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Results:
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Results: 17
Authors:
Goudeau, P
Renault, PO
Badawi, KF
Villain, P
Citation: P. Goudeau et al., X-ray diffraction analysis residual stresses and elasticity constants in thin films, VIDE, 56(301), 2001, pp. 541
Authors:
Vaz, F
Rebouta, L
Goudeau, P
Girardeau, T
Pacaud, J
Riviere, JP
Traverse, A
Citation: F. Vaz et al., Structural transitions in hard Si-based TiN coatings: the effect of bias voltage and temperature, SURF COAT, 146, 2001, pp. 274-279
Authors:
Djemia, P
Ganot, F
Moch, P
Branger, V
Goudeau, P
Citation: P. Djemia et al., Brillouin scattering investigation of elastic properties of Cu-Mo solid solution thin films, J APPL PHYS, 90(2), 2001, pp. 756-762
Authors:
Renault, PO
Badawi, KF
Goudeau, P
Bimbault, L
Citation: Po. Renault et al., An experimental method for measuring the Poisson's ratio in thin films andmultilayers using a tensile machine set up on an X-ray goniometer, EPJ-APPL PH, 10(2), 2000, pp. 91-96
Authors:
Cleach, C
Badawi, F
Villain, JP
Goudeau, P
Ramade, C
Malie, A
Citation: C. Cleach et al., Application of methodology from Taguchi experience plans to the analysis of the interrelationship of growth parameters, microstructure and residual stresses in electrolytic platinum deposits, J PHYS IV, 10(P10), 2000, pp. 155-162
Authors:
Villain, P
Renault, PO
Goudeau, P
Badawi, KF
Citation: P. Villain et al., Analysis of elastic properties of Ni/Mo multilayers when coupling a tensile tester to an X-ray diffractometer, J PHYS IV, 10(P10), 2000, pp. 163-170
Authors:
Boubeker, B
Talea, M
Goudeau, P
Coupeau, C
Grilhe, J
Citation: B. Boubeker et al., On the Young modulus of 304 L stainless steel thin films, MATER CHAR, 45(1), 2000, pp. 33-37
Authors:
Pelosin, V
Branger, V
Goudeau, P
Riviere, A
Badawi, F
Citation: V. Pelosin et al., Mechanical spectroscopy and structural evolution of CuMo thin films, J ALLOY COM, 310, 2000, pp. 454-456
Authors:
Branger, V
Coupeau, C
Goudeau, P
Boubeker, B
Badawi, KF
Grilhe, J
Citation: V. Branger et al., Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates, J MAT SCI L, 19(4), 2000, pp. 353-355
Authors:
Vaz, F
Rebouta, L
Goudeau, P
Pacaud, J
Garem, H
Riviere, JP
Cavaleiro, A
Alves, E
Citation: F. Vaz et al., Characterisation of Ti1-xSixNy nanocomposite films, SURF COAT, 133, 2000, pp. 307-313
Authors:
Tavares, CJ
Rebouta, L
Alves, E
Cavaleiro, A
Goudeau, P
Reviere, JP
Declemy, A
Citation: Cj. Tavares et al., A structural and mechanical analysis on PVD-grown (Ti,Al)N/Mo multilayers, THIN SOL FI, 377, 2000, pp. 425-429
Authors:
Idiri, M
Boubeker, B
Sabot, R
Goudeau, P
Dinhut, JF
Grosseau-Poussard, JL
Citation: M. Idiri et al., Structure and related corrosion behaviour in 1M H2SO4 of b.c.c. 304L filmsprepared by ion beam sputtering, SURF COAT, 122(2-3), 1999, pp. 230-234
Authors:
Vaz, F
Rebouta, L
Almeida, B
Goudeau, P
Pacaud, J
Riviere, JP
Sousa, JBE
Citation: F. Vaz et al., Structural analysis of Ti1-xSixNy nanocomposite films prepared by reactivemagnetron sputtering, SURF COAT, 121, 1999, pp. 166-172
Authors:
Boubeker, B
Goudeau, P
Serrari, A
Eymery, JP
Citation: B. Boubeker et al., Evolution of magnetic and mechanical properties in stainless steel films implanted with Kr ions, NUCL INST B, 155(3), 1999, pp. 289-294
Authors:
Talea, M
Boubeker, B
Cleymand, F
Coupeau, C
Grilhe, J
Goudeau, P
Citation: M. Talea et al., Atomic force microscopy observations of debonding in 304 L stainless steelthin films, MATER LETT, 41(4), 1999, pp. 181-185
Authors:
Coupeau, C
Naud, JF
Cleymand, F
Goudeau, P
Grilhe, J
Citation: C. Coupeau et al., Atomic force microscopy of in situ deformed nickel thin films, THIN SOL FI, 353(1-2), 1999, pp. 194-200
Authors:
Meneau, C
Goudeau, P
Andreazza, P
Andreazza-Vignolle, C
Pommier, JC
Citation: C. Meneau et al., Structural characterization and residual stresses of AlN films by X-ray diffraction analysis, J PHYS IV, 8(P5), 1998, pp. 153-161
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