard, D Polge, G Dusseau, L Fesquet, J Gasiot, J Ecoffet, R
Citation: G. Ranchoux et al., Proton dosimetry measurements and calculations in electronic packages using optically stimulated luminescent films, IEEE NUCL S, 48(5), 2001, pp. 1731-1734
Prediction of the one-year thermal annealing of irradiated commercial devices based on experimental isochronal curves
Authors: Saigne, F Dusseau, L Fesquet, J Gasiot, J Ecoffet, R Schrimpf, RD Galloway, KF
Citation: F. Saigne et al., Prediction of the one-year thermal annealing of irradiated commercial devices based on experimental isochronal curves, IEEE NUCL S, 47(6), 2000, pp. 2244-2248
Experimental procedure to predict the competition between the degradation induced by irradiation and thermal annealing of oxide trapped charge in MOSFETs
Authors: Saigne, F Fesquet, J Gasiot, J Ecoffet, R Schrimpf, RD Galloway, KF
Citation: F. Saigne et al., Experimental procedure to predict the competition between the degradation induced by irradiation and thermal annealing of oxide trapped charge in MOSFETs, IEEE NUCL S, 47(6), 2000, pp. 2329-2333
An integrated sensor using Optically Stimulated Luminescence for in-flightdosimetry
Authors: Dusseau, L Plattard, D Vaille, JR Polge, G Ranchoux, G Saigne, F Fesquet, J Ecoffet, R Gasiot, J
Citation: L. Dusseau et al., An integrated sensor using Optically Stimulated Luminescence for in-flightdosimetry, IEEE NUCL S, 47(6), 2000, pp. 2412-2416
Use of the radiation-induced charge neutralization mechanism to achieve annealing of 0.35 mu m SRAMs
Authors: Quittard, O Joffre, F Brisset, C Oudea, C Saigne, F Dusseau, L Fesquet, J Gasiot, J
Citation: O. Quittard et al., Use of the radiation-induced charge neutralization mechanism to achieve annealing of 0.35 mu m SRAMs, IEEE NUCL S, 46(6), 1999, pp. 1633-1639
High energy electron dose-mapping using optically stimulated luminescent films
Authors: Dusseau, L Ranchoux, G Polge, G Plattard, D Saigne, F Bessiere, JC Fesquet, J Gasiot, J
Citation: L. Dusseau et al., High energy electron dose-mapping using optically stimulated luminescent films, IEEE NUCL S, 46(6), 1999, pp. 1757-1761
Irradiated integrated circuits dose-attenuation mapping using optically stimulated phosphors for packaging dosimetry
Authors: Dusseau, L Polge, G Albert, L Magnac, Y Bessiere, JC Fesquet, J Gasiot, J
Citation: L. Dusseau et al., Irradiated integrated circuits dose-attenuation mapping using optically stimulated phosphors for packaging dosimetry, IEEE NUCL S, 45(6), 1998, pp. 2695-2699
Risultati: 1-7 |