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Results: 51-60/60
Authors:
CHEONG B
HONO K
LAUGHLIN DE
Citation: B. Cheong et al., TRANSFORMATION PATH DEPENDENCE OF THE BAIN STRAIN RELAXATION DURING DECOMPOSITION OF A HYPEREUTECTOID CUBE ALLOY, Metallurgical transactions. A, Physical metallurgy and materials science, 24(12), 1993, pp. 2605-2611
Authors:
BABU SS
HONO K
SAKURAI T
Citation: Ss. Babu et al., APFIM STUDIES ON MARTENSITE TEMPERING OF FE-C-SI-MN LOW-ALLOY STEEL, Applied surface science, 67(1-4), 1993, pp. 321-327
Authors:
BABU SS
HONO K
OKANO R
SAKURAI T
Citation: Ss. Babu et al., APFIM STUDIES OF SOME ALUMINUM-ALLOYS, Applied surface science, 67(1-4), 1993, pp. 361-367
Authors:
HONO K
MAEDA Y
LI JL
SAKURAI T
Citation: K. Hono et al., ATOM-PROBE ANALYSIS OF SPUTTERED CO-CR MAGNETIC THIN-FILMS, Applied surface science, 67(1-4), 1993, pp. 386-390
Authors:
HONO K
HASEGAWA N
BABU SS
FUJIMORI H
SAKURAI T
Citation: K. Hono et al., ATOM-PROBE ANALYSIS OF A NANOCRYSTALLINE FE-C-TA SPUTTERED SOFT MAGNETIC THIN-FILM, Applied surface science, 67(1-4), 1993, pp. 391-397
Authors:
HONO K
LI JL
UEKI Y
INOUE A
SAKURAI T
Citation: K. Hono et al., ATOM-PROBE STUDY OF THE CRYSTALLIZATION PROCESS OF AN FE73.5SI13.5B9NB3CU1 AMORPHOUS ALLOY, Applied surface science, 67(1-4), 1993, pp. 398-406
Authors:
HASEGAWA N
HONO K
OKANO R
FUJIMORI H
SAKURAI T
Citation: N. Hasegawa et al., A METHOD FOR PREPARING ATOM-PROBE SPECIMENS FOR NANOSCALE COMPOSITIONAL ANALYSIS OF METALLIC THIN-FILMS, Applied surface science, 67(1-4), 1993, pp. 407-412
Authors:
HONO K
SAKURAI T
Citation: K. Hono et T. Sakurai, APFIM STUDIES OF NANOSTRUCTURED MAGNETIC-MATERIALS, Annales de chimie, 18(5-6), 1993, pp. 311-318
Authors:
HONO K
MAEDA Y
LI JL
SAKURAI T
Citation: K. Hono et al., APFIM STUDIES OF COMPOSITIONAL INHOMOGENEITY IN SPUTTERED CO-CR THIN-FILMS, IEEE transactions on magnetics, 29(6), 1993, pp. 3745-3747
Authors:
HONO K
BABU SS
MAEDA Y
HASEGAWA N
SAKURAI T
Citation: K. Hono et al., ATOM-PROBE COMPOSITIONAL ANALYSIS OF CO-CR SPUTTERED MAGNETIC THIN-FILMS, Applied physics letters, 62(20), 1993, pp. 2504-2506